Browsing by author "Clauws, P."
Now showing items 1-20 of 70
-
A BEEM study of PtSi Schottky contacts on ion-milled Si
Ru, Guo-Ping; Detavernier, C.; Alves Donaton, Ricardo; Blondeel, A.; Clauws, P.; Van Meirhaeghe, R. L.; Cardon, F.; Maex, Karen; Qu, X. P.; Zhu, S. Y.; Li, Bing-Zong (1999) -
A DLTS study on plasma-hydrogenated n-type high-resistivity MCz silicon
Huang, J.L.; Simoen, Eddy; Claeys, Cor; Rafi, J.M.; Clauws, P. (2007) -
A novel approach to analyse FTIR spectra of precipitates in moderately and heavily doped silicon
De Gryse, O.; Vanhellemont, J.; Clauws, P.; Lebedev, O.; Van Landuyt, J.; Simoen, Eddy; Claeys, Cor (2003) -
A study of electrically active defects created in p-InP by CH4:H2 reactive ion etching
Goubert, L.; Van Meirhaeghe, R. L.; Clauws, P.; Cardon, F.; Van Daele, Peter (1997) -
Analysis of oxygen thermal donor formation in n-type CZ silicon
Rafi, Joan Marc; Simoen, Eddy; Claeys, Cor; Ulyashin, A.G.; Job, R.; Fahrner, W.R.; Versluys, J.; Clauws, P.; Lozano, M.; Campabadal, F. (2003) -
Atomic layer deposition of ZnO thin films on boron-doped nanocrystalline diamond
Hikavyy, Andriy; Clauws, P.; Vanbesien, K.; De Visschere, P.; Williams, Oliver; Daenen, M.; Haenen, Ken; Butler, J.E.; Feygelson, T. (2007) -
Carrier lifetime dependence on doping, metal implants and excitation density in Ge and Si
Gaubas, E.; Vanhellemont, J.; Simoen, Eddy; Romandic, I.; Geens, W.; Clauws, P. (2007) -
Characterisation of oxygen and oxygen-related defects in highly- and lowly-doped silicon
Simoen, Eddy; Claeys, Cor; Loo, Roger; De Gryse, O.; Clauws, P.; Job, R.; Ulyashin, A.G.; Fahrner, W. (2003) -
Characterization of oxide precipitates in heavily boron doped silicon by infrared spectroscopy
De Gryse, O.; Clauws, P.; Vanhellemont, Jan; Lebedev, O.I.; Van Landuyt, J.; Simoen, Eddy; Claeys, Cor (2004) -
Chemical and structural characterization of oxide precipitates in heavily boron doped silicon by infrared spectroscopy and transmission electron microscopy
De Gryse, O.; Clauws, P.; Vanhellemont, J.; Lebedev, O.; Van Landuyt, J.; Simoen, Eddy; Claeys, Cor (2002) -
Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM
De Gryse, O.; Clauws, P.; Lebedev, O.; Van Landuyt, J.; Vanhellemont, Jan; Claeys, C.; Simoen, Eddy (2001) -
Combined electrical and spectroscopic investigation of thermal donor formation in plasma-hydrigenated n-type czochralski silicon
Rafi, Joan Marc; Simoen, Eddy; Claeys, Cor; Ulyashin, Aliaksandr; Huang, Y.L.; Job, R.; Lauwaert, J.; Clauws, P. (2004) -
Deep level transient spectroacopy of transition metal impurities in germanium
Clauws, P.; Van Gheluwe, J.; Lauwaert, J.; Simoen, Eddy; Vanhellemont, J.; Meuris, Marc; Theuwis, A. (2007) -
Deep levels in high-energy proton-irradiated tin-doped n-type Czochralskii silicon
Simoen, Eddy; Claeys, Cor; Neimash, V. B.; Kraitchinskii, A.; Kras'ko, N.; Puzenko, O.; Blondeel, A.; Clauws, P. (2000) -
Deep levels in high-temperature 1 MeV electron irradiated n-type czochralski silicon
Simoen, Eddy; Rafi, Joan Marc; Claeys, Cor; Neimash, V.; Kraitchinski, A.; Kras'ko, M.; Tischenko, V.; Voitovych, V.; Versluys, J.; Clauws, P. (2003) -
Deep levels in oxygenated n-type high-resistivity FZ silicon before and after a low-temperature hydrogenation step
Simoen, Eddy; Claeys, Cor; Job, R.; Ulyashin, A.G.; Fahrner, W.R.; Tonelli, G.; De Gryse, O.; Clauws, P. (2003) -
Defect analysis of n-type silicon strained layers
Simoen, Eddy; Loo, Roger; Roussel, Philippe; Caymax, Matty; Bender, Hugo; Claeys, C.; Herzog, H. J.; Blondeel, A.; Clauws, P. (2000) -
Defect analysis of n-type silicon strained layers
Simoen, Eddy; Loo, Roger; Roussel, Philippe; Caymax, Matty; Bender, Hugo; Claeys, Cor; Herzog, H. J.; Blondeel, A.; Clauws, P. (2001) -
Determination of the oxygen content in platelike and octahedral oxygen precipitates in silicon with FT-IR spectroscopy
De Gryse, O.; Clauws, P.; Vanhellemont, Jan; Claeys, Cor (1997) -
DLTS and PL studies of proton radiation defects in TiN-doped FZ silicon
Simoen, Eddy; Claeys, Cor; Privitera, Vittorio; Coffa, S.; Kokkoris, M.; Kossionides, E.; Fanourakis, G.; Larsen, A. N.; Clauws, P. (2002)