Browsing Conference contributions by title

Root cause analysis of gate shorts in semi-vertical GaN MOSFET devices

Diehle, Patrick; Hübner, Susanne; De Santi, Carlo; Mukherjee, Kalparupa; Zanoni, Enrico; Meneghini, Matteo; Geens, Karen; You, Shuzhen; Decoutere, Stefaan; Altmann, Frank (2021)

Root-cause analysis of device failure in inverted P3HT:PCBM cells

Voroshazi, Eszter; Uytterhoeven, Griet; Favia, Paola; Cnops, Kjell; Cheyns, David (2013)

Root-cause failure analysis reveals harmful interaction between non-adjacent MoO3 and Al layers

Voroshazi, Eszter; Uytterhoeven, Griet; Favia, Paola; Bender, Hugo; Conard, Thierry; Cnops, Kjell; Cheyns, David (2014)

Rotated SOI MuGFETs at high temperatures

Nicoletti, T.; Dos Santos, S.D.; Almeida, L.M.; Martino, J.A.; Simoen, Eddy; Claeys, Cor (2011)

Rotational Cryptanalysis on MAC Algorithm Chaskey

Kraleva, L.; Ashur, T.; Rijmen, V. (2020)

Rotational-XOR Cryptanalysis of Simon-Like Block Ciphers

Lu, J.; Liu, Y.; Ashur, T.; Sun, B.; Li, C. (2020)

Roughness and variability in EUV lithography: Who is to blame? (Part 1)

Vaglio Pret, Alessandro; Gronheid, Roel; Younkin, Todd; Winroth, Gustaf; Biafore, John; Anno, Yusuke; Hoshiko, Kenji; Constantoudis, Vassilios (2013)

Roughness characterization in the frequency domain and LWR mitigation with post-litho processes

Vaglio Pret, Alessandro; Gronheid, Roel; Foubert, Philippe (2010)

Roughness decomposition: an on-wafer methodology to discriminate mask, metrology, and shot noise contributions

Lorusso, Gian; Rispens, Gijsbert; Rutigliani, Vito; Van Roey, Frieda; Frommhold, Andreas; Schiffelers, Guido (2019)

Roughness study of a template for hetero-integrated FinFET

Baranov, Gleb; Milenin, Alexey; Baklanov, Mikhaïl (2015)

Roughness study on L/S patterning with chemo

Dudash, Viktor; Suh, Hyo Seon; Lorusso, Gian; Her, YoungJun; Li, Jin; Monreal, Victor; Baskaran, Durairaj; ALPERSON, BOAZ; SKJONNEMAND, KARL; Mack, Chris (2019)

Roughness study on line and space patterning with chemo-epitaxy directed self-assembly

Suh, Hyo Seon; Dudash, Viktor; Lorusso, Gian; Her, YoungJun; Li, Jin; Monreal, Victor; Baskaran, Durairaj; ALPERSON, BOAZ; SKJONNEMAND, KARL; Mack, Chris (2020)

Round robins of solar cells to evaluate measurement systems of different European research institutes

Manshanden, Petra; van der Borg, N.J.C.M.; Bliss, M.; Mihaylov, B.; Gottschalg, R.; Izzi, M.; Tucci, M.; Roca, F.; Pellegrino, M.; Romano, A.; Graditi, G.; Hohl-Ebinger, J.; Warta, W.; Debucquoy, Maarten; El Daif, Ounsi; Gordon, Ivan; Champliaud, J.; Jouini, A.; Glatz-Reichenbach, J.; Bothe, K.; Herguth, A. (2013)

Round-Optimal Verifiable Oblivious Pseudorandom Functions from Ideal Lattices

Albrecht, Martin R.; Davidson, Alex; Deo, Amit; Smart, Nigel P. (2021)

Routes towards large area, low pressure nanodiamond growth via pulsed microwave linear antenna plasma chemistry

Liehr, Michael; Fendrych, Frantisek; Taylor, Andrew; Nesladek, Milos (2011)

Routing and wavelength assignment under accurate routing information in networks with sparse and limited wavelength conversion

Masip-Bruin, Xavier; Sanchez-Lopez, Sergi; Sole-Pareta, Josep; Domingo-Pascual, Jordi; Colle, Didier (2003)