Browsing by Author "Willander, M."
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Publication A method to interpret micro-Raman experiments made to measure nonuniform stresses: application to local oxidation of silicon structures
;Pinardi, Kuntjoro ;Jain, Suresh ;Willander, M. ;Atkinson, A.Maes, HermanJournal article1998, Journal of Applied Physics, (84) 5, p.2507-2512Publication A review of recent work on stresses and strains in semiconductor heterostructures
;Jain, Suresh ;Willander, M. ;Pinardi, KuntjoroMaes, HermanJournal article1997, Physica Scripta, T69, p.65-72Publication A unified model for the space charge limited currents (SCLC) in organic materials combining trapping and field dependent mobility
Proceedings paper2001, Electronic, Optical, and Optoelectronic Polymers and Oligomers, 17/04/2001, p.C8.12Publication Advances in organic blue and green light sources: comparison with gaN- and ZnSe-based devices
Oral presentation1999, International Workshop on the Physics of Semiconductor DevicesPublication Advances in organic blue and green light sources: comparison with gaN- and ZnSe-based devices
Proceedings paper2000, Proceedings of the 10th International Workshop on the Physics of Semiconductor Devices, 14/12/1999, p.1099-1106Publication Behaviour of Poly-Si1-XGex-gated MOS capacitors under different electrical stress conditions in the direct tunnelling regime
Journal article2001, Semiconductor Science and Technology, (16) 6, p.478-482Publication Critical thickness and strain relaxation in lattice mismatched II-VI semiconductor layers
;Pinardi, Kuntjoro ;Jain, Uma ;Jain, Suresh ;Maes, Herman ;Van Overstraeten, RogerWillander, M.Journal article1998, Journal of Applied Physics, (83) 9, p.4724-4733Publication Depth profiling of strain using micro-Raman measurements
;Atkinson, A. ;Jain, Suresh ;Maes, Herman ;Pinardi, KuntjoroWillander, M.Journal article2001, Semiconductor Science and Technology, (16) 7, p.584-588Publication Dislocations in GaN/sapphire films: their distribution and effect on stress and optical properties
;Jain, Suresh ;Pinardi, Kuntjoro ;Maes, Herman ;Van Overstraeten, RogerWillander, M.Proceedings paper1998, Nitride Semiconductors, 1/12/1997, p.875-880Publication Effect of elastic constants on the stresses in stripes and substrates: a 2D FE calculation
;Jain, Suresh ;Pinardi, Kuntjoro ;Maes, Herman ;Van Overstraeten, RogerWillander, M.Journal article1998, Semiconductor Science and Technology, (13) 8, p.864-870Publication Electrical stress characteristics of MOS capacitors with p-type poly-SiGe and poly-Si gates in the direct tunneling regime
Proceedings paper2000, Proceedings 8th Symposium on Microwave and Optoelectronic Applications High Performance Electron Devices; 13-14 November 2000; G, p.277Publication Formation of epitaxial CoSi2 film on Si1-xGex(100) by reactive deposition epitaxy of Co1-xTix layer
;Peto, G. ;Molnar, G. ;Kotai, E. ;Dezsi, I. ;Karlsteen, M. ;Södervall, U. ;Willander, M.Oral presentation2001, Symposium D of the E-MRS Spring Meeting 2001: 2nd International Conference on Silicon Epitaxy and Heterostructures; June 5-8, 20Publication Formation of epitaxial CoSi2 films on Si and on Si/Si80Ge20 (100) by reactive deposition epitaxy
;Peto, G. ;Molnar, G. ;Kotai, E. ;Dezsi, I. ;Karsteen, M. ;Sodervall, U. ;Willander, M.Journal article2002, Applied Physics Letters, (81) 1, p.37-39Publication High field effects on J/V characteristics in conducting polymers
Proceedings paper2002, Proceedings of the XI International Conference on the Physics of Semiconductor Devices; December 2001; New Delhi, India., 11/12/2001, p.1096-1100Publication III-nitrides: growth, characterization, and properties
;Jain, Suresh ;Willander, M. ;Narayan, J.Van Overstraeten, RogerJournal article2000, Journal of Applied Physics, (87) 3, p.965-1006Publication Injection- and space charge limited-currents in doped conducting organic materials
Journal article2001, Journal of Applied Physics, (89) 7, p.3804-3810Publication Low temperature electrical performance of ultrathin oxide MOS capacitors with p+ poly-Si1-xGex and poly-Si gate materials
;Jacob, A. P. ;Myrberg, T. ;Yousif, M. Y. A. ;Nur, O. ;Willander, M. ;Lundgren, P.Sveinbjörnson, E. Ö.Proceedings paper2002, XI International Workshop on Physics of Semiconductor Devices - IWPSD, 11/12/2001, p.1088-1095Publication Material parameters for analytical and numerical modelling of Si and strained SiGe heterostructure devices
Proceedings paper2001, Advances in Materials Technology and Modeling-Bridging over Multiple-Length and Time Scales, 16/04/2001, p.AA4.24.1-AA4.24.6Publication Measurement of nonuniform stresses in semiconductor films by optical methods
;Pinardi, Kuntjoro ;Jain, Suresh ;Maes, Herman ;Van Overstraeten, RogerWillander, M.Oral presentation1997, Materials Research Society 1997 Fall Meeting : Symposium on Thin Film Stresses and Mechanical Properties; December 1-5, 1997; BoPublication Measurement of nonuniform stresses in semiconductors by the micro-Raman method
;Pinardi, Kuntjoro ;Jain, Suresh ;Maes, Herman ;Van Overstraeten, RogerWillander, M.Proceedings paper1998, Thin Films: Stresses and Mechanical Propeties VII, 1/12/1997, p.507-512