Browsing by imec author "71b89e915792bbfe9fa9298dbedd09c1c84a50cf"
Now showing items 21-40 of 127
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AVD and MOCVD TaCN-based films for gate metal applications on high-k gate dielectrics
Karim, Zia; Barbar, Ghassan; Boissiere, Olivier; Lehnen, Peer; Lohe, Christoph; Seidel, Tom; Adelmann, Christoph; Conard, Thierry; O'Sullivan, Barry; Ragnarsson, Lars-Ake; Schram, Tom; Van Elshocht, Sven; De Gendt, Stefan (2007-10) -
Bias Temperature Instability (BTI) of High-Voltage Devices for Memory Periphery
Bastos, Joao; O'Sullivan, Barry; Franco, Jacopo; Tyaginov, Stanislav; Truijen, Brecht; Vaisman Chasin, Adrian; Degraeve, Robin; Kaczer, Ben; Ritzenthaler, Romain; Capogreco, Elena; Dentoni Litta, Eugenio; Spessot, Alessio; Higashi, Yusuke; Yoon, Younggwang; Machkaoutsan, Vladimir; Fazan, Pierre; Horiguchi, Naoto (2022) -
Can we optimize the gate oxide quality of DRAM input/output pMOSFETs by a post-deposition treatment?
Simoen, Eddy; O'Sullivan, Barry; Ritzenthaler, Romain; Dentoni Litta, Eugenio; Schram, Tom; Horiguchi, Naoto; Claeys, Cor (2019) -
Cell-module integration concept compatible with c-Si epitaxial thin foils and with efficiencies over 18%
Dross, Frederic; Van Nieuwenhuysen, Kris; Bearda, Twan; Debucquoy, Maarten; Depauw, Valerie; Govaerts, Jonathan; Boulord, Caroline; Granata, Stefano; Labie, Riet; Loozen, Xavier; Martini, Roberto; O'Sullivan, Barry; Radhakrishnan, S.; Baert, Kris; Gordon, Ivan; Poortmans, Jef (2012) -
Characterization and physical modeling of the temporal evolution of near-interfacial states resulting from NBTI/PBTI stress in nMOS/pMOS transistors
Grasser, T.; Stampfer, B.; Waltl, M.; Rzepa, G.; Rupp, K.; Schanovsky, F.; Pobegen, G.; Puschkarsky, K.; Reisinger, H.; O'Sullivan, Barry; Kaczer, Ben (2018) -
Charge characterisation in metal-gate/high-k layers: Effect of post-deposition annealing and gate electrode
O'Sullivan, Barry; Pourtois, Geoffrey; Kaushik, Vidya; Schram, Tom; Kittl, Jorge; Pantisano, Luigi; De Gendt, Stefan; Heyns, Marc (2007-07) -
CMOS integration of high-k/metal gate transistors in diffusion and gate replacement (D&GR) scheme for dynamic random access memory peripheral circuits
Dentoni Litta, Eugenio; Ritzenthaler, Romain; Schram, Tom; Spessot, Alessio; O'Sullivan, Barry; Machkaoutsan, Vladimir; Fazan, Pierre; Ji, Yunhyuck; Mannaert, Geert; Lorant, Christophe; Sebaai, Farid; Thiam, Arame; Ercken, Monique; Demuynck, Steven; Horiguchi, Naoto (2018) -
CMOS integration of thermally stable diffusion and gate replacement (D&GR) high-k/metal gate stacks in DRAM periphery transistors
Dentoni Litta, Eugenio; Ritzenthaler, Romain; Schram, Tom; Spessot, Alessio; O'Sullivan, Barry; Ji, Yunhyuck; Mannaert, Geert; Lorant, Christophe; Sebaai, Farid; Thiam, Arame; Ercken, Monique; Demuynck, Steven; Horiguchi, Naoto (2017) -
COMPHY - A compact-physics framework for unified modeling of BTI
Rzepa, Gerhard; Franco, Jacopo; O'Sullivan, Barry; Subirats, Alexandre; Simicic, Marko; Hellings, Geert; Weckx, Pieter; Jech, M.; Knobloch, T.; Waltl, M.; Roussel, Philippe; Linten, Dimitri; Kaczer, Ben; Grasser, T. (2018) -
