Browsing by author "Roussel, Philippe"
Now showing items 21-40 of 310
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Accurate and robust noise-based trigger algorithm for soft breakdown detection in ultra thin oxides
Roussel, Philippe; Degraeve, Robin; Van den bosch, G.; Kaczer, Ben; Groeseneken, Guido (2001) -
Accurate and robust noise-based trigger algorithm for soft breakdown detection in ultrathin gate dielectrics
Roussel, Philippe; Degraeve, Robin; Van den bosch, G.; Kaczer, Ben; Groeseneken, Guido (2001) -
Accurate gate impedance determination on ultraleaky MOSFETs by fitting to a three-lumped-parameter model at frequencies from DC to RF
San Andres Serrano, Enrique; Pantisano, Luigi; Ramos, Javier; Roussel, Philippe; O'Sullivan, Barry; Toledano Luque, Maria; De Gendt, Stefan; Groeseneken, Guido (2007) -
Accurate reliability evaluation of non-uniform ultrathin and high-k layers
Roussel, Philippe; Degraeve, Robin; Kerber, Andreas; Pantisano, Luigi; Groeseneken, Guido (2003-03) -
Achievements and challenges for the electrical performance of MOSFETs with high-k gate dielectrics
Groeseneken, Guido; Pantisano, Luigi; Ragnarsson, Lars-Ake; Degraeve, Robin; Houssa, Michel; Kauerauf, Thomas; Roussel, Philippe; De Gendt, Stefan; Heyns, Marc (2004) -
Analysis of HBM ESD testers and specifications using a fourth order lumped element model
Verhaege, Koen; Roussel, Philippe; Groeseneken, Guido; Maes, Herman; Gieser, H.; Russ, Christian; Egger, P.; Guggenmos, X.; Kuper, F. G. (1994) -
Analysis of TDDB lifetime projection in low thermal budget HfO2/SiO2 stacks for sequential 3D integrations
Vici, Andrea; Degraeve, Robin; Roussel, Philippe; Franco, Jacopo; Kaczer, Ben; De Wolf, Ingrid (2023) -
Analysis of the early-failure rate prediction of time-dependent dielectric breakdown in thin oxides
Ogier, Jean-Luc; Degraeve, Robin; Roussel, Philippe; Groeseneken, Guido; Maes, Herman (1995) -
Analytic variability study of inference accuracy in RRAM arrays with a binary tree winner-take-all circuit for neuromorphic applications
Doevenspeck, Jonas; Degraeve, Robin; Cosemans, Stefan; Roussel, Philippe; Verhoef, Bram; Lauwereins, Rudy; Dehaene, Wim (2018) -
Analytical Markov Model to Calculate TDDB at Any Voltage and Temperature Stress Condition
Vici, Andrea; Degraeve, Robin; Franco, Jacopo; Kaczer, Ben; Roussel, Philippe; De Wolf, Ingrid (2023) -
Analytical model for anomalous positive bias temperature instability in La-based HfO2 nFETs based on independent characterization of charging components
Toledano Luque, Maria; Kaczer, Ben; Aoulaiche, Marc; Spessot, Alessio; Roussel, Philippe; Ritzenthaler, Romain; Schram, Tom; Thean, Aaron; Groeseneken, Guido (2013) -
Analytical model for anomalous positive bias temperature instability in La-based HfO2 nFETs based on independent characterization of charging components
Toledano Luque, Maria; Kaczer, Ben; Aoulaiche, Marc; Spessot, Alessio; Roussel, Philippe; Ritzenthaler, Romain; Schram, Tom; Thean, Aaron; Groeseneken, Guido (2013) -
Approximating standard cell delay distributions by reformulating the most probable failure point
Rodopoulos, Dimitrios; Roussel, Philippe; Catthoor, Francky; Sazeides, Yiannakis; Soudris, Dimitrios (2016) -
Area scaling and voltage dependence of time-to-breakdown in magnetic tunnel junctions
Das, Johan; Degraeve, Robin; Roussel, Philippe; Groeseneken, Guido; Borghs, Gustaaf; De Boeck, Jo (2002) -
Assessing reliability of nano-scaled CMOS technologies one defect at a time
Kaczer, Ben; Grasser, Tibor; Franco, Jacopo; Toledano Luque, Maria; Weckx, Pieter; Roussel, Philippe; Groeseneken, Guido (2012) -
Assessment of critical Co electromigration parameters
Varela Pedreira, Olalla; Lofrano, Melina; Zahedmanesh, Houman; Roussel, Philippe; van der Veen, Marleen; Simons, Veerle; Chery, Emmanuel; Ciofi, Ivan; Croes, Kristof (2022) -
Atomic layer deposition of ruthenium with TiN interface for sub-10nm advanced interconnects beyond copper
Wen, Liang Gong; Roussel, Philippe; Varela Pedreira, Olalla; Briggs, Basoene; Groven, Benjamin; Dutta, Shibesh; Popovici, Mihaela Ioana; Heylen, Nancy; Ciofi, Ivan; Vanstreels, Kris; Osterberg, Frederik; Hansen, Ole; Petersen, Dirch H.; Opsomer, Karl; Detavernie, Christophe; Wilson, Chris; Van Elshocht, Sven; Croes, Kristof; Bommels, Jurgen; Tokei, Zsolt; Adelmann, Christoph (2016-09) -
Atomistic approach to variability of bias-temperature instability in circuit simulations
Kaczer, Ben; Mahato, Swaraj; Valduga de Almeida Camargo, Vinicius; Toledano Luque, Maria; Roussel, Philippe; Grasser, Tibor; Catthoor, Francky; Dobrovolny, Petr; Zuber, Paul; Wirth, Gilson; Groeseneken, Guido (2011-04) -
Automatic software for statistical prediction of reading current variability in deeply scaled 3D poly-Si channel SONOS memories
Toledano Luque, Maria; Degraeve, Robin; Roussel, Philippe (2012) -
Band offsets in biaxially stressed SiGe layers for arbitrary orientations
Eneman, Geert; Roussel, Philippe; Brunco, David; Collaert, Nadine; Mocuta, Anda; Thean, Aaron (2016)