Browsing by author "Beyne, Sofie"
Now showing items 1-20 of 22
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1/f noise measurements for faster electromigration characterization
Beyne, Sofie; Croes, Kristof; De Wolf, Ingrid; Tokei, Zsolt (2016) -
1/f noise measurements for faster evaluation of electromigration in advanced microelectronics interconnections
Beyne, Sofie; Croes, Kristof; De Wolf, Ingrid; Tokei, Zsolt (2016) -
A novel electromigration characterization method based on low-frequency noise measurements
Beyne, Sofie; Varela Pedreira, Olalla; De Wolf, Ingrid; Tokei, Zsolt; Croes, Kristof (2019) -
Demonstration of low-frequency noise measurements for studying electromigration mechanisms in advanced nano-scaled interconnects
Beyne, Sofie; Croes, Kristof; De Wolf, Ingrid; Tokei, Zsolt (2017) -
Direct correlation between low-frequency noise measurements and electromigration lifetimes
Beyne, Sofie; Croes, Kristof; De Wolf, Ingrid; Tokei, Zsolt (2017) -
Electromigration activation energies in alternative metal interconnects
Beyne, Sofie; Varela Pedreira, Olalla; Oprins, Herman; De Wolf, Ingrid; Tokei, Zsolt; Croes, Kristof (2019) -
Electromigration activation energies in ruthenium interconnects
Beyne, Sofie; Varela Pedreira, Olalla; Oprins, Herman; De Wolf, Ingrid; Tokei, Zsolt; Croes, Kristof (2019) -
Electromigration Mechanisms in Scaled Interconnects
Beyne, Sofie (2019-09) -
Experimental validation of electromigration by low frequency noise measurement for advanced interconnects application
Tang, Baojun; Croes, Kristof; Simoen, Eddy; Beyne, Sofie; Adelmann, Christoph; Tokei, Zsolt (2015) -
Fluctuation scaling in metals
Beyne, Sofie; Beyne, Tim (2017) -
Fluctuation scaling in nano-interconnects and its application to electromigration
Beyne, Sofie; Beyne, Tim (2019) -
Interconnect metals beyond copper: reliability challenges and opportunities
Croes, Kristof; Adelmann, Christoph; Wilson, Chris; Zahedmanesh, Houman; Varela Pedreira, Olalla; Wu, Chen; Lesniewska, Alicja; Oprins, Herman; Beyne, Sofie; Ciofi, Ivan; Kocaay, Deniz; Stucchi, Michele; Tokei, Zsolt (2018) -
Low-frequency Noise and Defects in Copper and Ruthenium Resistors
Fleetwood, Dan; Beyne, Sofie; jiang, Rong; Zhao, S. E.; Whang, P.; Bonaldo, S.; McCurdy, M. W.; Tokei, Zsolt; De Wolf, Ingrid; Croes, Kristof; Zhang, E. X.; Alles, M. S.; Schrimpf, Ronald; Reed, Robert; Linten, Dimitri (2019) -
Low-frequency noise and thermal equilibrium properties of vacancies
Beyne, Sofie; De Wolf, Ingrid; Tokei, Zsolt; Croes, Kristof (2019) -
Low-frequency noise measurements for electromigration characterization in BEOL interconnects
Beyne, Sofie; Croes, Kristof; Varela Pedreira, Olalla; Arnoldi, Laurent; van der Veen, Marleen; De Wolf, Ingrid; Tokei, Zsolt (2019) -
Low-frequency noise measurements to characterize Cu-electromigration down to 44nm metal pitch
Beyne, Sofie; Varela Pedreira, Olalla; De Wolf, Ingrid; Tokei, Zsolt; Croes, Kristof (2019) -
Nanotopography control for wafer-to-wafer hybrid bonding by CMP
Heylen, Nancy; Kim, Soon-Wook; Kim, Tae-Gon; Peng, Lan; Nolmans, Philip; Struyf, Herbert; Miller, Andy; Beyer, Gerald; Beyne, Sofie (2017) -
On the design of an automated system for the characterization of the electromigration performance of advanced interconnects by means of low frequency noise measurements
Scandurra, Graziella; Beyne, Sofie; Giusi, Gino; Ciofi, Carmine (2019) -
Study of electromigration mechanisms in 22nm half-pitch Cu interconnects by 1/f noise measurements
Beyne, Sofie; Croes, Kristof; van der Veen, Marleen; Varela Pedreira, Olalla; Qi, Q.; De Wolf, Ingrid; Tokei, Zsolt (2017) -
Study of the enhanced electromigration performance of Cu(Mn) by low-frequency noise measurements and atom probe tomography
Beyne, Sofie; Arnoldi, Laurent; De Wolf, Ingrid; Tokei, Zsolt; Croes, Kristof (2017)