Recently added

UTBOX SOI devices with high-k gate dielectric under analog performance

Galeti, M.; Rodrigues, M.; Aoulaiche, Marc; Collaert, Nadine; Simoen, Eddy; Claeys, Cor; Martino, J.A. (2012)

A CMOS IQ digital Doherty transmitter using modulated tuning capacitors

Gaber Mahdi Hussein, Wagdy; Wambacq, Piet; Craninckx, Jan; Ingels, Mark (2012)

Nonlinear optics on the silicon platform

Freude, W.; Alloatti, L.; Melikyan, A.; Palmer, R.; Korn, D.; Lindenmann, N.; Vallaitis, T.; Hillerkuss, D.; Li, J.; Barklund, A.; Dinu, R.; Wieland, J.; Fournier, M.; Fedeli, J.; Walheim, S.; Leufke, P.M.; Ulrich, S.; Ye, J.; Vincze, P.; Hahn, H.; Yu, Hui; Bogaerts, Wim; Dumon, Pieter; Baets, Roel; Breiten, B.; Diederich, F.; Beels, M.T.; Biaggio, I.; Schimmel, Th.; Koos, C.; Leuthold, J. (2012)

Determination par EDS de l'épaisseur et de la composition de films minces multicouches pour applications nanoélectroniques

Franquet, Alexis; Conard, Thierry; Gilbert, Matthieu; Hantschel, Thomas; Vandervorst, Wilfried (2012)

Thin SiGe films in narrow structures: comparison of different analysis techniques for the thickness and composition measurements

Franquet, Alexis; Conard, Thierry; Gilbert, Matthieu; Douhard, Bastien; Vandervorst, Wilfried (2012)

Impact of single charged gate oxide defects on the performance and scaling of nanoscaled FETs

Franco, Jacopo; Kaczer, Ben; Toledano Luque, Maria; Roussel, Philippe; Mitard, Jerome; Ragnarsson, Lars-Ake; Witters, Liesbeth; Chiarella, Thomas; Togo, Mitsuhiro; Horiguchi, Naoto; Groeseneken, Guido; Bukhori, M.F.; Grasser, T.; Asenov, A. (2012)

Reliability of SiGe Channel MOS

Franco, Jacopo; Kaczer, Ben; Mitard, Jerome; Toledano Luque, Maria; Eneman, Geert; Roussel, Philippe; Cho, Moon Ju; Kauerauf, Thomas; Witters, Liesbeth; Hikavyy, Andriy; Hellings, Geert; Ragnarsson, Lars-Ake; Horiguchi, Naoto; Grasser, T.; Heyns, Marc; Groeseneken, Guido (2012)

Reliability of SiGe channel MOS

Franco, Jacopo; Kaczer, Ben; Mitard, Jerome; Toledano Luque, Maria; Eneman, Geert; Roussel, Philippe; Cho, Moon Ju; Kauerauf, Thomas; Grasser, Tibor; Witters, Liesbeth; Hellings, Geert; Ragnarsson, Lars-Ake; Horiguchi, Naoto; Heyns, Marc; Groeseneken, Guido (2012-10)

Superior reliability and reduced time-dependent variability in high-mobility SiGe channel pMOSFETs for VLSI logic applications

Franco, Jacopo; Kaczer, Ben; Mitard, Jerome; Toledano Luque, Maria; Crupi, Felice; Eneman, Geert; Roussel, Philippe; Grasser, Tibor; Cho, Moon Ju; Kauerauf, Thomas; Witters, Liesbeth; Hellings, Geert; Ragnarsson, Lars-Ake; Horiguchi, Naoto; Heyns, Marc; Groeseneken, Guido (2012)

Simulation of the post-implantation anneal for emitter profile optimization in high efficiency c-Si solar cells

Florakis, Antonios; Vandervorst, Wilfried; Janssens, Tom; Rosseel, Erik; Douhard, Bastien; Delmotte, Joris; Cornagliotti, Emanuele; Baert, Kris; Posthuma, Niels; Poortmans, Jef (2012)

Simulation of the anneal of ion implanted boron emitter and the impact on the saturation current density

Florakis, Antonios; Janssens, Tom; Rosseel, Erik; Douhard, Bastien; Delmotte, Joris; Cornagliotti, Emanuele; Poortmans, Jef; Vandervorst, Wilfried (2012)

