Recently added

The Odyssey: modeling privacy threats in a brave new world

Galvez, Rafael; Gurses, Seda (2018)

From craft to science: The road ahead for empirical software engineering research

Galster, Matthias; Weyns, Danny; Tang, Antony; Kazman, Rick; Mirakhorli, Mehdi (2018)

CNTs in the context of EUV pellicle history

Gallagher, Emily; Timmermans, Marina; Pollentier, Ivan; Lee, Jae Uk; Mariano Juste, Marina; Adelmann, Christoph; Huyghebaert, Cedric; Scholze, Frank; Laubis, Christian (2018)

Computational problems in supersingular elliptic curve isogenies

Galbraith, Steven D.; Frederik, Vercauteren (2018)

Fingerprinting codes under the weak marking assumption

Gabor, Fodor; Schelkens, Peter; Dooms, Ann (2018)

Gas phase pore stuffing for the protection of organo-silicate glass dielectric materials

Fujikawa, Makoto; de Marneffe, Jean-Francois; Chanson, Romain; Babaei Gavan, Khashayar; Rezvanov, Askar; Lazzarino, Frederic; Tokei, Zsolt; Yamaguchi, T.; Nozawa, N.; Sato, Nagisa (2018)

Gas Phase Pore Stuffing (GPPS)

Fujikawa, M; Yamaguchi, T; Nozawa, S; Niino, R; Chanson, Romain; Babaei Gavan, Khashayar; Lazzarino, Frederic; de Marneffe, Jean-Francois (2018)

From hype to reality : data science enabling personalized medicine

Frohlich, Holger; Balling, Rudi; Beerenwinkel, Niko; Kohlbacher, Oliver; Kumar, Santosh; Lengauer, Thomas; Maathuis, Marloes; Moreau, Yves; Murphy, Susan; Przytycka, Teresa; Rebhan, Michael; Rost, Hannes; Schuppert, Andreas; Schwab, Matthias; Spang, Rainer; Stekhoven, Daniel; Sun, Jimeng; Weber, Andreas; Ziemek, Daniel; Zupan, Blaz (2018)

Improving Time Series Prediction with Ensembles of Integrated Photonic Reservoirs

Freiberger, Matthias; Bienstman, Peter; Dambre, Joni (2018)

Augmenting Microsoft's HoloLens with vuforia tracking for neuronavigation

Frantz, Taylor; Jansen, Bart; Duerinck, Johnny; Vandemeulebroucke, Jef (2018)

Real 3D depth profiling of heterogeneous microelectronic structures using a combined ToF-SIMS/in-situ SPM tool

Franquet, Alexis; Spampinato, Valentina; Vandervorst, Wilfried; van der Heide, Paul (2018)

Advanced semiconducting structure analysis with Self-Focusing SIMS and improved mass resolution in a Hybrid SIMS instrument

Franquet, Alexis; Spampinato, Valentina; Kayser, Sven; Havelund, Rasmus; Gilmore, Ian; Vandervorst, Wilfried; van der Heide, Paul (2018)

Who left open the cookie jar? A comprehensive evaluation of third-party cookie policies

Franken, Gertjan; Van Goethem, Tom; Joosen, Wouter (2018)

BTI reliability improvement strategies in low thermal budget gate dtacks for 3D sequential integration

Franco, Jacopo; Wu, Zhicheng; Rzepa, Gerhard; Vandooren, Anne; Arimura, Hiroaki; Ragnarsson, Lars-Ake; Hellings, Geert; Brus, Stephan; Cott, Daire; De Heyn, Vincent; Groeseneken, Guido; Horiguchi, Naoto; Ryckaert, Julien; Collaert, Nadine; Linten, Dimitri; Grasser, Tibor; Kaczer, Ben (2018-12)

imec Publications: Recent submissions

The Odyssey: modeling privacy threats in a brave new world

From craft to science: The road ahead for empirical software engineering research

CNTs in the context of EUV pellicle history

Computational problems in supersingular elliptic curve isogenies

Fingerprinting codes under the weak marking assumption

Gas phase pore stuffing for the protection of organo-silicate glass dielectric materials

Gas Phase Pore Stuffing (GPPS)

From hype to reality : data science enabling personalized medicine

Improving Time Series Prediction with Ensembles of Integrated Photonic Reservoirs

