Browsing by Author "Giusi, G."
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Publication 1/f Noise in drain and gate current of MOSFETs with high-k gate stacks
Journal article2009, IEEE Transactions on Device and Materials Reliability, (9) 2, p.180-189Publication A model for MOS gate stack quality evaluation based on the gate current 1/f noise
Proceedings paper2008, 9th European Workshop on Ultimate Integration of Silicon - ULIS, 12/03/2008, p.141-144Publication Analytical model for the 1/f noise in the tunneling current through metal-oxide-semiconductor structures
Journal article2009, Journal of Applied Physics, (106) 7, p.73710Publication Characterization of interface and oxide traps in Ge pMOSFETs based on DCIV technique
Proceedings paper2009, 2nd International Workshop on Electron Devices and Semiconductor Technology - IEDST, 1/06/2009Publication Does strain engineering impact the gate stack quality and reliability?
Proceedings paper2007, ULSI Process Integration 5, 7/10/2007, p.101-114Publication Impact strain engineering on gate stack quality and reliability
Journal article2008, Solid-State Electronics, (52) 8, p.1115-1126Publication Modeling the gate current 1/f noise and its application to advanced CMOS devices
Proceedings paper2008, 9th International Conference on Solid-State and Integrated-Circuit Technology - IC-SICT, 20/10/2008, p.420-423Publication On the dc and noise properties of the gate current in epitaxial Ge p-channel metal oxide semiconductor field effect transistors with TiN/TaN/HfO2/SiO2 gate stack
Journal article2008, Applied Physics Letters, (92) 16, p.163508Publication Performance and reliability of strained-silicon nMOSFETs with SiN cap layer
Journal article2007, IEEE Trans. Electron Devices, (54) 1, p.78-82Publication The role of the interfaces in the 1/f noise of MOSFETs with high-k gate stacks
Proceedings paper2009, Silicon Nitride, Silicon Dioxide, and Alternate Emerging Dielectrics 10, 24/05/2009, p.87-99Publication The role of the interfaces in the 1/f noise of MOSFETs with high-k gate stacks
Meeting abstract2009, 215th ECS Meeting, 24/05/2009Publication Understanding and optimization of hot-carrier reliability in germanium-on-silicon pMOSFETs
Journal article2009, IEEE Transactions on Electron Devices, (56) 5, p.1063-1069