Browsing Conference contributions by title

Investigation of the hermeticity of BCB-dealed cavities for housing (RF-) MEMS devices

Jourdain, Anne; De Moor, Piet; Pamidighantam, Sayanu; Tilmans, Harrie (2002)

Investigation of the impact of hot electrons and high drain bias on the dynamic Ron increase in GaN-based MIS-HEMTs grown on silicon

Meneghini, Matteo; Bisi, Davide; Stoffels, Steve; Marcon, Denis; Van Hove, Marleen; Wu, Tian-Li; Decoutere, Stefaan; Meneghesso, Gaudenzio; Zanoni, Enrico (2014)

Investigation of the influence of UBM on lead free flip chip solder fatigue life by explicit finite element modeling of intermetallic layers

Limaye, Paresh; Vandevelde, Bart; Labie, Riet; Ratchev, Petar; Beyne, Eric; Vandepitte, Dirk; Verlinden, Bert (2005)

Investigation of the intensity noise reduction using a saturated semiconductor optical amplifier in spectrum sliced WDM systems

Zhao, M.; Morthier, Geert; Baets, Roel; Dekoster, J. (2001)

Investigation of the passivation properties of PECVD-silicon-nitride layers on silicon solar cells

Bitnar, B.; Glatthaar, R.; Keller, S.; Kugler, J.; Spiegel, M.; Fath, Peter; Willeke, Gerhard; Bucher, E.; Duerinckx, Filip; Szlufcik, Jozef; Nijs, Johan; Mertens, Robert; Nussbaumer, H.; Ferrazza, F. (1997)

Investigation of the performance of state-of-the-art defect inspection tools within EUV lithography

Van Den Heuvel, Dieter; Jonckheere, Rik; Cheng, Shaunee; Marcuccilli, Gino; Cross, Andrew; Inderhees, Greg; Parisi, Paolo (2012)

Investigation of the reliability of Cu and Co UBM layers in thermal-cycling tests

Labie, Riet; Beyne, Eric; Mertens, Robert; Ratchev, Petar; Humbeeck, J.V. (2003-12)

Investigation of the stimulation capabilities of a high-resolution neurorecording probe for the application of closed-loop deep brain stimulation

Tarnaud, Thomas; Tanghe, Emmeric; Haesler, Sebastian; Mora Lopez, Carolina; Martens, Luc; Joseph, Wout (2018)

Investigation of the threshold voltage difference between partially-depleted SOI and bulk CMOS transistors

van Meer, Hans; Lyu, Jeong-ho; Kubicek, Stefan; De Meyer, Kristin (1999)

Investigation of trapping effects on Au-free AlGaN/GaN Schottky diodes fabricated on C-doped buffer layers

Hu, Jie; Stoffels, Steve; Lenci, Silvia; You, Shuzhen; Bakeroot, Benoit; Ronchi, Nicolo; Venegas, Rafael; Groeseneken, Guido; Decoutere, Stefaan (2015)

Investigation of TSV noise coupling in 3D-ICs using an experimental validated 3D TSV circuit model including Si substrate effects and TSV capacitance inversion behavior after wafer thinning

Sun, Xiao; Rack, Martin; Van der Plas, Geert; Stucchi, Michele; De Vos, Joeri; Absil, Philippe; Raskin, J.P.; Beyne, Eric (2016)

Investigation of wafer level packaging schemes for 3D RF interposer multi-chip module

Vereecke, Bart; Soussan, Philippe; Zhu, Jian (2017)

Investigation of window instability in program/erase cycling of TANOS NAND Flash memory

Van den Bosch, Geert; Breuil, Laurent; Cacciato, Antonio; Rothschild, Aude; Jurczak, Gosia; Van Houdt, Jan (2009-05)

Investigation on Low-temperature Temporary Bonding for Microfluidic Devices in Lifescience Applications

Han, Yang; Dang Thi Thuy, Chi; Visker, Evert; Visker, Jakob; Humbert, Aurelie; Peng, Lan (2021)

Investigation on mc-Si bulk passivation using deuterated silicon-nitride

Dekkers, Harold; De Wolf, Stefaan; Agostinelli, Guido; Szlufcik, Jozef; Pernau, T.; Arnoldbik, W.M.; Goldbach, H.D.; Schropp, R.E.I. (2003)

Investigation on molybdenum and its conductive oxides as p-type metal gate candidates

Li, Zilan; Schram, Tom; Witters, Thomas; Cho, Hag-Ju; O'Sullivan, Barry; Hooker, Jacob; De Gendt, Stefan; De Meyer, Kristin (2007)

Investigation on p-contacts in Mg-doped GaN and the effect of various pre-treatments

Karouta, F.; Ruscassié, R; Kramer, M.C.J.C.M.; Jacobs, B.; Jacobs, Koen; Moerman, Ingrid (2001)

Investigation on the corrosion of Cu metallization in the focused ion beam system due to a low I2 background

Bender, Hugo; Jin, S.; Vervoort, Iwan; Lantasov, Yuri (1999)

Investigation on the drying dynamics of millimetric water droplets: source of watermarks on silicon wafers

Belmiloud, Naser; Tamaddon, Amir-Hossein; Mertens, Paul; Xu, XiuMei; Struyf, Herbert (2011)

Investigation on the drying dynamics of millimetric water droplets: source of watermarks on silicon wafers

Belmiloud, Naser; Mertens, Paul; Tamaddon, Amir-Hossein; Struyf, Herbert (2011)