Browsing by author "Dictus, Dries"
Now showing items 1-20 of 24
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Cobalt bottom-up contact and via prefill enabling advanced logic and DRAM technologies
van der Veen, Marleen; Vandersmissen, Kevin; Dictus, Dries; Demuynck, Steven; Liu, Ran; Bin, Xiaomin; Nalla, Praveen; Lesniewska, Alicja; Hall, Laurie; Croes, Kristof; Zhao, Larry; Boemmels, Juergen; Kolics, Artur; Tokei, Zsolt (2015) -
Cobalt UBM for fine pitch microbump applications in 3DIC
Derakhshandeh, Jaber; De Preter, Inge; Vandersmissen, Kevin; Dictus, Dries; Di Piazza, Luca; Hou, Lin; Guerrieri, Stefano; Vakanas, George; Armini, Silvia; Daily, Robert; Lesniewska, Alicja; Vandelaer, Yannick; Van De Peer, Myriam; Slabbekoorn, John; Rebibis, Kenneth June; Miller, Andy; Beyer, Gerald; Beyne, Eric (2015) -
Conformal Cu electroless seed on Co and Ru liners enables Cu fill by plating for advanced interconnects
van der Veen, Marleen; Inoue, Fumihiro; Vandersmissen, Kevin; Dictus, Dries; Tanaka, Tetsu; Boemmels, Juergen; Struyf, Herbert; Tokei, Zsolt (2016) -
Demonstration of a cost effective Cu electroless TSV metallization scheme
Vandersmissen, Kevin; Inoue, Fumihiro; Velenis, Dimitrios; Li, Yunlong; Dictus, Dries; Frees, Bart; Van Huylenbroeck, Stefaan; Kondo, M.; Seino, T.; Heylen, Nancy; Struyf, Herbert; van der Veen, Marleen (2015) -
Development of a new metallization scheme for making nanoscale interconnects based on plasma-functionalization and electroless deposition
Dictus, Dries; Dordi, Y.; Gurer, E.; Krishtab, Mikhail; Baklanov, Mikhaïl; Carbonell, Laure; van der Veen, Marleen; El-Mekki, Zaid; Tokei, Zsolt (2013) -
Doped Ru to enable next generation barrier-less interconnect
Joi, A.; Lesniewska, Alicja; Dictus, Dries; Tso, K. C.; Venkatraman, K.; Dordi, J.; Croes, Kristof; Tokei, Zsolt; Yadav, S. K.; Wu, P. W. (2022) -
ELD NiB for microbumps passivation and wirebonding
Derakhshandeh, Jaber; De Preter, Inge; El-Mekki, Zaid; Hou, Lin; Gerets, Carine; Dictus, Dries; Vanstreels, Kris; Croes, Kristof; Miller, Andy; Beyer, Gerald; Beyne, Eric (2020) -
Electromigration and thermal storage study of barrierless Co vias
Varela Pedreira, Olalla; Croes, Kristof; Zahedmanesh, Houman; Vandersmissen, Kevin; van der Veen, Marleen; Vega Gonzalez, Victor; Dictus, Dries; Zhao, Larry; Kolics, Artur; Tokei, Zsolt (2018) -
Electromigration-driven void nucleation and growth in 30nm wide Cu line: Metal cap impact on interfacial Cu diffusion
Kirimura, Tomoyuki; Croes, Kristof; Siew, Yong Kong; Vanstreels, Kris; Czarnecki, Piotr; El-Mekki, Zaid; van der Veen, Marleen; Dictus, Dries; Yoon, A.; Kolics, A.; Boemmels, Juergen; Tokei, Zsolt (2013) -
Enabling sub 20nm Cu metallization with PEALD Ru-TiN barrier and ELD seed
Siew, Yong Kong; Swerts, Johan; Dictus, Dries; El-Mekki, Zaid; Armini, Silvia; Dordi, Yezdi; Yoon, Alex; Kolics, Artur; Barbarin, Yohan; Croes, Kristof; Boemmels, Juergen; Tokei, Zsolt (2012) -
Foton geïnduceerd etsen van koper en vorming van koper nanodraden
Dictus, Dries; De Gendt, Stefan; Vinckier, Chris; Boullart, Werner; Vanhaelemeersch, Serge (2008) -
Growth of copper and copper compound nanowires
Dictus, Dries; Shamiryan, Denis; Paraschiv, Vasile; Boullart, Werner; De Gendt, Stefan; Baklanov, Mikhaïl; Vinckier, Chris; Vanhaelemeersch, Serge (2008) -
Impact of metal etch residues on etch species density and uniformity
Dictus, Dries; Shamiryan, Denis; Paraschiv, Vasile; Boullart, Werner; De Gendt, Stefan; Vinckier, Chris (2010) -
Influence of TiN microstructure on its dry etch behavior
Dictus, Dries (2007-03) -
New properties of halogen plasma-treated Cu films
Pikulev, Vitaly; Dictus, Dries; Klekachev, Alexander; Baklanov, Mikhaïl (2008) -
New properties of halogen plasma-treated Cu films
Pikulev, V.; Dictus, Dries; Loginova, S.; Baklanov, Mikhaïl (2009) -
NiB Capping of Cu landing pads for thermocompression bonding
England, Luke; Dictus, Dries; De Vos, Joeri; Conard, Thierry; Daily, Robert; Marinissen, Erik Jan (2014) -
Photon induced low temperature etching of copper and/or formation of copper nanowires
Dictus, Dries; Shamiryan, Denis; Paraschiv, Vasile; Boullart, Werner; Baklanov, Michail; De Gendt, Stefan; Vinckier, Chris; Vanhaelemeersch, Serge (2008) -
Plasma etch chamber wall deposits – impact on etch species density and evaluation of cleaning procedures
Dictus, Dries; Shamiryan, Denis; Paraschiv, Vasile; Baklanov, Mikhaïl; Boullart, Werner; De Gendt, Stefan; Vinckier, Chris (2009) -
Selective wet removal of the SiN contact etch stop layer prior to S/D contact formation
Pacco, Antoine; Holsteyns, Frank; Schaekers, Marc; Everaert, Jean-Luc; Dictus, Dries; Cuypers, Daniel (2018)