Browsing by author "van Spengen, Merlijn"
Now showing items 1-20 of 26
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A comprehensive model to predict the charging and reliability of capacitive RF MEMS switches
van Spengen, Merlijn; Puers, Bob; Mertens, Robert; De Wolf, Ingrid (2004) -
A low frequency electrical test set-up for the reliability assessment of capacitive RF MEMS switches
De Wolf, Ingrid; van Spengen, Merlijn; Mertens, Robert; Puers, Robert (2003-05) -
A physical model to predict stiction in MEMS
van Spengen, Merlijn; Puers, Bob; De Wolf, Ingrid (2002) -
A reliable and compact polymer-based package for capacitive RF-MEMS switches
Oya, Y.; Okubora, A.; van Spengen, Merlijn; Soussan, Philippe; Stoukatch, Serguei; Rottenberg, Xavier; Ratchev, Petar; Tilmans, Harrie; De Raedt, Walter; Beyne, Eric; De Moor, Piet; De Wolf, Ingrid; Baert, Kris (2004-12) -
An auto-adhesion model for MEMS surfaces taking into account the effect of surface roughness
van Spengen, Merlijn; De Wolf, Ingrid; Puers, Bob (2000) -
Characterization and failure analysis of MEMS: high resolution optical investigation of small out-of-plane movements and fast vibrations
van Spengen, Merlijn; Puers, Bob; Mertens, Robert; De Wolf, Ingrid (2004) -
Experimental characterization of stiction due to charging in RF MEMS
van Spengen, Merlijn; Puers, Bob; Mertens, Robert; De Wolf, Ingrid (2002) -
Experimental one- and two-dimensional mechanical stress characterization of silicon microsystems using micro-Raman spectroscopy
van Spengen, Merlijn; De Wolf, Ingrid; Knechtel, R. (2000) -
Failure mechanisms in MEMS/NEMS devices
van Spengen, Merlijn; Modlinski, Robert; Puers, Robert; Jourdain, Anne (2007-10) -
High resolution stress and temperature measurements in semiconductor devices using micro-Raman spectroscopy
De Wolf, Ingrid; Chen, Jian; Rasras, Mahmoud; van Spengen, Merlijn; Simons, Veerle (1999) -
High-speed 3D optical imaging and failure analysis of high- and low-frequency movements in micro-electro-mechanical (MEMS) with nanometer resolution
van Spengen, Merlijn; De Wolf, Ingrid; Puers, Bob (2001) -
MEMS reliability from a failure mechanisms
van Spengen, Merlijn (2003) -
MEMS reliability. Stiction, charging, and RF MEMS
van Spengen, Merlijn (2004-05) -
Methodology to assess the reliability behavior of RF MEMS
Dubuc, D.; van Spengen, Merlijn; Melle, S.; De Wolf, Ingrid; Mertens, Robert; Pons, P.; Grenier, K.; Plana, R. (2004) -
On the physics of stiction and its impact on the reliability of microstructures
van Spengen, Merlijn; Puers, Bob; De Wolf, Ingrid (2003) -
Optical imaging of high-frequency resonances and semi-static deformations in micro-electromechanical systems (MEMS)
van Spengen, Merlijn; De Wolf, Ingrid; Puers, Bob; Vikhagen, E. (2001) -
Optical methods for the reliability and failure analysis of RF MEMS
van Spengen, Merlijn; De Wolf, Ingrid (2004) -
Reliability and failure analysis of microsystems
Pieters, Philip; Borzi, Raffaella; van Spengen, Merlijn; De Wolf, Ingrid (2004) -
Reliability and failure analysis of RF MEMS switches
De Wolf, Ingrid; van Spengen, Merlijn; Modlinski, Robert; Jourdain, Anne; Witvrouw, Ann; Fiorini, Paolo; Tilmans, Harrie (2002) -
Reliability of RF-MEMS
De Wolf, Ingrid; van Spengen, Merlijn; Rottenberg, Xavier; Carchon, Geert; Fiorini, Paolo; Jourdain, Anne; De Moor, Piet; Tilmans, Harrie (2003)