Correlation between interface traps and paramagnetic defects in c-Si/a-Si:H heterojunctions
Nguyen Hoang, Thoan; Jivanescu, Mihaela; O'Sullivan, Barry; Pantisano, Luigi; Gordon, Ivan; Afanas'ev, Valery; Stesmans, Andre (2012) -
Cost effective dry oxidation for emitter passivation: a key step for high efficiency screen printed p-type PERC solar cells
Choulat, Patrick; Prajapati, Victor; Sleeckx, Erik; Singh, Sukhvinder; Tous, Loic; O'Sullivan, Barry; Ferro, V.; Duerinckx, Filip (2013) -
Crystalline thin-foil silicon solar cells: where crystalline quality meets thin-film processing
Dross, Frederic; Baert, Kris; Bearda, Twan; Deckers, Jan; Depauw, Valerie; El Daif, Ounsi; Gordon, Ivan; Gougam, Adel; Govaerts, Jonathan; Granata, Stefano; Labie, Riet; Loozen, Xavier; Martini, Roberto; Masolin, Alex; O'Sullivan, Barry; Qiu, Yu; Vaes, Jan; Van Gestel, Dries; Van Hoeymissen, Jan; Vanleenhove, Anja; Van Nieuwenhuysen, Kris; Venkatachalam, Srisaran; Meuris, Marc; Poortmans, Jef (2012) -
CV Stretch-Out Correction after Bias Temperature Stress: Work-function Dependence of Donor-/Acceptor-like Traps, Fixed Charges, and Fast States
Grasser, T.; O'Sullivan, Barry; Kaczer, Ben; Franco, Jacopo; Stampfer, B.; Waltl, M. (2021) -
Deep electron traps in HfO2-based ferroelectrics: (Al/Si-doped) HfO2 versus HfZrO4
Izmailov, R. A.; O'Sullivan, Barry; Popovici, Mihaela Ioana; Afanas'ev, V. V. (2022) -
Deep-level transient spectroscopy of Al/a-Si:H/c-Si structures for heterojunction solar cell applications
Simoen, Eddy; Ferro, Valentina; O'Sullivan, Barry (2014) -
Defect profiling and the role of nitrogen in lanthanum oxide-capped high-k dielectrics for nMOS applications
O'Sullivan, Barry; Mitsuhashi, Riichirou; Okawa, Hiroshi; Sengoku, Naohisa; Schram, Tom; Groeseneken, Guido; Biesemans, Serge; Nakabayashi, Takashi; Ikeda, Atsushi; Niwa, Masaaki (2008-09) -
Defect profiling in FEFET Si:HfO2 layers
O'Sullivan, Barry; Putcha, Vamsi; Izmailov, Roman; Afanas'ev, Valeri V.; Simoen, Eddy; Jung, Taehwan; Higashi, Yusuke; Degraeve, Robin; Truijen, Brecht; Kaczer, Ben; Ronchi, Nicolo; McMitchell, Sean; Banerjee, Kaustuv; Clima, Sergiu; Breuil, Laurent; Van den Bosch, Geert; Linten, Dimitri; Van Houdt, Jan (2020) -
Development and implementation of a plated and solderable metallization on 15.6x15.6 cm2 IBC cells
Singh, Sukhvinder; O'Sullivan, Barry; Kyuzo, Manabu; Tous, Loic; Russell, Richard; Bertens, Jurgen; de Wit, Andre; Debucquoy, Maarten; Szlufcik, Jozef; Poortmans, Jef (2015) -
Double torque perpendicular STT-MRAM devices for low power IoT and edge computing
Rao, Siddharth; Carpenter, Robert; Couet, Sebastien; Van Beek, Simon; Perumkunnil, Manu; Jossart, Nico; O'Sullivan, Barry; Kundu, Shreya; Kim, Woojin; Garello, Kevin; Souriau, Laurent; Yasin, Farrukh; Houshmand Sharifi, Shamin; Crotti, Davide; Kar, Gouri Sankar (2021) -
Effectiveness of nitridation of hafnium silicate dielectrics: a comparison between thermal and plasma nitridation
O'Sullivan, Barry; Kaushik, Vidya; Everaert, Jean-Luc; Trojman, Lionel; Ragnarsson, Lars-Ake; Pantisano, Luigi; Rohr, Erika; De Gendt, Stefan; Heyns, Marc (2007)