Browsing by author "Delhougne, Romain"
Now showing items 21-40 of 104
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Degradation Mapping and Impact of Device Dimension on IGZO TFTs BTI
Rinaudo, Pietro; Vaisman Chasin, Adrian; Franco, Jacopo; Wu, Zhicheng; Subhechha, Subhali; Arutchelvan, Goutham; Eneman, Geert; Yengula Venkata Ramana, Bhuvaneshwari; Rassoul, Nouredine; Delhougne, Romain; Kaczer, Ben; De Wolf, Ingrid; Kar, Gouri Sankar (2023) -
Degradation mapping of IGZO TFTs
Rinaudo, P.; Vaisman Chasin, Adrian; Franco, Jacopo; Wu, Zhicheng; Rassoul, Nouredine; Delhougne, Romain; Kaczer, Ben; De Wolf, Ingrid; Kar, Gouri Sankar (2022) -
Degradation of the reset switching during endurance testing of a phase-change line cell
Goux, Ludovic; Tio Castro, David; Hurkx, Fred; Lisoni, Judit; Delhougne, Romain; Gravesteijn, Dirk; Attenborough, Karen; Wouters, Dirk (2009) -
Demonstration of multilevel multiply accumulate operations for AiMC using engineered a-IGZO transistors-based 2T1C gain cell arrays
Subhechha, Subhali; Cosemans, Stefan; Belmonte, Attilio; Rassoul, Nouredine; Houshmand Sharifi, Shamin; Debacker, Peter; Verkest, Diederik; Delhougne, Romain; Kar, Gouri Sankar (2023) -
Deposition, Characterization, and Performance of Spinel InGaZnO4
Dekkers, Harold; van Setten, Michiel; Belmonte, Attilio; Vaisman Chasin, Adrian; Subhechha, Subhali; Rassoul, Nouredine; Glushkova, Anastasia; Delhougne, Romain; Kar, Gouri Sankar (2022-02-23) -
Development of a new type of SiGe thin strain relaxed buffer based on the incorporation of a carbon-containing layer
Delhougne, Romain; Meunier-Beillard, Philippe; Caymax, Matty; Loo, Roger; Vandervorst, Wilfried (2003) -
Development of a new type of SiGe thin strain relaxed buffer based on the incorporation of a carbon-containing layer
Delhougne, Romain; Meunier-Beillard, Philippe; Caymax, Matty; Loo, Roger; Vandervorst, Wilfried (2004) -
Device engineering guidelines for performance boost in IGZO front gated TFTs based on defect control
Subhechha, Subhali; Rassoul, Nouredine; Belmonte, Attilio; Hody, Hubert; Dekkers, Harold; van Setten, Michiel; Vaisman Chasin, Adrian; Houshmand Sharifi, Shamin; Banerjee, Kaustuv; Puliyalil, Harinarayanan; Kundu, Souvik; Pak, Murat; Tsvetanova, Diana; Bazzazian, Nina; Vandersmissen, Kevin; Batuk, Dmitry; Geypen, Jef; Heijlen, Jeroen; Delhougne, Romain; Kar, Gouri Sankar (2022) -
Device modeling of two-steps oxygen anneal-based submicron InGaZnO back-end-of-line field-effect transistor enabling short-channel effects suppression
Kim, Donguk; Kim, Je-Hyuk; Choi, Woo Sik; Yang, Tae Jun; Jang, Jun Tae; Belmonte, Attilio; Rassoul, Nouredine; Subhechha, Subhali; Delhougne, Romain; Kar, Gouri Sankar; Lee, Wonsok; Cho, Min Hee; Ha, Daewon; Kim, Dae Hwan (2022) -
Effect of the switching layer on CBRAM reliability and benchmarking against OxRAM devices
Reale, G.; Belmonte, Attilio; Fantini, Andrea; Radhakrishnan, Janaki; Redolfi, Augusto; Devulder, Wouter; Nyns, Laura; Kundu, Shreya; Delhougne, Romain; Goux, Ludovic; Kar, Gouri Sankar (2021) -
Electrical Investigation of Wake-Up in High Endurance Fatigue-Free La and Y Doped HZO Meal-Ferroelectric-Metal Capacitors
