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Browsing by Author "Cao, Yi"

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    All track directed self-assembly of block copolymers: process flow and origin of defects

    Rincon Delgadillo, Paulina  
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    Gronheid, Roel  
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    Thode, Christopher J.
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    Wu, Hengpeng
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    Cao, Yi
    Proceedings paper
    2012, Alternative Lithographic Technologies IV, 12/02/2012, p.83230D
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    Contact hole multiplication using grapho-epitaxy directed self-assembly: process choices, template optimization, and placement accuracy

    Bekaert, Joost  
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    Doise, Jan  
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    MKuppuswamy, Vijaya Kumar
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    Gronheid, Roel  
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    Chan, BT  
    Proceedings paper
    2014, 30th European Mask and Lithography Conference - EMLC, 24/06/2014, p.92310R
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    Contact hole multiplication using grapho-epitaxy directed self-assembly: process choices, template optimization, and placement accuracy

    Bekaert, Joost  
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    Doise, Jan  
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    MKuppuswamy, Vijaya Kumar
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    Chan, BT  
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    Gronheid, Roel  
    Oral presentation
    2014, FujiFilm Electronic Materials Wrokshop
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    Contact hole multiplication using grapho-epitaxy directed self-assembly: process choices, template optimization, and placement accuracy

    Bekaert, Joost  
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    Gronheid, Roel  
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    MKuppuswamy, Vijaya Kumar
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    Doise, Jan  
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    Chan, BT  
    Oral presentation
    2014, Photomask Technology (BACUS 2014)
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    Defect capture sensitivity in 14 nm half-pitch line/space DSA patterns

    Pathangi Sriraman, Hari
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    Gronheid, Roel  
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    Van Den Heuvel, Dieter  
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    Rincon Delgadillo, Paulina  
    Meeting abstract
    2014, Micro and Nano Engineering Conference - MNE, 22/09/2014
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    Defect mitigation and root cause studies in 14 nm half-pitch chemo-epitaxy directed self-assembly LiNe flow

    Pathangi Sriraman, Hari
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    Chan, BT  
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    Bayana, Hareen  
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    Vandenbroeck, Nadia  
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    Van Den Heuvel, Dieter  
    Journal article
    2015, Journal of Micro/Nanolithography MEMS and MOEMS, (14) 3, p.31204
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    Defect mitigation and root cause studies in imec's 14 nm half-pitch chemo-epitaxy DSA flow

    Pathangi Sriraman, Hari
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    Chan, BT  
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    Bayana, Hareen  
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    Van Den Heuvel, Dieter  
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    Van Look, Lieve  
    Proceedings paper
    2015, Alternative Lithographic Technologies VII, 22/02/2015, p.94230M
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    Defect reduction and defect stability in imec's 14nm half pitch chemo-epitaxy DSA flow

    Gronheid, Roel  
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    Rincon Delgadillo, Paulina  
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    Pathangi Sriraman, Hari
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    Van Den Heuvel, Dieter  
    Proceedings paper
    2014, Alternative Lithographic Technologies VI, 24/02/2014, p.904905
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    Determination of critical parameters for control of directed self-assembly of block copolymers using frequency multiplication

    Rincon Delgadillo, Paulina  
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    Gronheid, Roel  
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    Thode, Christopher
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    Wu, Hengpeng
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    Cao, Yi
    Oral presentation
    2012, Conference on Photopolymer Science and Technology
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    Determination of critical parameters for control of directed self-assembly of block copolymers using frequency multiplication

    Rincon Delgadillo, Paulina  
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    Nealey, Paul
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    Gronheid, Roel  
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    Nafus, Kathleen  
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    Somervell, Mark
    Oral presentation
    2012, 38th International Conference on Micro and NanoEngineering - MNE
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    DSA materials contributions to the defectivity performance of the 14nm half-pitch LiNe flow @ imec

    Pathangi Sriraman, Hari
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    Vaid, Varun
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    Chan, BT  
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    Vandenbroeck, Nadia  
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    Li, Jin
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    Hong, Sung Eun
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    Cao, Yi
    Proceedings paper
    2016, Alternative Lithographic Technologies VIII, 20/02/2016, p.97770G
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    High thermal stability and high VUV absorption polymer for the P4/pore stuffing approach

    Rutigliani, Vito
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    Zhang, Liping  
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    de Marneffe, Jean-Francois  
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    Cao, Yi
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    Noya, G.
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    Baklanov, Mikhaïl
    Meeting abstract
    2015, Plasma Etch and Strip in Microtechnology - PESM, 27/04/2015
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    High throughput grating qualification of directed self-assembly patterns using optical metrology

    Van Look, Lieve  
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    Rincon Delgadillo, Paulina  
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    Lee, Yu-tsung
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    Pollentier, Ivan  
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    Gronheid, Roel  
    Journal article
    2014, Microelectronic Engineering, 123, p.175-179
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    High throughput grating qualification of directed self-assembly patterns using optical metrology

    Van Look, Lieve  
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    Rincon Delgadillo, Paulina  
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    Lee, Yu-tsung
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    Pollentier, Ivan  
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    Gronheid, Roel  
    Oral presentation
    2013, 39th International Conference on Micro and Nano Engineering - MNE
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    Impact of annealing temperature on DSA process: toward faster assembly kinetics

    Suh, Hyo Seon  
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    Nair, Vineet Vijayakrishnan  
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    Rincon Delgadillo, Paulina  
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    Doise, Jan  
    Proceedings paper
    2018, Advances in Patterning Materials and Processes XXXV, 24/02/2018, p.105860T
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    Impact of BCP asymmetry on DSA patterning performance

    Williamson, Lance
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    Kim, JiHoon
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    Cao, Yi
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    Lin, Guanyang
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    Gronheid, Roel  
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    Nealey, Paul
    Proceedings paper
    2015, Alternative Lithographic Technologies VII, 22/02/2015, p.943215
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    Implementation of directed self-assembly of block copolymers in the fab for defectivity analysis

    Rincon Delgadillo, Paulina  
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    Nealey, Paul
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    Gronheid, Roel  
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    Matsunaga, Koichi
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    Somervell, Mark
    Oral presentation
    2012, FujiFilm Litho Workshop
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    Implementation of surface energy modification in grapho-epitaxy directed self-assembly for hole multiplication

    Doise, Jan  
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    Gronheid, Roel  
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    Bekaert, Joost  
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    Chan, BT  
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    Cao, Yi
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    Guanyang, Lin
    Oral presentation
    2015, 59th International Conference on Electroni Ion, and Photon Beam Technology and Nanofabrication - EIPB
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    Implementation of surface energy modification in graphoepitaxy directed self-assembly for hole multiplication

    Doise, Jan  
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    Bekaert, Joost  
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    Chan, BT  
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    Gronheid, Roel  
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    Cao, Yi
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    Hong, Sung Eun
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    Lin, Guanyang
    Journal article
    2015, Journal of Vacuum Science and Technology B, (33) 6, p.06F301
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    Implementation of templated DSA for via layer patterning at the 7 nm node

    Gronheid, Roel  
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    Doise, Jan  
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    Bekaert, Joost  
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    Chan, BT  
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    Karageorgos, Ioannis
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    Ryckaert, Julien  
    Proceedings paper
    2015, Alternative Lithographic Technologies VII, 23/02/2015, p.942305
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