Browsing by author "Giusi, G."
Now showing items 1-12 of 12
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1/f Noise in drain and gate current of MOSFETs with high-k gate stacks
Magnone, P.; Crupi, F.; Giusi, G.; Pace, C.; Simoen, Eddy; Claeys, Cor; Pantisano, Luigi; Maji, D.; Rao, V.R.; Srinivasan, P. (2009) -
A model for MOS gate stack quality evaluation based on the gate current 1/f noise
Magnone, P.; Crupi, F.; Iannacone, G.; Giusi, G.; Pace, C.; Simoen, Eddy; Claeys, Cor (2008) -
Analytical model for the 1/f noise in the tunneling current through metal-oxide-semiconductor structures
Crupi, F.; Giusi, G.; Iannacone, G.; Magnone, P.; Pace, C.; Simoen, Eddy; Claeys, Cor (2009) -
Characterization of interface and oxide traps in Ge pMOSFETs based on DCIV technique
Maji, D.; Crupi, F.; Magnone, P.; Giusi, G.; Pace, C.; Simoen, Eddy; Rao, V.Ramgopal (2009) -
Does strain engineering impact the gate stack quality and reliability?
Claeys, Cor; Simoen, Eddy; Giusi, G.; Crupi, F. (2007) -
Impact strain engineering on gate stack quality and reliability
Claeys, Cor; Simoen, Eddy; Put, Sofie; Giusi, G.; Crupi, F. (2008) -
Modeling the gate current 1/f noise and its application to advanced CMOS devices
Crupi, F.; Magnone, P.; Iannacone, G.; Giusi, G.; Pace, C.; Simoen, Eddy; Claeys, Cor (2008) -
On the dc and noise properties of the gate current in epitaxial Ge p-channel metal oxide semiconductor field effect transistors with TiN/TaN/HfO2/SiO2 gate stack
Maji, D.; Crupi, F.; Giusi, G.; Pace, C.; Simoen, Eddy; Claeys, Cor; Rao, V.R. (2008) -
Performance and reliability of strained-silicon nMOSFETs with SiN cap layer
Giusi, G.; Crupi, F.; Simoen, Eddy; Eneman, Geert; Jurczak, Gosia (2007) -
The role of the interfaces in the 1/f noise of MOSFETs with high-k gate stacks
Crupi, F.; Magnone, P.; Simoen, Eddy; Pantisano, Luigi; Giusi, G.; Pace, C.; Claeys, Cor (2009) -
The role of the interfaces in the 1/f noise of MOSFETs with high-k gate stacks
Crupi, F.; Magnone, P.; Simoen, Eddy; Mercha, Abdelkarim; Pantisano, Luigi; Giusi, G.; Pace, C.; Claeys, Cor (2009) -
Understanding and optimization of hot-carrier reliability in germanium-on-silicon pMOSFETs
Maji, D.; Crupi, Felice; Amat, E.; Simoen, Eddy; De Jaeger, Brice; Brunco, David; Manoj, C.R.; Ramgopal Rao, V.; Magnone, P.; Giusi, G.; Pace, C.; Pantisano, Luigi; Mitard, Jerome; Rodríguez, R.; Nafría, M. (2009)