Browsing Conference contributions by title

Uncertainty-aware robust optimization of test-access architectures for 3D stacked ICs

Deutsch, Sergej; Chakrabarty, Krishnendu; Marinissen, Erik Jan (2013-09)

Uncooled and cooled infrared detector technology research and development in Belgium

Merken, Patrick; De Moor, Piet; John, J.; Zimmermann, Lars; Gastal, Martin; Grietens, Bob; Van Hoof, Chris (2000)

Uncooled IR bolometers using surface micromachined Poly SiGe

De Moor, Piet; Sedky, Sherif; Sabuncuoglu Tezcan, Deniz; Van Hoof, Chris (1999)

Uncoupling biometrics from templates for secure and privacy-preserving authentication

Abidin, Aysajan; Rua, Enrique Argones; Peeters, Roel (2017)

Underfill material screening and process characterization for 3D stacking

Rebibis, Kenneth June; La Manna, Antonio; Gerets, Carine; Beyne, Eric; Daily, Robert; Capuz, Giovanni (2012)

Underground broadband: design of a reliable WLAN gap filler solution

Van Leeuwen, Tom; Moerman, Ingrid; Demeester, Piet (2007-03)

Underlayer optimization method for EUV lithography

Vanelderen, Pieter; Vandenbroeck, Nadia; Liang, Y.C.; Van Driessche, Veerle; Guerrero, Douglas; Chacko, A.; De Simone, Danilo; Vandenberghe, Geert (2020)

UNDERSEA: An Exemplar for Engineering Self-Adaptive Unmanned Underwater Vehicles

Gerasimou, Simos; Calinescu, Radu; Shevtsov, Stepan; Weyns, Danny (2017)

Understanding adhesion failure in low-k dielectric stacks during chemical mechanical polishing

Iacopi, Francesca; Degryse, Dominiek; Vos, Ingrid; Patz, Michael; Maex, Karen (2004-01)

Understanding and importance of defects in advanced materials

Pantisano, Luigi; Trojman, Lionel; Aoulaiche, Marc; O'Connor, R.; Kaczer, Ben; Groeseneken, Guido (2009)

Understanding and improving double patterning CDU through Monte Carlo simulation

Hooge, Joshua; Hatakeyama, Shinichi; Kubo, Akihiro; Kondo, Yoshihiro; Nafus, Kathleen; Scheer, Steven; Foubert, Philippe; Leray, Philippe; Cheng, Shaunee (2008)

Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier Degradation in n- and p-Channel Transistors

Tyaginov, Stanislav; Makarov, Alexander; El-Sayed, Al-Moatasem Bellah; Vaisman Chasin, Adrian; Bury, Erik; Jech, Markus; Vandemaele, Michiel; Grill, Alexander; De Keersgieter, An; Vexler, Mikhail; Eneman, Geert; Kaczer, Ben (2022)

Understanding and modelling the PBTI reliability of thin-film IGZO transistors

Vaisman Chasin, Adrian; Franco, Jacopo; Triantopoulos, Konstantinos; Dekkers, Harold; Rassoul, Nouredine; Belmonte, Attilio; Smets, Quentin; Subhechha, Subhali; Claes, Dieter; van Setten, Michiel; Mitard, Jerome; Delhougne, Romain; Afanasiev, Valeri; Kaczer, Ben; Kar, Gouri Sankar (2021)

Understanding and physical modeling superior hot-carrier reliability of Ge pNWFETs

Tyaginov, Stanislav; El-Sayed, Al-Moatasem; Makarov, Alexander; Vaisman Chasin, Adrian; Arimura, Hiroaki; Vandemaele, Michiel; Jech, Markus; Capogreco, Elena; Witters, Liesbeth; Grill, Alexander; De Keersgieter, An; Eneman, Geert; Linten, Dimitri; Kaczer, Ben (2019)

Understanding and prediction of EWF modulation induced by various dopants in the gate stack for a gate-first integration scheme

Wang, Xin Peng; Yu, HongYu; Yeo, Y.-C.; Li, M.-F.; Chang, Shou-Zen; Cho, Hag-Ju; Kubicek, Stefan; Wouters, Dirk; Groeseneken, Guido; Biesemans, Serge (2008)

Understanding and variability of lateral charge migration in 3D CT-NAND flash with and without band-gap engineered barriers

Padovani, Andrea; Pesic, Milan; Anik Kumar, Mondol; Blomme, Pieter; Subirats, Alexandre; Vadakupudhu Palayam, Senthil; Baten, Zunaid; Larcher, Luca; Van den Bosch, Geert (2019)

Understanding charge traps for optimizing Si-passivated Ge nMOSFETs

Ren, Pengpeng; Gao, R.; Ji, Zhigang; Arimura, Hiroaki; Zhang, J. F.; Wang, R.; Duan, M.; Zhang, W.; Franco, Jacopo; Sioncke, Sonja; Cott, Daire; Mitard, Jerome; Witters, Liesbeth; Mertens, Hans; Kaczer, Ben; Mocuta, Anda; Collaert, Nadine; Linten, Dimitri; Huang, R.; Thean, Aaron; Groeseneken, Guido (2016)

Understanding correlated drain and gate current fluctuations

Goes, W.; Toledano Luque, Maria; Baumgartner, O.; Bina, M.; Schanovsky, F.; Kaczer, Ben; Grasser, T. (2013)

Understanding defects in CHIPS flow hexagonal arrays and strategies for improvement

Singh, Arjun; Lee, Jongsu; Nam, Jaewoo; Chan, BT; Gronheid, Roel (2016)

Understanding device performance by incorporating 2D-carrier profiles from high resolution scanning spreading resistance microscopy into device simulations

Nazir, Aftab; Eyben, Pierre; Clarysse, Trudo; Hellings, Geert; Schulze, Andreas; Mody, Jay; De Meyer, Kristin; Vandervorst, Wilfried (2011)