Repository logo Institutional repository
  • Communities & Collections
  • Browse
  • Site
Search repository
High contrast
  1. Home
  2. Browse by Author

Browsing by Author "Stoffels, Steve"

Filter results by typing the first few letters
Now showing 1 - 20 of 142
  • Results Per Page
  • Sort Options
  • Loading...
    Thumbnail Image
    Publication

    200 V enhancement-mode p-GaN HEMTs fabricated on 200 mm GaN-on-SOI with trench isolation for monolithic integration

    Li, Xiangdong  
    ;
    Van Hove, Marleen
    ;
    Zhao, Ming  
    ;
    Geens, Karen  
    ;
    Lempinen, Vesa-Pekka
    ;
    Sormunen, Jaakko
    Proceedings paper
    2017, 41st Workshop on Compound Semiconductor Devices and Integrated Circuits - WOCSDICE, 21/05/2017, p.103-104
  • Loading...
    Thumbnail Image
    Publication

    3-D device electrothermal simulation for analysis of multifinger power HEMTs

    Chvála, Aleš
    ;
    Marek, Juraj
    ;
    Satka, Alexander
    ;
    Priesol, Juraj
    ;
    Príbytnŭ, Patrik
    ;
    Donoval, Daniel
    Proceedings paper
    2018, GaN Marathon 2.0, 18/04/2018, p.44-45
  • Loading...
    Thumbnail Image
    Publication

    A flat-panel-display compatible ultrasound platform

    Georgitzikis, Epimitheas  
    ;
    Gijsenbergh, Pieter  
    ;
    Segers, Jeremy  
    ;
    Wysocka, Dominika  
    Proceedings paper
    2023, SID Symposium, May 21-26,2023, p.1101-1104
  • Loading...
    Thumbnail Image
    Publication

    A modeling and experimental method for accurate thermal analysis of AlGan/GaN HEMT power-bars

    Sodan, Vice
    ;
    Stoffels, Steve  
    ;
    Oprins, Herman  
    ;
    Baelmans, Martine
    ;
    Decoutere, Stefaan  
    Proceedings paper
    2015, IEEE 27th International Symposium on Power Semiconductor Devices and ICs - ISPSD, 10/05/2015, p.377-380
  • Loading...
    Thumbnail Image
    Publication

    A novel gap narrowing process for creating high aspect ratio transduction gaps for MEM HF resonators

    Stoffels, Steve  
    ;
    Bryce, George  
    ;
    Van Hoof, Rita  
    ;
    Du Bois, Bert  
    ;
    Mertens, Robert  
    ;
    Puers, Bob  
    Oral presentation
    2008, MRS Fall Meeting Symposium GG: Micorlectromechanical Systems - Materials and Devices II
  • Loading...
    Thumbnail Image
    Publication

    A novel gap narrowing process for creating high aspect ratio transduction gaps for MEM HF resonators

    Stoffels, Steve  
    ;
    Bryce, George  
    ;
    Van Hoof, Rita  
    ;
    Du Bois, Bert  
    ;
    Mertens, Robert  
    ;
    Puers, Bob  
    Proceedings paper
    2009, Microelectromechanical Systems - Materials and Devices II, 1/12/2008, p.13 [1139-GG01-05-18
  • Loading...
    Thumbnail Image
    Publication

    AlGaN/GaN field effect transistors for power electronics – Effect of finite GaN layer thickness on thermal characteristics

    Hodges, Chris
    ;
    Anaya Calvo, J.
    ;
    Stoffels, Steve  
    ;
    Marcon, Denis  
    ;
    Kubal, Martin
    Journal article
    2013-11, Applied Physics Letters, (103) 20, p.202108
  • Loading...
    Thumbnail Image
    Publication

    An industry-ready 200 mm p-GaN E-mode GaN-on-Si power technology

    Posthuma, Niels  
    ;
    You, Shuzhen  
    ;
    Stoffels, Steve  
    ;
    Wellekens, Dirk  
    ;
    Liang, Hu  
    ;
    Zhao, Ming  
    Proceedings paper
    2018, 30th International Symposium on Power Semiconductor Devices and ICs - ISPSD, 13/05/2018, p.284-287
  • Loading...
    Thumbnail Image
    Publication

    Analysis of off-state leakage mechanisms in GaN-based MIS-HEMTs: experimental data and numerical simulation

    Marino, F.A.
    ;
    Bisi, D.
    ;
    Meneghini, M.
    ;
    Verzellesi, G.
    ;
    Zanoni, E.
    ;
    Van Hove, Marleen
    ;
    You, Shuzhen  
    Journal article
    2015, Solid-State Electronics, 113, p.9-14
  • Loading...
    Thumbnail Image
    Publication

    Analysis of slow de-trapping phenomena after a positive gate bias on AlGaN/GaN MIS-HEMTs with in-situ Si3N4/Al2O3 bilayer gate dielectrics

    Wu, Tian-Li
    ;
    Marcon, Denis  
    ;
    Ronchi, Nicolo  
    ;
    Bakeroot, Benoit  
    ;
    You, Shuzhen  
    ;
    Stoffels, Steve  
    Journal article
    2015, Solid-State Electronics, 103, p.127-130
  • Loading...
    Thumbnail Image
    Publication

