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Browsing by Author "Son, Yunik"

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    A low-power HKMG CMOS platform compatible with DRAM node 2x and beyond

    Ritzenthaler, Romain  
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    Schram, Tom  
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    Spessot, Alessio  
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    Caillat, Christian
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    Aoulaiche, Marc
    Journal article
    2014, IEEE Transactions on Electron Devices, (61) 8, p.2935-2943
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    A new high-k/metal gate CMOS integration scheme (Diffusion and Gate Replacement) suppressing gate height asymmetry and compatible with high-thermal budget memory technologies

    Ritzenthaler, Romain  
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    Schram, Tom  
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    Spessot, Alessio  
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    Caillat, Christian
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    Cho, Moon Ju
    Proceedings paper
    2014, International Electron Devices Meeting - IEDM, 15/12/2014, p.772-775
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    Assessment of SiGe quantum well transistors for DRAM peripheral applications

    Ritzenthaler, Romain  
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    Schram, Tom  
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    Eneman, Geert  
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    Mocuta, Anda
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    Horiguchi, Naoto  
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    Thean, Aaron  
    Proceedings paper
    2015, International Conference on IC Design and Technology - ICICDT, 1/06/2015, p.1-4
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    Diffusion and gate replacement: a new gate-first high-k/metal gate CMOS integration scheme suppressing gate height symmetry

    Ritzenthaler, Romain  
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    Schram, Tom  
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    Spessot, Alessio  
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    Caillat, Christian
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    Cho, Moon Ju
    Journal article
    2016, IEEE Transactions on Electron Devices, (63) 1, p.265-271
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    I/O thick oxide device integration using Diffusion and Gate Replacement (D&GR) gate stack integration

    Ritzenthaler, Romain  
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    Schram, Tom  
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    Cho, Moon Ju
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    Mocuta, Anda
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    Horiguchi, Naoto  
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    Thean, Aaron  
    Proceedings paper
    2015, International Conference on IC Design and Technology - ICICDT, 1/06/2015, p.1-4
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    Impact of Al2O3 position on performances and reliability in high-k metal gated DRAM periphery transistors

    Aoulaiche, Marc
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    Federico, Antonio
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    Simoen, Eddy  
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    Ritzenthaler, Romain  
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    Schram, Tom  
    Proceedings paper
    2013, 43rd European Solid-State Device Research Conference - ESSDERC, 16/09/2013, p.190-193
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    Impact of thermal budget on the low-frequency noise of DRAM peripheral nMOSFETs

    Simoen, Eddy  
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    Ritzenthaler, Romain  
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    Schram, Tom  
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    Spessot, Alessio  
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    Aoulaiche, Marc
    Proceedings paper
    2015, China Semiconductor Technology International Conference - CSTIC, 15/03/2015, p.1-4
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    Low-frequency noise analysis of DRAM peripheral transistors with La cap

    Simoen, Eddy  
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    Ritzenthaler, Romain  
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    Schram, Tom  
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    Aoulaiche, Marc
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    Spessot, Alessio  
    Proceedings paper
    2014, IEEE 12th International Conference on Solid-State and Integrated Circuit Technology - ICSICT, 28/10/2014, p.1631-1633
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    Low-frequency noise assessment of border traps in Al2O3 capped DRAM peripheral MOSFETs

    Simoen, Eddy  
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    Federico, Antonio
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    Aoulaiche, Marc
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    Ritzenthaler, Romain  
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    Schram, Tom  
    Journal article
    2014, Semiconductor Science and Technology, (29) 11, p.115015
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    Strained c:Si0.55Ge0.45 with Embedded e:Si0.75Ge0.25 S/D IFQW SiGe-pFET for DRAM periphery applications

    Ritzenthaler, Romain  
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    Schram, Tom  
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    Witters, Liesbeth  
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    Mitard, Jerome  
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    Spessot, Alessio  
    Journal article
    2016, Materials Science in Semiconductor Processing, (42) 2, p.255-258
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    Thermal budget impact on HKMG Al2O3 and La-based stacks for 2x DRAM periphery transistors

    Ritzenthaler, Romain  
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    Schram, Tom  
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    Spessot, Alessio  
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    Caillat, Christian
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    Na, Hoon Jo
    Proceedings paper
    2014, IEEE Workshop On Microelectronics And Electron Devices - WMED, 18/04/2014, p.1-4
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    Thermal stability and reliability in SiGe pMOSFETs for sub-20nm DRAM applications

    Son, Yunik
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    Noh, Kyung Bong
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    Aoulaiche, Marc
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    Ritzenthaler, Romain  
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    Schram, Tom  
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    Spessot, Alessio  
    Proceedings paper
    2014, IEEE 6th International Memory Workshop - IMW, 18/05/2014, p.1-4

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