Browsing by author "Duval, Fabrice"
Now showing items 1-20 of 40
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10 and 7 mu m Pitch Thermo-compression Solder Joint, Using A Novel Solder Pillar And Metal Spacer Process
Derakhshandeh, Jaber; Capuz, Giovanni; Cherman, Vladimir; Inoue, Fumihiro; De Preter, Inge; Hou, Lin; Bex, Pieter; Gerets, Carine; Duval, Fabrice; Webers, Tomas; Bertheau, Julien; Van Huylenbroeck, Stefaan; Phommahaxay, Alain; Shafahian, Ehsan; Van der Plas, Geert; Beyne, Eric; Miller, Andy; Beyer, Gerald (2020) -
3D IC assembly using thermal compression bonding and wafer-level underfill – strategies for quality improvement and throughput enhancement
Wang, Teng; Bex, Pieter; Capuz, Giovanni; Duval, Fabrice; Inoue, Fumihiro; Gerets, Carine; Bertheau, Julien; Rebibis, Kenneth June; Miller, Andy; Beyer, Gerald; Beyne, Eric; Natsukawa, Masanori; Mitsukura, Kazuyuki; Hatakeyama, Keiichi (2016) -
3D wafer-level packaging die stacking using spin-on-dielectric polymer liner through-silicon vias
Civale, Yann; Sabuncuoglu Tezcan, Deniz; Philipsen, Harold; Duval, Fabrice; Jaenen, Patrick; Travaly, Youssef; Soussan, Philippe; Swinnen, Bart; Beyne, Eric (2011) -
A capacitive humidity sensor using a positive photosensitive polymer
Pham, Nga; Cherman, Vladimir; Duval, Fabrice; Sabuncuoglu Tezcan, Deniz; Jansen, Roelof; Tilmans, Harrie (2010) -
A descum review for cleaning surfaces in polymer embedded process flows
Jamieson, Geraldine; Iker, Francois; Takeshi, Kita; Duval, Fabrice; Pham, Nga; Gerets, Carine; Boullart, Werner; Funaya, T. (2010) -
A new scaled through Si via with polymer fill for 3D wafer level packaging
Sabuncuoglu Tezcan, Deniz; Duval, Fabrice; Luhn, Ole; Soussan, Philippe; Swinnen, Bart (2008) -
A novel fan-out concept for ultra-high chip-to-chip interconnect density with 20-μm pitch
Podpod, Arnita; Slabbekoorn, John; Phommahaxay, Alain; Duval, Fabrice; Salahouelhadj, Abdellah; Gonzalez, Mario; Rebibis, Kenneth June; Miller, Andy; Beyer, Gerald; Beyne, Eric (2018) -
A novel method for characterization of Ultra Low Viscosity NCF layers using TCB for 3D Assembly
Capuz, Giovanni; Lofrano, Melina; Gerets, Carine; Duval, Fabrice; Bex, Pieter; Derakhshandeh, Jaber; Phommahaxay, Alain; Beyne, Eric; Miller, Andy; Vanstreels, Kris (2020) -
A unique temporary bond solution based on a thermoplastic material tacky at room temperature and highly thermally resistant application extension from 3D-SIC to FO-WLP
Phommahaxay, Alain; Nakamura, Atsushi; Potoms, Goedele; Bertheau, Julien; Bex, Pieter; Duval, Fabrice; Podpod, Arnita; Verbinnen, Greet; Kamochi, Yoshitaka; Sawano, Mitsuru; Beyer, Gerald; Sleeckx, Erik; Beyne, Eric (2017) -
Broadband permittivity characterization of polymers up to 110GHz using co-planar waveguides
Pantano, Nicolas; Slabbekoorn, John; Duval, Fabrice; Beyne, Eric (2021) -
Challenges and solutions on pre-assembly processes for thinned 3D wafers with micro-bumps on the backside
Podpod, Arnita; Demeurisse, Caroline; Rebibis, Kenneth June; Gerets, Carine; Phommahaxay, Alain; Capuz, Giovanni; Duval, Fabrice; Sleeckx, Erik; Struyf, Herbert; Miller, Andy; Beyne, Eric; Beyer, Gerald (2014) -
Chip embedding by spin-on-dielectrics
Duval, Fabrice; Soussan, Philippe; Detalle, Mikael; Beyne, Eric (2012) -
Comparison of electrical properties of thermo-compression bonded 3D stacks using a liquid and a dry-film wafer level underfills
Duval, Fabrice; Wang, Teng; Capuz, Giovanni; Gerets, Carine; Miller, Andy; Rebibis, Kenneth June; Beyne, Eric (2015) -
Developing underfill process in screening of no-flow underfill and wafer-applied underfill materials for 3D stacking
Rebibis, Kenneth June; Capuz, Giovanni; Daily, Robert; Gerets, Carine; Duval, Fabrice; Wang, Teng; Struyf, Herbert; Miller, Andy; Beyer, Gerald; Beyne, Eric; Swinnen, Bart (2013) -
Development and evaluation of photodefinable wafer level underfill
Mitsukura, Kazuyuki; Saisyo, Ryouta; Makino, Tatsuya; Hatakeyama, Keiichi; Minegishi, Tomonori; Wang, Teng; Daily, Robert; Duval, Fabrice; Rebibis, Kenneth June; Miller, Andy; Beyne, Eric (2015) -
Development of compression molding process for Fan-Out wafer level packaging
Bertheau, Julien; Duval, Fabrice; Kubota, Tadashi; Bex, Pieter; Kennes, Koen; Phommahaxay, Alain; Podpod, Arnita; Beyne, Eric; Miller, Andy; Beyer, Gerald (2020) -
Die stacking using 3D-wafer level packaging copper/polymer through-Si via technology and Cu/Sn interconnect bumping
Civale, Yann; Sabuncuoglu Tezcan, Deniz; Philipsen, Harold; Jaenen, Patrick; Agarwal, Rahul; Duval, Fabrice; Soussan, Philippe; Travaly, Youssef; Beyne, Eric (2009) -
Electrical characterization, modeling and reliability analysis of a via last TSV
Majeed, Bivragh; Sabuncuoglu Tezcan, Deniz; Vandevelde, Bart; Duval, Fabrice; Soussan, Philippe; Beyne, Eric (2010) -
Enabling pre-sssembly process of 3D wafers with high topography at the backside
Podpod, Arnita; Demeurisse, Caroline; Inoue, Fumihiro; Duval, Fabrice; Visker, Jakob; De Vos, Joeri; Rebibis, Kenneth June; Miller, Andy; Beyer, Gerald; Beyne, Eric (2015) -
Evaluation of photosensitive spin-on-dielectrics for 3-D wafer level packaging
Duval, Fabrice; Soussan, Philippe; Miller, Andy; De Raedt, Walter; Sun, Xiao; Beyne, Eric; Okoro, Chukwudi (2010)