Interface and border traps in Ge pMOSFETs

Fleetwood, Daniel; Simoen, Eddy; Francis, Sarah; Zhang, C.X.; Arora, R.; Zhang, E.X.; Schrimpf, Ronald; Galloway, Ken; Mitard, Jerome; Claeys, Cor (2012)

Characterization of Al/Ti and NiGe ohmic contacts to n-type GeSn CVD-grown layers

Firrincieli, Andrea; Gupta, Suyog; Vincent, Benjamin; Gencarelli, Federica; Lin, Dennis; Simoen, Eddy; Vandervorst, Wilfried; Claeys, Cor; Saraswat, K.; Kittl, Jorge (2012)

Ligand exchange and photoluminescence quenching in organic-inorganic blends poly(3-hexylthiophene) P3HT:PbS

Firdaus, Yuliar; Khetubol, Adis; Kudret, Suleyman; Diliën, Hanne; Maes, Wouter; Lutsen, Laurence; Vanderzande, Dirk; Van der Auweraer, Mark (2012)

Memory-aware system scenario approach energy impact

Filippopoulos, Iason; Kjeldsberg, Per-Gunnar; Hammari, Elena; Catthoor, Francky; Huisken, Jos (2012-11)

CAPHE: time-domain and frequency-domain modeling of nonlinear optical components

Fiers, Martin; Van Vaerenbergh, Thomas; Dambre, Joni; Bienstman, Peter (2012)

Possible improvements of exisiting indoor MMW focal plane imaging systems

Feng, Qi; Ocket, Ilja; Tavakol, Vahid; Nauwelaers, Bart; Schreurs, Dominique (2012)

Silicon photonics transceivers with integrated hybrid lasers

Fedeli, J.M.; Virot, L.; Duan, G.H.; Vivien, L.; Thomson, D.; Hartmann, J.M.; Jany, C.; Grosse, P.; Le Liepvre, A.; Bogaerts, Wim; Reed, G.T.; Van Thourhout, Dries; Lelarge, F. (2012)

Investigation of aged organic solar cells stacks by cross-sectional transmission electron microscopy coupled with elemental analysis

Favia, Paola; Voroshazi, Eszter; Heremans, Paul; Bender, Hugo (2012)

Intrinsic switching behavior in HfO2 RRAM by fast electrical measurments on novel 2R test structures

Fantini, Andrea; Wouters, Dirk; Degraeve, Robin; Goux, Ludovic; Pantisano, Luigi; Kar, Gouri Sankar; Chen, Yangyin; Govoreanu, Bogdan; Kittl, Jorge; Altimime, Laith; Jurczak, Gosia (2012)

Conference contributions: Recent submissions

UTBOX SOI devices with high-k gate dielectric under analog performance ﻿

A CMOS IQ digital Doherty transmitter using modulated tuning capacitors ﻿

Nonlinear optics on the silicon platform ﻿

Determination par EDS de l'épaisseur et de la composition de films minces multicouches pour applications nanoélectroniques ﻿

Thin SiGe films in narrow structures: comparison of different analysis techniques for the thickness and composition measurements ﻿

Impact of single charged gate oxide defects on the performance and scaling of nanoscaled FETs ﻿

Reliability of SiGe Channel MOS ﻿

Reliability of SiGe channel MOS ﻿

Superior reliability and reduced time-dependent variability in high-mobility SiGe channel pMOSFETs for VLSI logic applications ﻿

Simulation of the post-implantation anneal for emitter profile optimization in high efficiency c-Si solar cells ﻿

Simulation of the anneal of ion implanted boron emitter and the impact on the saturation current density ﻿

Interface and border traps in Ge pMOSFETs ﻿

Characterization of Al/Ti and NiGe ohmic contacts to n-type GeSn CVD-grown layers ﻿

Ligand exchange and photoluminescence quenching in organic-inorganic blends poly(3-hexylthiophene) P3HT:PbS ﻿

Memory-aware system scenario approach energy impact ﻿

CAPHE: time-domain and frequency-domain modeling of nonlinear optical components ﻿

Possible improvements of exisiting indoor MMW focal plane imaging systems ﻿

Silicon photonics transceivers with integrated hybrid lasers ﻿

Investigation of aged organic solar cells stacks by cross-sectional transmission electron microscopy coupled with elemental analysis ﻿

Intrinsic switching behavior in HfO2 RRAM by fast electrical measurments on novel 2R test structures ﻿