Browsing by author "Pace, C."
Now showing items 1-12 of 12
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1/f Noise in drain and gate current of MOSFETs with high-k gate stacks
Magnone, P.; Crupi, F.; Giusi, G.; Pace, C.; Simoen, Eddy; Claeys, Cor; Pantisano, Luigi; Maji, D.; Rao, V.R.; Srinivasan, P. (2009) -
A model for MOS gate stack quality evaluation based on the gate current 1/f noise
Magnone, P.; Crupi, F.; Iannacone, G.; Giusi, G.; Pace, C.; Simoen, Eddy; Claeys, Cor (2008) -
Analytical model for the 1/f noise in the tunneling current through metal-oxide-semiconductor structures
Crupi, F.; Giusi, G.; Iannacone, G.; Magnone, P.; Pace, C.; Simoen, Eddy; Claeys, Cor (2009) -
Characterization of interface and oxide traps in Ge pMOSFETs based on DCIV technique
Maji, D.; Crupi, F.; Magnone, P.; Giusi, G.; Pace, C.; Simoen, Eddy; Rao, V.Ramgopal (2009) -
Interfacial layer quality effects on low-frequency noise (1/f) in p-MOSFETs with advanced gate stacks
Srinivasan, Purushothaman; Crupi, F.; Simoen, Eddy; Magnone, P.; Pace, C.; Misra, D.; Claeys, Cor (2007) -
Matching performance of FinFET devices with fin widths down to 10nm
Magnone, Paolo; Mercha, Abdelkarim; Subramanian, Vaidy; Parvais, Bertrand; Collaert, Nadine; Dehan, Morin; Decoutere, Stefaan; Groeseneken, Guido; Benson, Jim; Merelle, Thomas; Lander, Rob; Crupi, Felice; Pace, C. (2009) -
Modeling the gate current 1/f noise and its application to advanced CMOS devices
Crupi, F.; Magnone, P.; Iannacone, G.; Giusi, G.; Pace, C.; Simoen, Eddy; Claeys, Cor (2008) -
On the dc and noise properties of the gate current in epitaxial Ge p-channel metal oxide semiconductor field effect transistors with TiN/TaN/HfO2/SiO2 gate stack
Maji, D.; Crupi, F.; Giusi, G.; Pace, C.; Simoen, Eddy; Claeys, Cor; Rao, V.R. (2008) -
Positive bias temperature instability in nMOSFETs with ultra-thin Hf-silicate gate dielectrics
Crupi, Felice; Pace, C.; Cocorullo, G.; Groeseneken, Guido; Aoulaiche, Marc; Houssa, Michel (2005-06) -
The role of the interfaces in the 1/f noise of MOSFETs with high-k gate stacks
Crupi, F.; Magnone, P.; Simoen, Eddy; Pantisano, Luigi; Giusi, G.; Pace, C.; Claeys, Cor (2009) -
The role of the interfaces in the 1/f noise of MOSFETs with high-k gate stacks
Crupi, F.; Magnone, P.; Simoen, Eddy; Mercha, Abdelkarim; Pantisano, Luigi; Giusi, G.; Pace, C.; Claeys, Cor (2009) -
Understanding and optimization of hot-carrier reliability in germanium-on-silicon pMOSFETs
Maji, D.; Crupi, Felice; Amat, E.; Simoen, Eddy; De Jaeger, Brice; Brunco, David; Manoj, C.R.; Ramgopal Rao, V.; Magnone, P.; Giusi, G.; Pace, C.; Pantisano, Luigi; Mitard, Jerome; Rodríguez, R.; Nafría, M. (2009)