Browsing by author "De Wachter, Bart"
Now showing items 1-20 of 46
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21 nm Pitch dual-damascene BEOL process integration with full barrierless Ru metallization
Vega Gonzalez, Victor; Wilson, Chris; Paolillo, Sara; Decoster, Stefan; Mao, Ming; Versluijs, Janko; Blanco, Victor; Kesters, Els; Le, Quoc Toan; Lorant, Christophe; Varela Pedreira, Olalla; Lesniewska, Alicja; Heylen, Nancy; El-Mekki, Zaid; van der Veen, Marleen; Webers, Tomas; Vats, Hemant; Rynders, Luc; Cupak, Miroslav; Lee, Jae Uk; Drissi, Youssef; Halipre, Luc; Charley, Anne-Laure; Verdonck, Patrick; Witters, Thomas; Van Gompel, Sander; Kimura, Yosuke; Jourdan, Nicolas; Ciofi, Ivan; Contino, Antonino; Boccardi, Guillaume; Lariviere, Stephane; De Wachter, Bart; Vancoille, Eric; Lazzarino, Frederic; Ercken, Monique; Kim, Ryan Ryoung han; Trivkovic, Darko; Croes, Kristof; Leray, Philippe; Pardons, Katrien; Barla, Kathy; Tokei, Zsolt (2019) -
3D chip package interaction thermo-mechanical challenges: proximity effects of through silicon vias and μ-bumps
Guo, Wei; Van der Plas, Geert; Ivankovic, Andrej; Eneman, Geert; Cherman, Vladimir; De Wachter, Bart; Mercha, Abdelkarim; Gonzalez, Mario; Civale, Yann; Redolfi, Augusto; Buisson, Thibault; Jourdain, Anne; Vandevelde, Bart; Rebibis, Kenneth June; De Wolf, Ingrid; La Manna, Antonio; Beyer, Gerald; Beyne, Eric; Swinnen, Bart (2012) -
3D stacked IC demonstration using a through silicon via first approach
Van Olmen, Jan; Mercha, Abdelkarim; Katti, Guruprasad; Huyghebaert, Cedric; Van Aelst, Joke; Seppala, Emma; Zhao, Chao; Armini, Silvia; Vaes, Jan; Cotrin Teixeira, Ricardo; Van Cauwenberghe, Marc; Verdonck, Patrick; Verhemeldonck, Koen; Jourdain, Anne; Ruythooren, Wouter; de Potter de ten Broeck, Muriel; Opdebeeck, Ann; Chiarella, Thomas; Parvais, Bertrand; Debusschere, Ingrid; Hoffmann, Thomas Y.; De Wachter, Bart; Dehaene, Wim; Stucchi, Michele; Rakowski, Michal; Soussan, Philippe; Cartuyvels, Rudi; Beyne, Eric; Biesemans, Serge; Swinnen, Bart (2008) -
A 3D-DfT demonstrator
Marinissen, Erik Jan; De Wachter, Bart; O'Loughlin, Stephen; Deutsch, Sergej; Papameletis, Christos; Burgherr, Tobias (2014-05) -
A 3D-DfT demonstrator
Marinissen, Erik Jan; De Wachter, Bart; O'Loughlin, Stephen; Deutsch, Sergej; Papameletis, Christos; Burgherr, Tobias (2014-06) -
A full-automatic test system for characterizing wide-I/O micro-bump probe cards
Marinissen, Erik Jan; Fodor, Ferenc; De Wachter, Bart; Kiesewetter, Joerg; Hill, Eric; Smith, Ken (2017-06) -
A fully automatic test system for characterizing large-array fine-pitch micro-bump probe cards
Marinissen, Erik Jan; Fodor, Ferenc; De Wachter, Bart; Kiesewetter, Joerg; Hill, Eric; Smith, Ken (2017-09) -
A low-voltage biasing scheme for aggressively scaled bulk FinFET 1T-DRAM featuring 10s retention at 85°C
Collaert, Nadine; Aoulaiche, Marc; De Wachter, Bart; Rakowski, Michal; Redolfi, Augusto; Brus, Stephan; De Keersgieter, An; Horiguchi, Naoto; Altimime, Laith; Jurczak, Gosia (2010) -
A novel low-voltage biasing scheme for double gate FBC achieving 5s retention and 10^16 endurance at 85°C
Lu, Zhichao; Collaert, Nadine; Aoulaiche, Marc; De Wachter, Bart; De Keersgieter, An; Schwarzenbach, W.; Bonnin, O.; Bourdelle, K.K.; Nguyen, B.-Y.; Mazure, C.; Altimime, Laith; Jurczak, Gosia (2010) -
