Browsing by Author "Xu, Mingwei"
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Publication A simple method for automated extraction of BJT thermal resistance form early voltage measurements
Publication Active laser characterization by scanning capacitance microscopy
Proceedings paper2002, GaAs-MANTECH Conference. Digest of Papers, 8/04/2002, p.173-175Publication Applications of Scanning Spreading Resistance Microscopy on InP-Based Materials and Devices
Xu, MingweiPHD thesis2005-04Publication Carrier spilling revisited: on-bevel junction behavior of different electrical depth profiling techniques
Journal article2003, Journal of Vacuum Science and Technology B, (21) 2, p.729-736Publication Carrier spilling revisited: the on-bevel junction behavior of different electrical depth profiling techniques
Meeting abstract2001, 6th Int. Workshop on Fabrication, Characterization and Modeling of Ultra-Shallow Doping Profiles in Semiconductors - USJ, 22/04/2001, p.335Publication Characterization of vertical RESURF diodes using scanning probe microscopy
Journal article2003, Materials Science and Engineering B, (102) 1_3, p.143-147Publication Characterization of vertical resurf diodes using scanning probe microsopy
Oral presentation2002, E-MRS Spring Meeting Symposium E: Advanced Characterisation of Semiconductor Materials and DevicesPublication Comprehensive study of TSUPREM4 boron diffusion modeling in SiGeC base layers under critical RTA conditions
Proceedings paper2004-05, Program and Abstracts Book 2nd International SiGe Technology and Device Meeting - ISTDM, 16/05/2004, p.234-235Publication Fabrication of conductive atomic force microscope probes and their evaluation for carrier mapping
Proceedings paper2003-05, Smart Sensors, Actuators, and MEMS, 19/05/2003, p.607-616Publication High resolution dopant/carrier profiling for deep submicron technologies
Oral presentation1999, 9th Canadian Semiconductor Technology Conference; July 1999; Ottawa, Canada.Publication High resolution electrical characterization of laterally overgrown epitaxial InP
Proceedings paper2003, 15th International Conference on Indium Phosphide and Related Materials - IPRM, 12/05/2003, p.563-566Publication HRXRD analysis of SiGeC layers for BiCMOS applications
Proceedings paper2004, SiGe: Materials, Processing and Devices. Proceedings of the 1st International Symposium, 3/10/2004, p.135-142Publication Lateral and vertical scaling of a QSA HBT for a 0.13μm 200GHz SiGe:C BiCMOS technology
Proceedings paper2004-09, Proceedings of the 2004 IEEE Bipolar/Bicmos Circuits and Technology Meeting - BTCM, 13/09/2004, p.229-232Publication Nanometer scale carrier profiling with scanning probes
Oral presentation2001, 7th Microscopy of Semiconductor Materials Conference; 2001; Oxford, UK.Publication Nanometer scale characterization of deep submicron devices
Oral presentation1999, Materials Research Society Spring Meeting: Symposium S on Si Front-End Processing - Physics and Technology of Dopant-Defect IntePublication Nanometer scale characterization of deep submicron devices
Oral presentation2000, 2nd International Scanning Probe Symposium; 2000; Hamburg, Germany.Publication Nanometer scale characterization of ULSI devices using scanning probes
Oral presentation2000, Journées de la Nanotechnolgy; 5-6 July 2000; Orsay, France.Publication Nm-scale characterization of deep submicron devices using scanning probes
Oral presentation2001, Conference on Microscopy; 28 March 2001; Oxford, UK.Publication Probing local electrical properties in semiconductors with nanometer resolution
Oral presentation2003, WOG Studiedag Scanning ProbesPublication Probing semiconductor technology and devices with scanning spreading resistance microscopy
Book chapter2007