    Analysis of the drain-to-substrate leakage of power HEMTs grown on highly resistive silicon substrate

    Borga, Matteo  
    ;
    Meneghini, Matteo
    ;
    Stoffels, Steve  
    ;
    Van Hove, Marleen
    ;
    Li, Xiangdong  
    ;
    Zhao, Ming  
    Proceedings paper
    2018, GaN Marathon 2.0, 18/04/2018, p.38-39
  • Loading...
    Thumbnail Image
    Publication

    Analysis of the gate capacitance-voltage characteristics in p-GaN/AlGaN/GaN heterostructures

    Wu, Tian-Li
    ;
    Bakeroot, Benoit  
    ;
    Liang, Hu  
    ;
    Posthuma, Niels  
    ;
    You, Shuzhen  
    ;
    Ronchi, Nicolo  
    Journal article
    2017, IEEE Electron Device Letters, (38) 12, p.1696-1699
  • Loading...
    Thumbnail Image
    Publication

    Analysis of threshold voltage instabilities in semi-vertical GaN-on-Si FETs

    Mukherjee, Kalparupa
    ;
    Borga, Matteo  
    ;
    Ruzzarin, Maria  
    ;
    De Santi, Carlo
    ;
    Stoffels, Steve  
    Journal article
    2020, Applied Physics Express, (13) 2, p.24004
  • Loading...
    Thumbnail Image
    Publication

    Analytical model for the threshold voltage of p-(Al)GaN high-electron-mobility transistors

    Bakeroot, Benoit  
    ;
    Stockman, Arno  
    ;
    Posthuma, Niels  
    ;
    Stoffels, Steve  
    ;
    Decoutere, Stefaan  
    Journal article
    2018, IEEE Transactions on Electron Devices, (65) 1, p.79-86
  • Loading...
    Thumbnail Image
    Publication

    Architecture choice for radiation-hard AlGaN/GaN HEMT power devices

    Wellekens, Dirk  
    ;
    Stoffels, Steve  
    ;
    Luu, Aurore
    ;
    Haussy, Magali
    ;
    Mélotte, Michel
    ;
    Agten, Dries
    Proceedings paper
    2017, 17th Conference on Radiation and Its Effects on Components and Systems - RADECS, 2/10/2017, p.1-5
  • Loading...
    Thumbnail Image
    Publication

    Assessment of GaN-on-Si HEMTs for 50V-2GHz RF applications: impact of the RF loss at the buffer/Si interface on the device performance

    Marcon, Denis  
    ;
    Viaene, John  
    ;
    Stoffels, Steve  
    ;
    Vanaverbeke, Fre
    ;
    Kang, Xuanwu
    ;
    Lenci, Silvia  
    Meeting abstract
    2012, Workshop on Compound Semiconductor Devices and Integrated Circuits - WOCSDICE, 28/05/2012
  • Loading...
    Thumbnail Image
    Publication

    Au-free, high-breakdown AlGaN/GaN MISHEMTs with low leakage, high yield and robust TDDB characteristics

    Lenci, Silvia  
    ;
    Kang, Xuanwu
    ;
    Wellekens, Dirk  
    ;
    Van Hove, Marleen
    ;
    Boulay, Sanae
    ;
    Stoffels, Steve  
    Proceedings paper
    2012, International Conference on Compound Semiconductor MANufacturing TECHnology - MANTECH, 23/04/2012
  • Loading...
    Thumbnail Image
    Publication

    Breakdown investigation in GaN-based MIS-HEMT devices

    Marino, Fabio
    ;
    Bisi, Davide
    ;
    Meneghini, Matteo
    ;
    Verzellesi, Giovanni
    ;
    Zanoni, Enrico
    Proceedings paper
    2014, 44th European Solid-State Device Conference - ESSDERC, 22/09/2014, p.377-380
  • Loading...
    Thumbnail Image
    Publication

    Circular MEM resonator: modeling second order effects on resonance frequency

    Nada, Yasseen
    ;
    Stoffels, Steve  
    ;
    Tilmans, Harrie  
    ;
    Hegazi, E.
    ;
    Ragai, H.F.
    ;
    Shaarawi, A.M.
    Proceedings paper
    2008-04, Int. Conf. on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Micro-Systems - EuroSimE, 20/04/2008
  • Loading...
    Thumbnail Image
    Publication

    CMOS-compatible high-power low-leakage AlGaN/GaN MISHEMT on silicon substrate

    Van Hove, Marleen
    ;
    Boulay, Sanae
    ;
    Bahl, Sandeep
    ;
    Stoffels, Steve  
    ;
    Kang, Xuanwu
    ;
    Wellekens, Dirk  
    Journal article
    2012, IEEE Electron Device Letters, (33) 5, p.667-669
  • «
  • 1 (current)
  • 2
  • 3
  • 4
  • 5
  • 6
  • 7
  • 8
  • »

Follow imec on

VimeoLinkedInFacebook

The repository

  • Contact us
  • Policy
  • About imec
Privacy statement | Cookie settings