Walke, Amey; Popovici, Mihaela Ioana; Banerjee, Kaustuv; Clima, Sergiu; Kumbhare, Pankaj; Desmet, Johan; Meersschaut, Johan; Van den Bosch, Geert; Delhougne, Romain; Kar, Gouri Sankar; Van Houdt, Jan (2022-07-12) -
Enabling CD SEM metrology for 5nm technology node and beyond
Lorusso, Gian; Ohashi, Takeyoshi; Yamaguchi, Astuko; Inoue, Osamu; Sutani, Takumichi; Horiguchi, Naoto; Boemmels, Juergen; Wilson, Chris; Briggs, Basoene; Tan, Chi Lim; Raymaekers, Tom; Delhougne, Romain; Van den Bosch, Geert; Di Piazza, Luca; Kar, Gouri Sankar; Furnemont, Arnaud; Fantini, Andrea; Donadio, Gabriele Luca; Souriau, Laurent; Crotti, Davide; Yasin, Farrukh; Appeltans, Raf; Rao, Siddharth; De Simone, Danilo; Rincon Delgadillo, Paulina; Leray, Philippe; Charley, Anne-Laure; Zhou, Daisy; Veloso, Anabela; Collaert, Nadine; Hasumi, Kazuhisa; Koshihara, Shunsuke; Ikota, Masami; Okagawa, Yutaka; Ishimoto, Toru (2017) -
Engineering and stack optimization of Cu-based selector devices for low power SCM applications
Barci, Marinela; Fantini, Andrea; Redolfi, Augusto; Kundu, Shreya; Devulder, Wouter; Opsomer, Karl; Delhougne, Romain; Goux, Ludovic; Kar, Gouri Sankar; Witters, Thomas (2018) -
Engineering Strain and Texture in Ferroelectric Scandium-Doped Aluminium Nitride
McMitchell, Sean; Walke, Amey; Banerjee, Kaustuv; Mertens, Sofie; Piao, Xiaoyu; Mao, Ming; Katcko, Kostantine; Vellianitis, Georgios; Van Dal, Mark; Lin, Yu-Ming; Van den Bosch, Geert; Delhougne, Romain; Kar, Gouri Sankar (2023) -
Enhanced data integrity of In-Ga-Zn-Oxide based Capacitor-less 2T memory for DRAM applications
Oh, Hyungrock; Belmonte, Attilio; Perumkunnil, Manu; Mitard, Jerome; Rassoul, Nouredine; Donadio, Gabriele Luca; Delhougne, Romain; Furnemont, Arnaud; Kar, Gouri Sankar; Dehaene, Wim (2021) -
Evidence of the prominent role of the time-under-melt parameter in the reset switching of phase-change line cells
Goux, Ludovic; Gille, Thomas; Tio Castro, David; Hurkx, Fred; Lisoni, Judit; Delhougne, Romain; Gravesteijn, Dirk; De Meyer, Kristin; Attenborough, Karen; Wouters, Dirk (2008) -
Evidence of the thermo-electric Thomson effect and influence on the program conditions and cell optimization in phase-change memory cells
Tio Castro, David; Goux, Ludovic; Hurkx, G.A.M.; Attenborough, Karen; Delhougne, Romain; Lisoni, Judit; Jedema, F.J.; in 't Zandt, M.A.A.; Wolters, R.A.M.; Gravesteijn, Dirk; Verheijen, M.A.; Kaiser, M.A.; Weemaes, R.G.R.; Wouters, Dirk (2007) -
Experimental and theoretical verification of channel conductivity degradation due to grain boundaries and defects in 3D NAND
Subirats, Alexandre; Arreghini, Antonio; Capogreco, Elena; Delhougne, Romain; Tan, Chi Lim; Hikavyy, Andriy; Breuil, Laurent; Degraeve, Robin; Putcha, Vamsi; Van den Bosch, Geert; Linten, Dimitri; Furnemont, Arnaud (2017) -
Extraction of the retention properties of a phase-change cell from temperature-ramp tests using a novel method
Goux, Ludovic; Hurkx, Fred; Wang, Xin Peng; Delhougne, Romain; Attenborough, Karen; Gravesteijn, Dirk; Wouters, Dirk; Perez Gonzalez, Jesus (2010) -
Fabrication of 50nm high performance strained-SiGe pMOSFETs with selective epitaxial growth
Loo, Roger; Collaert, Nadine; Verheyen, Peter; Caymax, Matty; Delhougne, Romain; De Meyer, Kristin (2003-01)