Browsing by Author "Xu, Mingwei"
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Publication A simple method for automated extraction of BJT thermal resistance form early voltage measurements
Publication Active laser characterization by scanning capacitance microscopy
Proceedings paper2002, GaAs-MANTECH Conference. Digest of Papers, 8/04/2002, p.173-175Publication Applications of Scanning Spreading Resistance Microscopy on InP-Based Materials and Devices
Xu, MingweiPHD thesis2005-04Publication Carrier spilling revisited: on-bevel junction behavior of different electrical depth profiling techniques
Journal article2003, Journal of Vacuum Science and Technology B, (21) 2, p.729-736Publication Carrier spilling revisited: the on-bevel junction behavior of different electrical depth profiling techniques
Meeting abstract2001, 6th Int. Workshop on Fabrication, Characterization and Modeling of Ultra-Shallow Doping Profiles in Semiconductors - USJ, 22/04/2001, p.335Publication Characterization of vertical RESURF diodes using scanning probe microscopy
Journal article2003, Materials Science and Engineering B, (102) 1_3, p.143-147Publication Characterization of vertical resurf diodes using scanning probe microsopy
Oral presentation2002, E-MRS Spring Meeting Symposium E: Advanced Characterisation of Semiconductor Materials and DevicesPublication Comprehensive study of TSUPREM4 boron diffusion modeling in SiGeC base layers under critical RTA conditions
Proceedings paper2004-05, Program and Abstracts Book 2nd International SiGe Technology and Device Meeting - ISTDM, 16/05/2004, p.234-235Publication Fabrication of conductive atomic force microscope probes and their evaluation for carrier mapping
Proceedings paper2003-05, Smart Sensors, Actuators, and MEMS, 19/05/2003, p.607-616Publication High resolution dopant/carrier profiling for deep submicron technologies
Oral presentation1999, 9th Canadian Semiconductor Technology Conference; July 1999; Ottawa, Canada.Publication High resolution electrical characterization of laterally overgrown epitaxial InP
Proceedings paper2003, 15th International Conference on Indium Phosphide and Related Materials - IPRM, 12/05/2003, p.563-566Publication HRXRD analysis of SiGeC layers for BiCMOS applications
Proceedings paper2004, SiGe: Materials, Processing and Devices. Proceedings of the 1st International Symposium, 3/10/2004, p.135-142Publication Lateral and vertical scaling of a QSA HBT for a 0.13μm 200GHz SiGe:C BiCMOS technology
Proceedings paper2004-09, Proceedings of the 2004 IEEE Bipolar/Bicmos Circuits and Technology Meeting - BTCM, 13/09/2004, p.229-232Publication Nanometer scale carrier profiling with scanning probes
Oral presentation2001, 7th Microscopy of Semiconductor Materials Conference; 2001; Oxford, UK.Publication Nanometer scale characterization of deep submicron devices
Oral presentation2000, 2nd International Scanning Probe Symposium; 2000; Hamburg, Germany.Publication Nanometer scale characterization of deep submicron devices
Oral presentation1999, Materials Research Society Spring Meeting: Symposium S on Si Front-End Processing - Physics and Technology of Dopant-Defect IntePublication Nanometer scale characterization of ULSI devices using scanning probes
Oral presentation2000, Journées de la Nanotechnolgy; 5-6 July 2000; Orsay, France.Publication Nm-scale characterization of deep submicron devices using scanning probes
Oral presentation2001, Conference on Microscopy; 28 March 2001; Oxford, UK.Publication Probing local electrical properties in semiconductors with nanometer resolution
Oral presentation2003, WOG Studiedag Scanning ProbesPublication Probing semiconductor technology and devices with scanning spreading resistance microscopy
Book chapter2007, Scanning Probe Microscopy : Electrical and Electromechanical Phenomena at the Nanoscale