Browsing by author "Kaczer, Ben"
Now showing items 21-40 of 622
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A model for switching traps in amorphous oxides
Goes, Wolfgang; Grasser, Tibor; Karner, Markus; Kaczer, Ben (2009) -
A multi-bits/cell PUF using analog breakdown positions in CMOS
Chuang, Kent; Bury, Erik; Degraeve, Robin; Kaczer, Ben; Kallstenius, Thomas; Groeseneken, Guido; Linten, Dimitri; Verbauwhede, Ingrid (2018) -
A multi-energy level agnostic approach for defect generation during TDDB stress
Vici, Andrea; Degraeve, Robin; Kaczer, Ben; Franco, Jacopo; Van Beek, Simon; De Wolf, Ingrid (2022) -
A multi-energy level agnostic simulation approach to defect generation
Vici, Andrea; Degraeve, Robin; Kaczer, Ben; Franco, Jacopo; Van Beek, Simon; De Wolf, Ingrid (2021) -
A new breakdown failure mechanism in HfO2 gate dielectrics
Ranjan, R.; Pey, K.L.; Tang, L.J.; Tung, C.H.; Groeseneken, Guido; Radhakrishnan, M.K.; Kaczer, Ben; Degraeve, Robin; De Gendt, Stefan (2004) -
A new method for the analysis of high-resolution SILC data
Aresu, Stefano; De Ceuninck, Ward; Knuyt, G.; Mertens, Jan; Manca, Jean; De Schepper, Luc; Degraeve, Robin; Kaczer, Ben; D'Olieslaeger, Marc; D'Haen, Jan (2003) -
A new TDDB reliability prediction methodology accounting for multiple SBD and wear out
Sahhaf, Sahar; Degraeve, Robin; Roussel, Philippe; Kaczer, Ben; Kauerauf, Thomas; Groeseneken, Guido (2009) -
A physically unclonable function featuring 0% BER using soft oxide breakdown positions in 40nm CMOS
Chuang, Kent; Bury, Erik; Degraeve, Robin; Kaczer, Ben; Linten, Dimitri; Verbauwhede, Ingrid (2018) -
A physically unclonable function using soft oxide breakdown featuring 0% native BER and 51.8fJ/bit in 40nm CMOS
Chuang, Kent; Bury, Erik; Degraeve, Robin; Kaczer, Ben; Linten, Dimitri; Verbauwhede, Ingrid (2019) -
A physics-aware compact modeling framework for transistor aging in the entire bias space
Wu, Zhicheng; Franco, Jacopo; Roussel, Philippe; Tyaginov, Stanislav; Truijen, Brecht; Vandemaele, Michiel; Hellings, Geert; Collaert, Nadine; Groeseneken, Guido; Linten, Dimitri; Kaczer, Ben (2019) -
A Pragmatic Model to Predict Future Device Aging
Brown, James; Tok, Kean Hong; Gao, Rui; Ji, Zhigang; Zhang, Weidong; Marsland, John S.; Chiarella, Thomas; Franco, Jacopo; Kaczer, Ben; Linten, Dimitri; Zhang, Jian Fu (2023) -
A reliability lab-on-chip using programmable arrays
Pfeifer, P.; Kaczer, Ben; Pliva, Z. (2014) -
A reliable method for the extraction of the lateral position of defects in ultra-scaled MOSFETs
Illarionov, Yu. Yu.; Bina, M.; Tyaginov, S. E.; Rott, K.; Reisinger, H.; Kaczer, Ben; Grasser, T. (2014) -
A rigorous study of measurement techniques for negative bias temperature instability
Grasser, Tibor; Wagner, Paul-Jurgen; Hehenberger, Philipp; Gos, Wolfgang; Kaczer, Ben (2007-10) -
A rigorous study of measurement techniques for negative bias temperature instability
Grasser, T.; Wagner, P. J.; Hehenberger, P.; Goes, W.; Kaczer, Ben (2008-09) -
A Ring-Oscillator-Based Degradation Monitor Concept with Tamper Detection Capability
Diaz Fortuny, Javier; Saraza Canflanca, Pablo; Bury, Erik; Vandemaele, Michiel; Kaczer, Ben; Degraeve, Robin (2022) -
A sensitivity map-based approach to profile defects in MIM capacitors from I-V, C-V and G-V measurements
Padovani, Andrea; Kaczer, Ben; Pesic, Milan; Belmonte, Attilio; Popovici, Mihaela Ioana; Nyns, Laura; Linten, Dimitri; Afanasiev, Valeri; Shlyakhov, Ilya; Lee, Younggon; Park, Hokyung; Larcher, Luca (2019) -
A single device based Voltage Step Stress (VSS) technique for fast reliability screening
Ji, Z.; Zhang, J. F.; Zhang, W. D.; Zhang, X.; Kaczer, Ben; De Gendt, Stefan; Groeseneken, Guido; Ren, P.; Wang, R.; Huang, R. (2014) -
A single pulse charge pumping technique for fast measurements of interface states
Lin, L.; Ji, Zhigang; Zhang, Jian Fu; Zhang, Wei Dong; Kaczer, Ben; De Gendt, Stefan; Groeseneken, Guido (2011) -
A step towards a better understanding of silicon passivated (100) Ge p-channel
Pourtois, Geoffrey; Houssa, Michel; De Jaeger, Brice; Leys, Frederik; Kaczer, Ben; Martens, Koen; Caymax, Matty; Meuris, Marc; Groeseneken, Guido; Heyns, Marc (2007)