Browsing by author "De Coster, Walter"
Now showing items 1-19 of 19
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A fundamental multitechnique of SIMS depth profiling
Vandervorst, Wilfried; Brijs, Bert; Bender, Hugo; Alay, Josep Lluis; De Coster, Walter (1994) -
Altered layer formation in SiGe
De Coster, Walter; Brijs, Bert; Vandervorst, Wilfried (1997) -
An ESCA study on ion beam induced oxidation of Si
Osiceanu, Petre; Alay, Josep Lluis; De Coster, Walter (1995) -
ARIBA, An All Round Ion Beam Acquisition Program
Brijs, Bert; De Coster, Walter; Deleu, Jeroen; Vandervorst, Wilfried; Wils, D.; Vandesteene, N. (1994) -
ARIBA, an all round ion beam acquisition program
Brijs, Bert; Deleu, Jeroen; De Coster, Walter; Wills, D.; Vandervorst, Wilfried (1997) -
Depth profiling with oxygen beams
Vandervorst, Wilfried; Alay, Josep Lluis; Brijs, Bert; De Coster, Walter; Elst, Kathy (1994) -
HREM characterization of oxygen ion beam sputtered epitaxial CoSi2
Bender, Hugo; De Coster, Walter; Brijs, Bert; Alay, Josep Lluis; Vandervorst, Wilfried (1994) -
In situ observation by RBS of oxygen gettering during Cs sputtering of Si-based materials
De Coster, Walter; Brijs, Bert; Deleu, Jeroen; Alay, Josep Lluis; Vandervorst, Wilfried (1996) -
In Situ Observation by RBS of Preferential Sputtering During Low Energy Ion Bombardment
De Coster, Walter; Brijs, Bert; Vandervorst, Wilfried (1994) -
In situ observation of compound formation and ion beam mixing
De Coster, Walter; Brijs, Bert; Elst, Kathy; Vandervorst, Wilfried (1994) -
Ion Beam Induced Modification of Si-Based Material during Sputter Profiling
De Coster, Walter (1995-01) -
Ion beam mixing and oxidation of a Si/Ge-multilayer under oxygen bombardment
De Coster, Walter; Brijs, Bert; Osiceanu, Petre; Alay, Josep Lluis; Caymax, Matty; Vandervorst, Wilfried (1994) -
RBS Analysis of Artefacts Induced by Low Energy Ion Sputtering
Brijs, Bert; De Coster, Walter; Bender, Hugo; Storm, Wolfgang; Osiceanu, Petre; Vandervorst, Wilfried (1994) -
RBS, AES and XPS analysis of ion beam induced nitridation of Si and SiGe alloys
De Coster, Walter; Brijs, Bert; Bender, Hugo; Alay, Josep Lluis; Vandervorst, Wilfried (1994) -
Sputtering Phenomena of CoSi2 and TiSi2 under Low Energy Oxygen Bombardment
Brijs, Bert; De Coster, Walter; Vandervorst, Wilfried (1994) -
Sputtering phenomena of CoSi2 under low energy oxygen bombardment
Brijs, Bert; De Coster, Walter; Bender, Hugo; Alay, Josep Lluis; Osiceanu, Petre; Vandervorst, Wilfried (1994) -
Stoichiometric changes of Si, CoSi2 and TiSi2 during low energy oxygen bombardment in combination with oxygen bleed-in
Brijs, Bert; Deleu, Jeroen; Storm, Wolfgang; De Coster, Walter; Vandervorst, Wilfried (1996) -
Stoichiometry changes during low energy oxygen bombardment
Brijs, Bert; De Coster, Walter; Bender, Hugo; Storm, Wolfgang; Osiceanu, Petre; Vandervorst, Wilfried (1995) -
The behaviour of Si and CoSi2 during low energy nitrogen bombardment, with and without O-2 flooding
Deleu, Jeroen; Brijs, Bert; Storm, Wolfgang; Vandervorst, Wilfried; De Coster, Walter (1996)