Analysis of sense margin and reliability of 1T-DRAM fabricated on thin-film UTBOX substrates
Collaert, Nadine; Aoulaiche, Marc; Rakowski, Michal; De Wachter, Bart; Bourdelle, K.; Nguyen, B.-Y.; Boedt, F.; Delprat, D.; Jurczak, Gosia (2009) -
Automated testing of bare die-to-die stacks
Marinissen, Erik Jan; De Wachter, Bart; Wang, Teng; Fiedler, Jens; Kiesewetter, Joerg; Stoll, Karsten (2015-10) -
Automated testing of bare die-to-die stacks
Marinissen, Erik Jan; De Wachter, Bart; Wang, Teng; Fiedler, Jens; Kiesewetter, Joerg; Stoll, Karsten (2015-07) -
Automated testing of bare die-to-die stacks
Marinissen, Erik Jan; De Wachter, Bart; Wang, Teng; Fiedler, Jens; Kiesewetter, Joerg; Stoll, Karsten (2015-05) -
Automated testing of singulated die-to-die stacks
Thiele, Frank; Marinissen, Erik Jan; De Wachter, Bart; Wang, Teng; Fiedler, Jens; Kiesewetter, Joerg; Stoll, Karsten (2015-09) -
BJT mode endurance on a 1T-RAM bulk FinFET device
Aoulaiche, Marc; Collaert, Nadine; Degraeve, Robin; Lu, Zhichao; De Wachter, Bart; Jurczak, Gosia; Altimime, Laith (2010) -
Buried Power Rail Metal exploration towards the 1 nm Node
Gupta, Anshul; Radisic, Dunja; Maes, J.W.; Varela Pedreira, Olalla; Soulie, Jean-Philippe; Jourdan, Nicolas; Mertens, Hans; Bandyopadhyay, Sudip; Le, Quoc Toan; Pacco, Antoine; Heylen, Nancy; Vandersmissen, Kevin; Devriendt, Katia; Zhu, C.; Datta, S.; Sebaai, Farid; Wang, S.; Mousa, M.; Lee, J.; Geypen, Jef; De Wachter, Bart; Chehab, Bilal; Salahuddin, Shairfe Muhammad; Murdoch, Gayle; Biesemans, Serge; Tokei, Zsolt; Dentoni Litta, Eugenio; Horiguchi, Naoto (2021) -
Circuit design for bas compatibility in novel FinFET-based floating body RAM
Poliakov, Pavel; Anchlia, Ankur; Garcia Bardon, Marie; Rooseleer, Bram; De Wachter, Bart; Collaert, Nadine; van der Zanden, Koen; Dehaene, Wim; Verkest, Diederik; Miranda Corbalan, Miguel (2010) -
Circuit design for bias compatibility investigation of bulk FinFET based floating body RAM
Anchlia, Ankur; Garcia Bardon, Marie; Poliakov, Pavel; Rooseleer, Bram; De Wachter, Bart; Collaert, Nadine; van der Zanden, Koen; Miranda Corbalan, Miguel; Dehaene, Wim; Verkest, Diederik (2009) -
Copper through silicon via induced keep out zone for 10nm node bulk FinFET CMOS technology
Guo, Wei; Moroz, Victor; Van der Plas, Geert; Choi, M.; Redolfi, Augusto; Smith, L.; Eneman, Geert; Van Huylenbroeck, Stefaan; Su, P.D.; Ivankovic, Andrej; De Wachter, Bart; Debusschere, Ingrid; Croes, Kris; De Wolf, Ingrid; Mercha, Abdelkarim; Beyer, Gerald; Swinnen, Bart; Beyne, Eric (2013) -
Design issues and cosiderations for low-cost 3D TSV IC technology
Van der Plas, Geert; Limaye, Paresh; Mercha, Abdelkarim; Oprins, Herman; Torregiani, Cristina; Thijs, Steven; Linten, Dimitri; Stucchi, Michele; Guruprasad, Katti; Velenis, Dimitrios; Shinichi, Domae; Cherman, Vladimir; Vandevelde, Bart; Simons, Veerle; De Wolf, Ingrid; Labie, Riet; Perry, Dan; Bronckers, Stephane; Minas, Nikolaos; Cupak, Miroslav; Ruythooren, Wouter; Van Olmen, Jan; Phommahaxay, Alain; de Potter de ten Broeck, Muriel; Opdebeeck, Ann; Rakowski, Michal; De Wachter, Bart; Dehan, Morin; Nelis, Marc; Agarwal, Rahul; Dehaene, Wim; Travaly, Youssef; Marchal, Pol; Beyne, Eric (2010)