Browsing by author "Groeseneken, Guido"
Now showing items 41-60 of 1150
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A new lifetime extrapolation technique for LDD NMOSFETS under hot-carrier degradation
Dreesen, R.; Croes, Kris; Manca, Jean; De Ceuninck, Ward; De Schepper, Luc; Pergoot, A.; Groeseneken, Guido (1999) -
A new model for the field dependence of intrinsic and extrinsic time-dependent dielectric breakdown
Degraeve, Robin; Ogier, Jean-Luc; Bellens, Rudi; Roussel, Philippe; Groeseneken, Guido; Maes, Herman (1998) -
A new physically-based model for temperature acceleration of time-to-breakdown
Pangon, Nadège; Degraeve, Robin; Roussel, Philippe; Groeseneken, Guido; Maes, Herman; Crupi, Felice (1998) -
A new polarity dependence of the reduced trap generation during high-field degradation of nitrided oxides
Degraeve, Robin; De Blauwe, Jan; Ogier, Jean-Luc; Roussel, Philippe; Groeseneken, Guido; Maes, Herman (1996) -
A new quantitative model to predict SILC-related disturb characteristics in Flash E2PROM devices
De Blauwe, Jan; Van Houdt, Jan; Wellekens, Dirk; Degraeve, Robin; Roussel, Philippe; Haspeslagh, Luc; Deferm, Ludo; Groeseneken, Guido; Maes, Herman (1996) -
A new statistical model for fitting bimodal oxide breakdown distributions at different field conditions
Degraeve, Robin; Roussel, Philippe; Ogier, Jean-Luc; Groeseneken, Guido; Maes, Herman (1996) -
A new TDDB reliability prediction methodology accounting for multiple SBD and wear out
Sahhaf, Sahar; Degraeve, Robin; Roussel, Philippe; Kaczer, Ben; Kauerauf, Thomas; Groeseneken, Guido (2009) -
A novel hot-hole injection degradation model for lateral nDMOS transistors
Moens, P.; Tack, Marnix; Degraeve, Robin; Groeseneken, Guido (2001) -
A novel method for guard ring efficiency assessment and its application for esd protection design and optimization
Tremouilles, David; Scholz, Mirko; Mahadeva Iyer, Natarajan; Marise, Bafleur; M, Sawada; T, Hasebe; Groeseneken, Guido (2007) -
A novel methodology for sensing the breakdown location and its application to the reliability study of ultra-thin Hf-silicate gate dielectrics
Crupi, Felice; Kauerauf, Thomas; Degraeve, Robin; Pantisano, Luigi; Groeseneken, Guido (2005-08) -
A physics-aware compact modeling framework for transistor aging in the entire bias space
Wu, Zhicheng; Franco, Jacopo; Roussel, Philippe; Tyaginov, Stanislav; Truijen, Brecht; Vandemaele, Michiel; Hellings, Geert; Collaert, Nadine; Groeseneken, Guido; Linten, Dimitri; Kaczer, Ben (2019) -
A plug-and-play wideband RF circuit ESD protection methodology: T-diodes
Linten, Dimitri; Thijs, Steven; Borremans, Jonathan; Dehan, Morin; Tremouilles, David; Scholz, Mirko; Mahadeva Iyer, Natarajan; Wambacq, Piet; Decoutere, Stefaan; Groeseneken, Guido (2009) -
A reliability study of titanium silicide lines using micro-raman spectroscopy and electron microscopy
De Wolf, Ingrid; Howard, Dave; Rasras, Mahmoud; Lauwers, A.; Maex, Karen; Groeseneken, Guido; Maes, Herman (1997) -
A reliability study of titanium silicide lines using micro-Raman spectroscopy and electron microscopy
De Wolf, Ingrid; Howard, Dave; Rasras, Mahmoud; Lauwers, A.; Maex, Karen; Groeseneken, Guido; Maes, Herman (1997) -
A silicon-controlled rectifier-based ESD protection for MEMS – Merits and challenges
Sangameswaran, Sandeep; Thijs, Steven; Scholz, Mirko; De Coster, Jeroen; Linten, Dimitri; Groeseneken, Guido; De Wolf, Ingrid (2011) -
A simple, cost effective and very sensitive alternative for photon emission spectroscopy
Rasras, Mahmoud; De Wolf, Ingrid; Groeseneken, Guido; Maes, Herman; Vanhaeverbeke, S.; De Pauw, P. (1997) -
A simulation study on process sensitivity of a line tunnel field-effect transistor
Walke, Amey; Vandenberghe, William; Kao, Frank; Vandooren, Anne; Groeseneken, Guido (2013) -
A single device based Voltage Step Stress (VSS) technique for fast reliability screening
Ji, Z.; Zhang, J. F.; Zhang, W. D.; Zhang, X.; Kaczer, Ben; De Gendt, Stefan; Groeseneken, Guido; Ren, P.; Wang, R.; Huang, R. (2014) -
A single pulse charge pumping technique for fast measurements of interface states
Lin, L.; Ji, Zhigang; Zhang, Jian Fu; Zhang, Wei Dong; Kaczer, Ben; De Gendt, Stefan; Groeseneken, Guido (2011) -
A step towards a better understanding of silicon passivated (100) Ge p-channel
Pourtois, Geoffrey; Houssa, Michel; De Jaeger, Brice; Leys, Frederik; Kaczer, Ben; Martens, Koen; Caymax, Matty; Meuris, Marc; Groeseneken, Guido; Heyns, Marc (2007)