Browsing by Author "Stoffels, Steve"
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Publication 200 V enhancement-mode p-GaN HEMTs fabricated on 200 mm GaN-on-SOI with trench isolation for monolithic integration
; ;Van Hove, Marleen; ; ;Lempinen, Vesa-PekkaSormunen, JaakkoProceedings paper2017, 41st Workshop on Compound Semiconductor Devices and Integrated Circuits - WOCSDICE, 21/05/2017, p.103-104Publication 3-D device electrothermal simulation for analysis of multifinger power HEMTs
;Chvála, Ale ;Marek, Juraj ;Satka, Alexander ;Priesol, Juraj ;Príbytnŭ, PatrikDonoval, DanielProceedings paper2018, GaN Marathon 2.0, 18/04/2018, p.44-45Publication A flat-panel-display compatible ultrasound platform
Proceedings paper2023, SID Symposium, May 21-26,2023, p.1101-1104Publication A modeling and experimental method for accurate thermal analysis of AlGan/GaN HEMT power-bars
Proceedings paper2015, IEEE 27th International Symposium on Power Semiconductor Devices and ICs - ISPSD, 10/05/2015, p.377-380Publication A novel gap narrowing process for creating high aspect ratio transduction gaps for MEM HF resonators
Oral presentation2008, MRS Fall Meeting Symposium GG: Micorlectromechanical Systems - Materials and Devices IIPublication A novel gap narrowing process for creating high aspect ratio transduction gaps for MEM HF resonators
Proceedings paper2009, Microelectromechanical Systems - Materials and Devices II, 1/12/2008, p.13 [1139-GG01-05-18Publication AlGaN/GaN field effect transistors for power electronics – Effect of finite GaN layer thickness on thermal characteristics
Journal article2013-11, Applied Physics Letters, (103) 20, p.202108Publication An industry-ready 200 mm p-GaN E-mode GaN-on-Si power technology
Proceedings paper2018, 30th International Symposium on Power Semiconductor Devices and ICs - ISPSD, 13/05/2018, p.284-287Publication Analysis of off-state leakage mechanisms in GaN-based MIS-HEMTs: experimental data and numerical simulation
Journal article2015, Solid-State Electronics, 113, p.9-14Publication Analysis of slow de-trapping phenomena after a positive gate bias on AlGaN/GaN MIS-HEMTs with in-situ Si3N4/Al2O3 bilayer gate dielectrics
Journal article2015, Solid-State Electronics, 103, p.127-130Publication Analysis of the drain-to-substrate leakage of power HEMTs grown on highly resistive silicon substrate
Proceedings paper2018, GaN Marathon 2.0, 18/04/2018, p.38-39Publication Analysis of the gate capacitance-voltage characteristics in p-GaN/AlGaN/GaN heterostructures
Journal article2017, IEEE Electron Device Letters, (38) 12, p.1696-1699Publication Analysis of threshold voltage instabilities in semi-vertical GaN-on-Si FETs
Journal article2020, Applied Physics Express, (13) 2, p.24004Publication Analytical model for the threshold voltage of p-(Al)GaN high-electron-mobility transistors
Journal article2018, IEEE Transactions on Electron Devices, (65) 1, p.79-86Publication Architecture choice for radiation-hard AlGaN/GaN HEMT power devices
Proceedings paper2017, 17th Conference on Radiation and Its Effects on Components and Systems - RADECS, 2/10/2017, p.1-5Publication Assessment of GaN-on-Si HEMTs for 50V-2GHz RF applications: impact of the RF loss at the buffer/Si interface on the device performance
Meeting abstract2012, Workshop on Compound Semiconductor Devices and Integrated Circuits - WOCSDICE, 28/05/2012Publication Au-free, high-breakdown AlGaN/GaN MISHEMTs with low leakage, high yield and robust TDDB characteristics
Proceedings paper2012, International Conference on Compound Semiconductor MANufacturing TECHnology - MANTECH, 23/04/2012Publication Breakdown investigation in GaN-based MIS-HEMT devices
;Marino, Fabio ;Bisi, Davide ;Meneghini, Matteo ;Verzellesi, GiovanniZanoni, EnricoProceedings paper2014, 44th European Solid-State Device Conference - ESSDERC, 22/09/2014, p.377-380Publication Circular MEM resonator: modeling second order effects on resonance frequency
Proceedings paper2008-04, Int. Conf. on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Micro-Systems - EuroSimE, 20/04/2008Publication CMOS-compatible high-power low-leakage AlGaN/GaN MISHEMT on silicon substrate
Journal article2012, IEEE Electron Device Letters, (33) 5, p.667-669