Browsing by author "van Dorp, Dennis"
Now showing items 1-20 of 59
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A record GmSAT/SSSAT and PBTI reliability in Si-passivated Ge nFinFETs by improved gate stack surface preparation
Arimura, Hiroaki; Cott, Daire; Boccardi, Guillaume; Loo, Roger; Wostyn, Kurt; Brus, Stephan; Capogreco, Elena; Opdebeeck, Ann; Witters, Liesbeth; Conard, Thierry; Suhard, Samuel; van Dorp, Dennis; Kenis, Karine; Ragnarsson, Lars-Ake; Mitard, Jerome; Holsteyns, Frank; De Heyn, Vincent; Mocuta, Dan; Collaert, Nadine; Horiguchi, Naoto (2019-06) -
A synchrotron radiation photoelectron spectroscopy study on atomic-scale wet etching of InAs (111)-A and (111)-B in acidic peroxide solutions: surface chemistry versus kinetics
Abrenica, Graniel; Lebedev, M. V.; Fingerle, M.; Arnauts, Sophia; Calvet, W.; Mayer, T.; De Gendt, Stefan; van Dorp, Dennis (2022) -
Advanced metrology for beyond silicon semiconductor device structures
Schulze, Andreas; Loo, Roger; Meersschaut, Johan; van Dorp, Dennis; Gachet, David; Berney, Jean; Vandervorst, Wilfried; Caymax, Matty (2015) -
Amorphous gadolinium aluminate as a dielectric and sulfur for indium phosphide passivation
van Dorp, Dennis; Nyns, Laura; Cuypers, Daniel; Ivanov, Tsvetan; Brizzi, Simone; Tallarida, Massimo; Fleischmann, Claudia; Hönicke, Philipp; Müller, Matthias; Richard, Olivier; Schmeisser, Dieter; De Gendt, Stefan; Lin, Dennis; Adelmann, Christoph (2019) -
An InGaAs/InP quantum well FinFET using the replacement fin process integrated in an RMG flow on 300mm Si substrates
Waldron, Niamh; Merckling, Clement; Guo, Weiming; Ong, Patrick; Teugels, Lieve; Ansar, Sheikh; Tsvetanova, Diana; Sebaai, Farid; van Dorp, Dennis; Milenin, Alexey; Lin, Dennis; Nyns, Laura; Mitard, Jerome; Pourghaderi, Mohammad Ali; Douhard, Bastien; Richard, Olivier; Bender, Hugo; Boccardi, Guillaume; Caymax, Matty; Heyns, Marc; Vandervorst, Wilfried; Barla, Kathy; Collaert, Nadine; Thean, Aaron (2014) -
Anodic etching of n-GaN epilayer into porous GaN and its photoelectrochemical properties
Tseng, Peter; van Dorp, Dennis; Lieten, Ruben; Vereecken, Philippe; Borghs, Gustaaf (2014) -
Atomic-scale investigations on the wet etching kinetics of Ge versus SiGe in acidic H2O2 solutions: a post operando synchrotron XPS analysis
Abrenica, Graniel; Lebedev, Mikhail; Fingerle, Mathias; Arnauts, Sophia; Bazzazian, Nina; Calvet, Wolfram; Porret, Clément; Bender, Hugo; Mayer, Thomas; De Gendt, Stefan; van Dorp, Dennis (2020) -
Atomic-Scale Investigations on the Wet Etching of Group IV Semiconductors in Acidic H2O2 Solution: The Case Ge Versus Si-Ge
van Dorp, Dennis; Abrenica, Graniel; Mayer, T.; Arnauts, Sophia; Altamirano Sanchez, Efrain; De Gendt, Stefan (2021-05) -
Challenges on surface conditioning in 3D device architectures: triple-gate FinFETs, gate-all-around lateral and vertical nanowire FETs
Veloso, Anabela; Paraschiv, Vasile; Vecchio, Emma; Devriendt, Katia; Li, Waikin; Simoen, Eddy; Chan, BT; Tao, Zheng; Rosseel, Erik; Loo, Roger; Milenin, Alexey; Kunert, Bernardette; Teugels, Lieve; Sebaai, Farid; Lorant, Christophe; van Dorp, Dennis; Altamirano Sanchez, Efrain; Brus, Stephan; Marien, Philippe; Fleischmann, Claudia; Melkonyan, Davit; Huynh Bao, Trong; Eneman, Geert; Hellings, Geert; Sibaja-Hernandez, Arturo; Matagne, Philippe; Waldron, Niamh; Mocuta, Dan; Collaert, Nadine (2017) -
Challenges on surface conditioning in 3D device architectures: triple-gate finFETs, gate-all-around lateral and vertical nanowireFETs
Veloso, Anabela; Paraschiv, Vasile; Vecchio, Emma; Devriendt, Katia; Li, Waikin; Simoen, Eddy; Chan, BT; Tao, Zheng; Rosseel, Erik; Loo, Roger; Milenin, Alexey; Kunert, Bernardette; Teugels, Lieve; Sebaai, Farid; Lorant, Christophe; van Dorp, Dennis; Altamirano Sanchez, Efrain; Brus, Stephan; Marien, Philippe; Sibaja-Hernandez, Arturo; Matagne, Philippe; Waldron, Niamh; Mocuta, Dan; Collaert, Nadine (2017) -
Characterization and (electro)chemical studies of halide-passivated Ge (100) surfaces in acidic solutions
Abrenica, Graniel; Lebedev, Mikhail; Le, Hy; Hajduk, Andreas; Fingerle, Mathias; Mayer, Thomas; De Gendt, Stefan; van Dorp, Dennis (2019) -
Characterization of InP growth in nm-sized trenches by a combination of NC-AFM and STM
Mannarino, Manuel; Eyben, Pierre; Chintala, Ravi Chandra; Merckling, Clement; van Dorp, Dennis; Vandervorst, Wilfried (2014) -
Chemical Etching of GaN in KOH Solution: Role of Surface Polarity and Prior Photoetching
Weyher, J. L.; van Dorp, Dennis; Conard, Thierry; Nowak, G.; Levchenko, I.; Kelly, J. J. (2022) -
Cleaning of III-V materials: surface chemistry considerations
van Dorp, Dennis; Cuypers, Daniel; Arnauts, Sophia; Mertens, Paul; De Gendt, Stefan (2013) -
Enhanced photocatalytic activity of nanoroughened GaN by dry etching
Tseng, Peter; van Dorp, Dennis; Lieten, Ruben; Mehta, Bharat; Vereecken, Philippe; Borghs, Gustaaf (2013) -
Enhanced photoelectrochemical activity of GaN by dry etching into nanopillar array
Tseng, Peter; Mehta, Bharat; van Dorp, Dennis; Lieten, Ruben; Vereecken, Philippe; Borghs, Gustaaf (2013) -
Enhanced photoelectrochemical activity of GaN by dry etching into nanopillar array
Tseng, Peter; Mehta, Bharat; van Dorp, Dennis; Lieten, Ruben; Vereecken, Philippe; Borghs, Gustaaf (2013) -
Epitaxial defects in nanoscale InP Fin structures revealed by wet-chemical etching
van Dorp, Dennis; Mannarino, Manuel; Arnauts, Sophia; Bender, Hugo; Merckling, Clement; Moussa, Alain; Vandervorst, Wilfried; Schulze, Andreas (2017) -
Etching of III-V materials determined by ICP-MS with sub-nanometer precision
Rip, Jens; Cuypers, Daniel; Arnauts, Sophia; Holsteyns, Frank; van Dorp, Dennis; De Gendt, Stefan (2014)