Browsing by Author "Son, Yunik"
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Publication A low-power HKMG CMOS platform compatible with DRAM node 2x and beyond
Journal article2014, IEEE Transactions on Electron Devices, (61) 8, p.2935-2943Publication A new high-k/metal gate CMOS integration scheme (Diffusion and Gate Replacement) suppressing gate height asymmetry and compatible with high-thermal budget memory technologies
Proceedings paper2014, International Electron Devices Meeting - IEDM, 15/12/2014, p.772-775Publication Assessment of SiGe quantum well transistors for DRAM peripheral applications
Proceedings paper2015, International Conference on IC Design and Technology - ICICDT, 1/06/2015, p.1-4Publication Diffusion and gate replacement: a new gate-first high-k/metal gate CMOS integration scheme suppressing gate height symmetry
Journal article2016, IEEE Transactions on Electron Devices, (63) 1, p.265-271Publication I/O thick oxide device integration using Diffusion and Gate Replacement (D&GR) gate stack integration
Proceedings paper2015, International Conference on IC Design and Technology - ICICDT, 1/06/2015, p.1-4Publication Impact of Al2O3 position on performances and reliability in high-k metal gated DRAM periphery transistors
Proceedings paper2013, 43rd European Solid-State Device Research Conference - ESSDERC, 16/09/2013, p.190-193Publication Impact of thermal budget on the low-frequency noise of DRAM peripheral nMOSFETs
Proceedings paper2015, China Semiconductor Technology International Conference - CSTIC, 15/03/2015, p.1-4Publication Low-frequency noise analysis of DRAM peripheral transistors with La cap
Proceedings paper2014, IEEE 12th International Conference on Solid-State and Integrated Circuit Technology - ICSICT, 28/10/2014, p.1631-1633Publication Low-frequency noise assessment of border traps in Al2O3 capped DRAM peripheral MOSFETs
Journal article2014, Semiconductor Science and Technology, (29) 11, p.115015Publication Strained c:Si0.55Ge0.45 with Embedded e:Si0.75Ge0.25 S/D IFQW SiGe-pFET for DRAM periphery applications
Journal article2016, Materials Science in Semiconductor Processing, (42) 2, p.255-258Publication Thermal budget impact on HKMG Al2O3 and La-based stacks for 2x DRAM periphery transistors
Proceedings paper2014, IEEE Workshop On Microelectronics And Electron Devices - WMED, 18/04/2014, p.1-4Publication Thermal stability and reliability in SiGe pMOSFETs for sub-20nm DRAM applications
Proceedings paper2014, IEEE 6th International Memory Workshop - IMW, 18/05/2014, p.1-4