Browsing by author "Takakura, K."
Now showing items 1-20 of 78
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A model for the radiation degradation of polycrystalline silicon films
Ohyama, H.; Nakabayashi, M.; Takakura, K.; Simoen, Eddy; Takami, Y.; Claeys, Cor (2002) -
A study on radiation damage of IGBTs by 2-MeV electrons at different irradiation temperatures
Nakabayashi, M.; Ohyama, H.; Hanano, N.; Kamiya, T.; Hirao, T.; Takakura, K.; Simoen, Eddy; Claeys, Cor (2004) -
Body potential analysis of ultra thin gate oxide FD-SOI MOSFETs in accumulation mode operation
Hayama, K.; Takakura, K.; Ohyama, H.; Rafi, J.M.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2005) -
Carrier lifetime analysis in thin gate oxide FD-SOI n-MOSFETs by gate-induced drain current tranients
Hayama, K.; Takakura, K.; Ohyama, H.; Rafi, J.M.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2008) -
Carrier lifetime evaluation of electron irradiated SiGe/Si diode
Idemoto, T.; Ohyama, H.; Takakura, K.; Tsunoda, I.; Yoneoka, M.; Nakashima, T.; Bargallo Gonzalez, Mireia; Simoen, Eddy; Claeys, Cor (2010) -
Comparison of electron irradiation effect on thermal donors in Cz and oxygen doped FZ silicon
Takakura, K.; Ohyama, H.; Yoshida, T.; Murakawa, H.; Rafi, Joan Marc; Job, R.; Ulyashin, A.; Simoen, Eddy; Claeys, Cor (2003) -
Comparison of electron irradiation effects on diodes fabricated on silicon and on germanium doped silicon substrates
Ohyama, H.; Rafi, J.M.; Campabadal, F.; Takakura, K.; Simoen, Eddy; Chen, J.; Vanhellemont, J. (2009) -
Damage coefficient in high-temperature particle- and gamma-irradiated silicon p-i-n diodes
Ohyama, H.; Takakura, K.; Hayama, K.; Kuboyama, S.; Deguchi, Y.; Matsuda, S.; Simoen, Eddy; Claeys, Cor (2003) -
Degradation and their recovery behavior of irradiated GaAlAs LEDs
Ohyama, H.; Takakura, K.; Nagano, T.; Hanada, M.; Kuboyama, S.; Simoen, Eddy; Claeys, Cor (2008) -
Degradation behaviors for high temperature irradiated NPN Si transistors
Ohyama, H.; Takakura, K.; Nishiyama, K.; Simoen, Eddy; Claeys, Cor (2002) -
Degradation of drain current hysteresis in electron-irradiated FD-SOI MOSFETs in accumulation mode operation
Hayama, K.; Takakura, K.; Ohyama, H.; Rafi, J.M.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2005) -
Degradation of electrical performance and floating body effect in ultra thin gate oxide FD-SOI n-MOSFETs by 7.5-MeV proton irradiation
Hayama, K.; Takakura, K.; Ohyama, H.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor; Rafi, J.M.; Kokkoris, M. (2004) -
Degradation of SiC-MESFETs by irradiation
Ohyama, H.; Takakura, K.; Uemura, K.; Shigaki, K.; Kudou, T.; Matsumoto, T.; Arai, M.; Kuboyama, S.; Kamezawa, C.; Simoen, Eddy; Claeys, Cor (2008) -
Degradation of the electrical performance and floating body effects in thin gate oxide PD-SOI MOSFETs by 2-MeV electron irradiation
Matsuyama, K.; Hayama, K.; Takakura, K.; Yoneoka, M.; Ohyama, H.; Rafi, J.M.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2005) -
Degradation of the electrical performance and floating body efffects in ultra thin gate oxide FD-SOI nMOSFETs by 2-MeV electron irradiation
Hayama, K.; Rafi, J.M.; Takakura, K.; Ohyama, H.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor; Kuboyama, S.; Oka, K.; Matsuda, S. (2004) -
Device performance of 90nm nMOSFETs at liquid nitrogen temperature
Takakura, K.; Hayama, K.; Ohyama, H.; Mercha, Abdelkarim; Lee, Shih-Chung; Simoen, Eddy; Claeys, Cor (2004) -
Difference of 2-MeV electron-irradiation-induced performance degradation in FD-SOI MOSFETs fabricated on ELTRAN and UNIBOND wafers
Hayama, K.; Takakura, K.; Ohyama, H.; Rafi, J.M.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2005) -
Dose rate dependence of radiation-induced lattice defects and performance degradation in npn Si bipolar transistors by 2-MeV electron irradiation
Hayama, K.; Takakura, K.; Ohyama, H.; Kuboyama, S.; Simoen, Eddy; Mercha, Abdelkarim; Claeys, Cor (2007) -
Dose rate dependence of the back gate degradation in thin gate oxide PD-SOI MOSFETs by 2-MeV electron irradiation
Hayama, K.; Takakura, K.; Yoneoka, M.; Ohyama, H.; Rafi, J.M.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2007) -
Effect of electron irradiation on thermal donors in oxygen-doped high-resistivity FZ Si
Takakura, K.; Ohyama, H.; Yoshida, T.; Murakawa, H.; Rafi, Joan Marc; Job, R.; Ulyashin, A.; Simoen, Eddy; Claeys, Cor (2004)