Augmenting Microsoft's HoloLens with vuforia tracking for neuronavigation

Real 3D depth profiling of heterogeneous microelectronic structures using a combined ToF-SIMS/in-situ SPM tool

Advanced semiconducting structure analysis with Self-Focusing SIMS and improved mass resolution in a Hybrid SIMS instrument

Who left open the cookie jar? A comprehensive evaluation of third-party cookie policies

BTI reliability improvement strategies in low thermal budget gate dtacks for 3D sequential integration

On the impact of the gate metal work-function on the charge trapping component of BTI

Hot electron and hot hole induced degradation of SiGe p-FinFETs studied by degradation maps in the entire bias space

A BLAS-based algorithm for finding position weight matrix occurrences in DNA sequences on CPUs and GPUs

Zero and one-dimensional electrical characterization of nanometer-wide Si fins

Towards carrier profiling in nanometer-wide Si fins with micro four-point probe

Electrical characterization of single nanometer-wide Si fins in dense arrays

imec Publications: Recent submissions

The Odyssey: modeling privacy threats in a brave new world ﻿

From craft to science: The road ahead for empirical software engineering research ﻿

CNTs in the context of EUV pellicle history ﻿

Computational problems in supersingular elliptic curve isogenies ﻿

Fingerprinting codes under the weak marking assumption ﻿

Gas phase pore stuffing for the protection of organo-silicate glass dielectric materials ﻿

Gas Phase Pore Stuffing (GPPS) ﻿

From hype to reality : data science enabling personalized medicine ﻿

Improving Time Series Prediction with Ensembles of Integrated Photonic Reservoirs ﻿

Augmenting Microsoft's HoloLens with vuforia tracking for neuronavigation ﻿

Real 3D depth profiling of heterogeneous microelectronic structures using a combined ToF-SIMS/in-situ SPM tool ﻿

Advanced semiconducting structure analysis with Self-Focusing SIMS and improved mass resolution in a Hybrid SIMS instrument ﻿

Who left open the cookie jar? A comprehensive evaluation of third-party cookie policies ﻿

BTI reliability improvement strategies in low thermal budget gate dtacks for 3D sequential integration ﻿

On the impact of the gate metal work-function on the charge trapping component of BTI ﻿

Hot electron and hot hole induced degradation of SiGe p-FinFETs studied by degradation maps in the entire bias space ﻿

A BLAS-based algorithm for finding position weight matrix occurrences in DNA sequences on CPUs and GPUs ﻿

Zero and one-dimensional electrical characterization of nanometer-wide Si fins ﻿

Towards carrier profiling in nanometer-wide Si fins with micro four-point probe ﻿

Electrical characterization of single nanometer-wide Si fins in dense arrays ﻿

The Odyssey: modeling privacy threats in a brave new world

From craft to science: The road ahead for empirical software engineering research

CNTs in the context of EUV pellicle history

Computational problems in supersingular elliptic curve isogenies

Fingerprinting codes under the weak marking assumption

Gas phase pore stuffing for the protection of organo-silicate glass dielectric materials

Gas Phase Pore Stuffing (GPPS)

From hype to reality : data science enabling personalized medicine

Improving Time Series Prediction with Ensembles of Integrated Photonic Reservoirs

Augmenting Microsoft's HoloLens with vuforia tracking for neuronavigation

Real 3D depth profiling of heterogeneous microelectronic structures using a combined ToF-SIMS/in-situ SPM tool

Advanced semiconducting structure analysis with Self-Focusing SIMS and improved mass resolution in a Hybrid SIMS instrument

Who left open the cookie jar? A comprehensive evaluation of third-party cookie policies

BTI reliability improvement strategies in low thermal budget gate dtacks for 3D sequential integration

On the impact of the gate metal work-function on the charge trapping component of BTI

Hot electron and hot hole induced degradation of SiGe p-FinFETs studied by degradation maps in the entire bias space

A BLAS-based algorithm for finding position weight matrix occurrences in DNA sequences on CPUs and GPUs

Zero and one-dimensional electrical characterization of nanometer-wide Si fins

Towards carrier profiling in nanometer-wide Si fins with micro four-point probe

Electrical characterization of single nanometer-wide Si fins in dense arrays