Browsing by author "Toledano Luque, Maria"
Now showing items 41-60 of 94
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Integration and electrical evaluation of Epi-Si and Epi-SiGe channels for 3D NAND memory applications
Capogreco, Elena; Degraeve, Robin; Lisoni, Judit; Luong, Vu; Arreghini, Antonio; Toledano Luque, Maria; Hikavyy, Andriy; Numata, Toshinori; De Meyer, Kristin; Van den Bosch, Geert; Van Houdt, Jan (2015) -
Laser thermal anneal of polysilicon channel to boost 3D memory performance
Lisoni, Judit; Arreghini, Antonio; Congedo, Gabriele; Toledano Luque, Maria; Toqué-Trésonne, Inès; Huet, Karim; Capogreco, Elena; Liu, Lifang; Tan, Chi Lim; Degraeve, Robin; Van den Bosch, Geert; Van Houdt, Jan (2014) -
Maximizing reliable performance of CMOS applications–A comprehensive study of FPGA pass gates
Kaczer, Ben; Chen, Chris; Weckx, Pieter; Roussel, Philippe; Toledano Luque, Maria; Franco, Jacopo; Cho, Moon Ju; Watt, Jeff; Chanda, Kaushik; Groeseneken, Guido; Grasser, Tibor (2014) -
Multiphonon processes as the origin of reliability issues
Goes, Wolfgang; Toledano Luque, Maria; Schanovsky, F.; Bina, M.; Baumgartner, O.; Kaczer, Ben; Grasser, Tibor (2013) -
NBTI reliability of SiGe and Ge channel pMOSFETs with SiO2/HfO2 dielectric stack
Franco, Jacopo; Kaczer, Ben; Mitard, Jerome; Toledano Luque, Maria; Roussel, Philippe; Witters, Liesbeth; Grasser, Tibor; Groeseneken, Guido (2013) -
On the frequency dependence of the bias temperature instability
Grasser, Tibor; Kaczer, Ben; Reisinger, Hans; Wagner, Paul-Jurgen; Toledano Luque, Maria (2012) -
On the impact of the Si passivation layer thickness on the NBTI of nanoscaled Si0.45Ge0.55 pMOSFETs
Franco, Jacopo; Kaczer, Ben; Toledano Luque, Maria; Roussel, Philippe; Hehenberger, Philip; Grasser, Tibor; Mitard, Jerome; Eneman, Geert; Witters, Liesbeth; Hoffmann, Thomas Y.; Groeseneken, Guido (2011) -
On the microscopic origin of the frequency dependence of hole trapping in pMOSFETs
Grasser, Tibor; Reisinger, Hans; Rott, Karina; Toledano Luque, Maria; Kaczer, Ben (2012-12) -
Optimization of inter-gate-dielectrics in hybrid float gate devices to reduce window instability during memory operations
Tang, Baojun; Zhang, Weidong; Breuil, Laurent; Robinson, Colin; Wang, Yunqi; Toledano Luque, Maria; Van den Bosch, Geert; Zhang, Jianfu; Van Houdt, Jan (2014) -
Optimization of the crystallization phase of rare-earth aluminates for blocking dielectric application in TANOS type Flash memories
Breuil, Laurent; Adelmann, Christoph; Van den Bosch, Geert; Cacciato, Antonio; Zahid, Mohammed; Toledano Luque, Maria; Suhane, Amit; Arreghini, Antonio; Degraeve, Robin; Van Elshocht, Sven; Debusschere, Ingrid; Kittl, Jorge; Jurczak, Gosia; Van Houdt, Jan (2010) -
Probabilistic defect occupancy model for NBTI
Martin-Martinez, Javier; Kaczer, Ben; Toledano Luque, Maria; Rodriguez, Rosana; Nafria, Monserat; Aymerich, X.; Groeseneken, Guido (2011-04) -
Quantitative and predictive model of reading current variability in deeply scaled vertical poly-Si channel for 3D memories
Toledano Luque, Maria; Degraeve, Robin; Kaczer, Ben; Tang, B.; Roussel, Philippe; Weckx, Pieter; Franco, Jacopo; Arreghini, Antonio; Suhane, Amit; Kar, Gouri Sankar; Van den Bosch, Geert; Groeseneken, Guido; Van Houdt, Jan (2012) -
Read and pass disturbance in the programmed states of floating gate Flash memory cells with high- $j inter-poly gate dielectric stacks
Tang, Baojun; Robinson, Colin; Zhang, Weidong; Zhang, Fujian; Degraeve, Robin; Blomme, Pieter; Toledano Luque, Maria; Van den Bosch, Geert; Govoreanu, Bogdan; Van Houdt, Jan (2013-07) -
Recent trends in bias temperature instability
Kaczer, Ben; Grasser, Tibor; Franco, Jacopo; Toledano Luque, Maria; Roussel, Philippe; Cho, Moon Ju; Simoen, Eddy; Groeseneken, Guido (2010-06) -
Recent trends in CMOS reliability: from individual traps to circuit simulations
Kaczer, Ben; Toledano Luque, Maria; Franco, Jacopo; Grasser, Tibor; Roussel, Philippe; Camargo, Vinicius V. A.; Mahato, Swaraj; Simoen, Eddy; Wirth, Gilson I.; Groeseneken, Guido (2011) -
Recent trends in CMOS reliability: from individual traps to circuit simulations
Kaczer, Ben; Toledano Luque, Maria; Franco, Jacopo; Grasser, Tibor; Roussel, Philippe; Camargo, V. V. A.; Mahato, S.; Simoen, Eddy; Catthoor, Francky; Wirth, G. I.; Groeseneken, Guido (2012) -
Recent trends in the electrical characterization and reliability assessment of CMOS devices
Groeseneken, Guido; Degraeve, Robin; Cho, Moon Ju; Franco, Jacopo; Kaczer, Ben; Martens, Koen; Roussel, Philippe; Toledano Luque, Maria (2012) -
Reduction of the BTI time-dependent variability in nanoscaled MOSFETs by body bias
Franco, Jacopo; Kaczer, Ben; Toledano Luque, Maria; Roussel, Philippe; Groeseneken, Guido; Schwarz, Benedikt; Bina, Markus; Waltl, Michael; Wagner, Paul-Juergen; Grasser, Tibor (2013) -
Relevance of non-exponential single-defect-induced threshold voltage shifts for NBTI Variability
Franco, Jacopo; Kaczer, Ben; Roussel, Philippe; Toledano Luque, Maria; Weckx, Pieter; Grasser, Tibor (2013) -
Reliability and performance considerations for NMOSFET pass gates in FPGA applications
Kaczer, Ben; Chen, Chris; Watt, Jeff; Chanda, Kaushik; Weckx, Pieter; Toledano Luque, Maria; Groeseneken, Guido; Grasser, Tibor (2013)