Browsing by author "Zhang, W.D."
Now showing items 1-12 of 12
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A novel trapping/detrapping model for defect profiling in high-k materials using the two-pulse capacitance-voltage technique
Ruiz Aguado, Daniel; Govoreanu, Bogdan; Zhang, W.D.; Jurczak, Gosia; De Meyer, Kristin; Van Houdt, Jan (2010) -
Effects of detrapping on electron traps generated in gate oxides
Zhang, W.D.; Zhang, J.F.; Lalor, M.J.; Burton, D.R.; Groeseneken, Guido; Degraeve, Robin (2003) -
Electron trap generation at different temperatures in the gate oxide
Zhang, W.D.; Zhang, J.F.; Wood, M.; Lalor, M.; Burton, D.; Groeseneken, Guido; Degraeve, Robin (2002) -
Electron trapping in HfAI0 high-k stack for Flash memory applications: an origin of Vth window closure during cyclling operations
Zheng, X.F.; Robinson, Colin; Zhang, W.D.; Zhang, Jian Fu; Govoreanu, Bogdan; Van Houdt, Jan (2011-05) -
Energy and spatial distributions of electron traps throughout Sio2/Al2O3 stacks as the IPD in flash memory application
Zheng, X.F.; Zhang, W.D.; Govoreanu, Bogdan; Ruiz Aguado, Daniel; Zhang, .F.; Van Houdt, Jan (2010) -
Energy distribution of positive charges in high-k dielectric
Hatta, S. W. M.; Ji, Z.; Zhang, J. F.; Zhang, W.D.; Soin, N.; Kaczer, Ben; De Gendt, Stefan; Groeseneken, Guido (2014) -
Impact of PDA temperature on electron trap energy and spatial distributions in SiO2/Al2O3 stack as the IPD in Flash memory cells
Zheng, X.F.; Zhang, W.D.; Govoreanu, Bogdan; Zhang, J.F.; Van Houdt, Jan (2009) -
Statistical characterization of vertical poly-Si channel using charge pumping technique for 3D flash memory optimization
Tang, Baojun; Toledano Luque, Maria; Zhang, W.D.; Van den Bosch, Geert; Degraeve, Robin; Zhang, J.F.; Van Houdt, Jan (2013) -
Statistical characterization of vertical poly-Si channel using charge pumping technique for 3D flash memory optimization
Tang, Baojun; Toledano Luque, Maria; Zhang, W.D.; Van den Bosch, Geert; Degraeve, Robin; Zhang, J.F.; Van Houdt, Jan (2013) -
Two types of electron traps generated in the gate silicon dioxide
Zhang, W.D.; Zhang, J.F.; Lalor, M.; Burton, D.; Groeseneken, Guido; Degraeve, Robin (2002) -
Two-pulse C-V: a new method for characterization electron traps in the bulk of SiO2/high-k dielectric stacks
Zhang, W.D.; Govoreanu, Bogdan; Zheng, X.F.; Ruiz Aguado, Daniel; Rosmeulen, Maarten; Blomme, Pieter; Zhang, J.F.; Van Houdt, Jan (2008) -
Which defect breaks down gate oxides?
Zhang, W.D.; Zhang, J.F.; Zhao, C.Z.; Groeseneken, Guido; Degraeve, Robin (2003)