Browsing by Author "Chickermane, Vivek"
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Publication A DfT architecture and tool flow for 3D-SICs with test data compression, embedded cores, and multiple towers
Journal article2015, IEEE Design & Test, (32) 4, p.40-48Publication At-speed delay testing of inter-die connections of 2.5D- and 3D-SICs
;Shibin, Konstantin ;Chickermane, Vivek ;Keller, BrionPapameletis, ChristosProceedings paper2015-05, IEEE European Test Symposium - ETS, 25/05/2015Publication At-speed delay testing of inter-die connections of 2.5D- and 3D-SICs
;Shibin, Konstantin ;Chickermane, Vivek ;Keller, BrionPapameletis, ChristosMeeting abstract2015-05, CDN Live EMEA, 27/04/2015Publication At-Speed delay testing of inter-die connections of 2.5D- and 3D-SICs
;Shibin, Konstantin ;Chickermane, Vivek ;Keller, BrionPapameletis, ChristosProceedings paper2015-05, IEEE North-Atlantic Test Workshop - NATW, 11/05/2015Publication At-speed inter-die interconnect test in 2.5D- and 3D-SICs
;Shibin, Konstantin ;Chickermane, Vivek ;Keller, BrionPapameletis, ChristosProceedings paper2015-10, IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits (3D-TEST), 8/10/2015Publication At-speed testing of inter-die connections of 3D-SICs in the presence of shore logic
;Shibin, Konstantin ;Chickermane, Vivek ;Keller, BrionPapameletis, ChristosProceedings paper2015-11, IEEE Asian Test Symposium - ATS, 22/11/2015Publication Automated design-for-test for 2.5D and 3D SICs
Journal article2011-09, Chip Scale Review, (?) 5, p.18-22Publication Automated DfT insertion and test generation for 3D-SICs with embedded cores and multiple towers
Proceedings paper2013-05, IEEE European Test Symposium - ETS, 27/05/2013, p.15-20Publication Automated DfT insertion and test generation for 3D-SICs with embedded cores and multiple towers
Oral presentation2013, Cadence CDNLive! EMEAPublication Automation of 3D DfT insertion and interconnect test generation
Oral presentation2011, IEEE International Test Conference - ITCPublication Automation of 3D-DfT insertion
Proceedings paper2011-11, IEEE Asian Test Symposium - ATS, 21/11/2011Publication Automation of 3D-DfT insertion
Proceedings paper2011-09, IEEE International Workshop on Testing Three-Dimensional Stacked ICs- 3D-TEST, 22/09/2011Publication Automation of DfT insertion and interconnect test generation for 3D stacked ICs
Proceedings paper2011-05, IEEE North-Atlantic Test Workshop - NATW, 11/05/2011Publication DfT architecture and ATPG for interconnect tests of JEDEC wide-IO DRAM memory-on-Logic 2.5D/3D-stacks
;Deutsch, Sergej ;Chickermane, Vivek ;Keller, Brion ;Mukherjee, SubhasishSood, NavdeepProceedings paper2012-05, Cadence CDNLive! EMEA, 14/05/2012Publication DfT architecture and ATPG for interconnect tests of JEDEC wide-IO memory-on-logic die stacks
;Deutsch, Sergej ;Keller, Brion ;Chickermane, Vivek ;Mukherjee, SubhasishSood, NavdeepProceedings paper2012-11, IEEE International Test Conference - ITC, 6/11/2012, p.1-10Publication DfT insertion and interconnect test generation for 3D stacks with JEDEC wide-IO DRAM
Proceedings paper2012-05, IEEE North-Atlantic Test Workshop - NATW, 9/05/2012Publication Extension of a 3D-DfT architecture for embedded cores and multiple towers
Proceedings paper2012, IEEE International Workshop on Testing Three-Dimensional Stacked ICs - 3D-TEST, 8/11/2012Publication Implementation aspects of a 3D DfT architecture
Oral presentation2011, CDNLive! EMEA (Cadence Design Systems)Publication Interconnect test for wide-IO memory-on-logic stacks
Journal article2012-07, Future Fab International, 42, p.112-117