Browsing by author "Bargallo Gonzalez, Mireia"
Now showing items 1-20 of 72
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Aging mechanisms in strained Si/high-k based pMOS transistors. Implications in CMOS circuits
Martin-Martinez, J.; Amat, E.; Ayala, N.; Bargallo Gonzalez, Mireia; Verheyen, Peter; Rodriguez, R.; Nafria, M.; Aymerich, X.; Simoen, Eddy (2011) -
Analysis of the pre-epi bake conditions on the defect creation in recessed Si1-xGex S/D junctions
Bargallo Gonzalez, Mireia; Thomas, Nicole; Simoen, Eddy; Verheyen, Peter; Hikavyy, Andriy; Leys, Frederik; Okuno, Yasutoshi; Vissouvanadin Soubaretty, Bertrand; Van Daele, Benny; Geenen, Luc; Loo, Roger; Claeys, Cor; Machkaoutsan, Vladimir; Tomasini, P.; Thomas, S.G.; Lu, J.P.; Weijtmans, J.W.; Wise, R. (2007) -
Analysis of the temperature dependence of trap-assisted tunneling in Ge pFET junctions
Bargallo Gonzalez, Mireia; Eneman, Geert; Wang, Gang; De Jaeger, Brice; Simoen, Eddy; Claeys, Cor (2011) -
Analysis of the temperature dependence of trap-assisted-tunneling in Ge pFETs junctions
Bargallo Gonzalez, Mireia; Eneman, Geert; Wang, Gang; De Jaeger, Brice; Simoen, Eddy; Claeys, Cor (2011) -
Carrier lifetime evaluation of electron irradiated SiGe/Si diode
Idemoto, T.; Ohyama, H.; Takakura, K.; Tsunoda, I.; Yoneoka, M.; Nakashima, T.; Bargallo Gonzalez, Mireia; Simoen, Eddy; Claeys, Cor (2010) -
Channel hot-carrier degradation on strained MOSFETs with embedded SiGe or SiC source/drain
Amat, Esteve; Rodriguez, Rosana; Bargallo Gonzalez, Mireia; Martin Martinez, Javier; Nafria, Montse; Aymerich, Xavier; Machkaoutsan, Vladimir; Bauer, M.; Verheyen, (2010) -
CHC degradation of strained devices based on SiON and high-k gate dielectric materials
Amat, E.; Rodriguez, R.; Bargallo Gonzalez, Mireia; Martin-Martinez, J.; Nafria, M.; Aymerich, X.; Verheyen, Peter; Simoen, Eddy (2011) -
Combined IV and CV analysis of laser annealed carbon and boron implanted SiGe epitaxial layers
Kobayashi, Daisuke; Bargallo Gonzalez, Mireia; Rosseel, Erik; Hikavyy, Andriy; Hirose, K.; Simoen, Eddy; Claeys, Cor (2010) -
Combined IV and CV analysis of laser annealed carbon and boron implanted SiGe epitaxial layers
Kobayashi, Daisuke; Bargallo Gonzalez, Mireia; Rosseel, Erik; Hikavyy, Andriy; Hirose, Kazuyuki; Simoen, Eddy; Claeys, Cor (2010-10) -
Defect assessment and leakage control in Ge pFET junctions
Bargallo Gonzalez, Mireia; Simoen, Eddy; Eneman, Geert; De Jaeger, Brice; Wang, Gang; Loo, Roger; Claeys, Cor (2013-09) -
Defect assessment control and engineering in advanced homo- and hetero-epitaxial device structures
Bargallo Gonzalez, Mireia (2011-04) -
Device assessment of the electrical activity of threading dislocations in strained Ge epitaxial layers
Simoen, Eddy; Brouwers, Gijs; Eneman, Geert; Bargallo Gonzalez, Mireia; De Jaeger, Brice; Mitard, Jerome; Brunco, David; Souriau, Laurent; Cody, N.; Thomas, S.; Meuris, Marc (2008) -
Effects of electron and proton radiation on embedded SiGe source/drain diodes
Ohyama, H.; Nagano, T.; Takakura, K.; Motoki, M.; Matsuo, M.; Nakamura, H.; Sawada, M.; Midorikawa, M.; Kuboyama, S.; Bargallo Gonzalez, Mireia; Simoen, Eddy; Claeys, Cor (2008) -
Effects of electron irradiation on SiGe devices
Ohyama, Hidenori; Nagano, T.; Takakura, K.; Motoki, M.; Matsuo, K.; Nakamura, H.; Sawada, M.; Kuboyama, S.; Bargallo Gonzalez, Mireia; Simoen, Eddy; Eneman, Geert; Claeys, Cor (2010) -
Elastic relaxation evaluation in SiGe/Si hetero-epitaxial structures
Bargallo Gonzalez, Mireia; Naka, N.; Hikavyy, Andriy; Eneman, Geert; Loo, Roger; Simoen, Eddy; Claeys, Cor (2011) -
Elastic relaxation evaluation in SiGe/Si hetero-epitaxial structures
Bargallo Gonzalez, Mireia; Naka, N.; Hikavyy, Andriy; Eneman, Geert; Loo, Roger; Simoen, Eddy; Claeys, Cor (2011) -
Electric field dependence of trap-assisted-tunneling current in strained SiGe source/drain junctions
Bargallo Gonzalez, Mireia; Simoen, Eddy; Vissouvanadin Soubaretty, Bertrand; Eneman, Geert; Verheyen, Peter; Loo, Roger; Claeys, Cor (2009) -
Electrical activity of dislocations and defects in strained Si and Ge based devices
Simoen, Eddy; Eneman, Geert; Verheyen, Peter; Loo, Roger; Bargallo Gonzalez, Mireia; Claeys, Cor (2008) -
Electrical activity of dislocations and defects in strained Si and Ge based devices
Simoen, Eddy; Eneman, Geert; Verheyen, Peter; Loo, Roger; Bargallo Gonzalez, Mireia; Claeys, Cor (2008) -
Electrical defect issues of hetero-epitaxy for advanced nanometric CMOS technologies
Claeys, Cor; Bargallo Gonzalez, Mireia; Eneman, Geert; Hikavyy, Andriy; Loo, Roger; Simoen, Eddy (2009)