Browsing by author "Duhayon, Natasja"
Now showing items 1-20 of 42
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A detailed study of SCM on cross-sectional and beveled junctions
Duhayon, Natasja; Clarysse, Trudo; Eyben, Pierre; Vandervorst, Wilfried; Hellemans, L. (2001) -
Active laser characterization by scanning capacitance microscopy
Xu, Mingwei; Duhayon, Natasja; Vandervorst, Wilfried (2002) -
Application of SCM to process development of novel devices
Duhayon, Natasja; Vandervorst, Wilfried; Hellemans, L. (2003) -
Assessing the performance of two-dimensional dopant profiling techniques
Duhayon, Natasja; Eyben, Pierre; Fouchier, Marc; Clarysse, Trudo; Vandervorst, Wilfried; Alvarez, David; Schoemann, S.; Ciappa, M.; Stangoni, M.; Fichtner, W.; Formanek, P.; Raineri, V.; Giannazzo, F.; Goghero, D.; Rosenwaks, Y.; Shikler, R.; Saraf, S.; Sadewasser, S.; Barreau, N.; Glatzel, T.; Verheijen, M.; Mentink, S.A.M.; von Sprekelsen, M.; Maltezopoulos, T.; Wiesendanger, R.; Hellemans, L. (2003) -
Assessing the performance of two-dimensional dopant profiling techniques
Duhayon, Natasja; Eyben, Pierre; Fouchier, Marc; Clarysse, Trudo; Vandervorst, Wilfried; Álvarez, D.; Schoemann, S.; Ciappa, M.; Stangoni, M.; Fichtner, W.; Formanek, P.; Kittler, M.; Raineri, V.; Giannazzo, F.; Goghero, D.; Rosenwaks, Y.; Shikler, R.; Saraf, S.; Sadewasser, S.; Barreau, N.; Glatzel, T.; Verheijen, M.; Mentink, S.A.M.; von Sprekelsen, M.; Maltezopoulos, T.; Wiesendanger, R.; Hellemans, L. (2004) -
Assessing the resolution limits of scanning spreading resistance microscopy and scanning capacitance microscopy
Eyben, Pierre; Duhayon, Natasja; Alvarez, David; Vandervorst, Wilfried (2003) -
Assessing the resolution limits of scanning spreading resistance microscopy and scanning capacitance microscopy
Eyben, Pierre; Duhayon, Natasja; Alvarez, David; Vandervorst, Wilfried (2003) -
Bias-induced junction displacements in scanning spreading resistance microscopy and scanning capacitance microscopy
Eyben, Pierre; Duhayon, Natasja; Clarysse, Trudo; Vandervorst, Wilfried (2003) -
Bias-induced junction displacements in SSRM and SCM
Eyben, Pierre; Duhayon, Natasja; Clarysse, Trudo; Vandervorst, Wilfried (2001) -
Carrier spilling revisited: on-bevel junction behavior of different electrical depth profiling techniques
Clarysse, Trudo; Eyben, Pierre; Duhayon, Natasja; Xu, Mingwei; Vandervorst, Wilfried (2003) -
Carrier spilling revisited: the on-bevel junction behavior of different electrical depth profiling techniques
Clarysse, Trudo; Eyben, Pierre; Duhayon, Natasja; Xu, Mingwei; Vandervorst, Wilfried (2001) -
Characterization of different tip materials for SCM
Duhayon, Natasja; Fouchier, Marc; Vandervorst, Wilfried; Hellemans, L. (2003) -
Characterization of vertical RESURF diodes using scanning probe microscopy
Duhayon, Natasja; Xu, Mingwei; Vandervorst, Wilfried; Hellemans, L.; Rochefort, Christelle; Van Dalen, Rob (2003) -
Characterization of vertical resurf diodes using scanning probe microsopy
Duhayon, Natasja; Xu, Mingwei; Alvarez, David; Eyben, Pierre; Vandervorst, Wilfried; Hellemans, L.; Rochefort, Christelle; Van Dalen, Rob (2002) -
Detailed study of scanning capacitance microscopy on cross- sectional and beveled junctions
Duhayon, Natasja; Clarysse, Trudo; Eyben, Pierre; Vandervorst, Wilfried; Hellemans, L. (2002) -
Fabrication of conductive AFM probes and their use in microelectronics
Fouchier, Marc; Alvarez, David; Eyben, Pierre; Duhayon, Natasja; Petry, Jasmine; Drijbooms, Chris (2003) -
Fabrication of conductive atomic force microscope probes and their evaluation for carrier mapping
Fouchier, Marc; Eyben, Pierre; Alvarez, David; Duhayon, Natasja; Xu, Mingwei; Brongersma, Sywert; Lisoni, Judit; Vandervorst, Wilfried (2003-05) -
Manufacturing of high aspect-ratio p-n junctions using vapor phase doping for application in multi-Resurf devices
Rochefort, Christelle; Van Dalen, Rob; Duhayon, Natasja; Vandervorst, Wilfried (2002) -
Nanometer scale carrier profiling with scanning probes
Vandervorst, Wilfried; Eyben, Pierre; Duhayon, Natasja; Hantschel, Thomas; Xu, Mingwei; Clarysse, Trudo (2001) -
Nanometer scale characterization of deep submicron devices
Vandervorst, Wilfried; Clarysse, Trudo; Duhayon, Natasja; Eyben, Pierre; Hantschel, Thomas; Trenkler, Thomas; Xu, Mingwei (2000)