Browsing by author "Claeys, Cor"
Now showing items 61-80 of 1170
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Analysis of the diffusion currrent in cobalt silicided n+p junctions
Poyai, Amporn; Simoen, Eddy; Claeys, Cor; Gaubas, Eugenijus; Czerwinski, A. (1998) -
Analysis of the interface trap density in SOI FinFETs with different TiN gate electrode thickness through charge pumping technique
Rodrigues, Michele; Cho, Moon Ju; Martino, J.A.; Collaert, Nadine; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2009-09) -
Analysis of the linear kink effect in partially depleted SOI nMOSFETs
Agopian, G.P.; Martino, J.A.; Simoen, Eddy; Claeys, Cor (2005) -
Analysis of the pre-epi bake conditions on the defect creation in recessed Si1-xGex S/D junctions
Bargallo Gonzalez, Mireia; Thomas, Nicole; Simoen, Eddy; Verheyen, Peter; Hikavyy, Andriy; Leys, Frederik; Okuno, Yasutoshi; Vissouvanadin Soubaretty, Bertrand; Van Daele, Benny; Geenen, Luc; Loo, Roger; Claeys, Cor; Machkaoutsan, Vladimir; Tomasini, P.; Thomas, S.G.; Lu, J.P.; Weijtmans, J.W.; Wise, R. (2007) -
Analysis of the silicon film thickness and the ground plane influence on ultra thin buried oxide SOI nMOSFETs
Itocazu, V.T.; Sonnenberg, V.; Simoen, Eddy; Claeys, Cor; Martino, J.A. (2012) -
Analysis of the temperature dependence of trap-assisted tunneling in Ge pFET junctions
Bargallo Gonzalez, Mireia; Eneman, Geert; Wang, Gang; De Jaeger, Brice; Simoen, Eddy; Claeys, Cor (2011) -
Analysis of the temperature dependence of trap-assisted-tunneling in Ge pFETs junctions
Bargallo Gonzalez, Mireia; Eneman, Geert; Wang, Gang; De Jaeger, Brice; Simoen, Eddy; Claeys, Cor (2011) -
Analysis of the total resistance in standard and strained FinFET devices with and without the u se of SEG
Nicoletti, T.; Martino, J.A.; Simoen, Eddy; Claeys, Cor (2009) -
Analysis of the transistor efficiency of gas phase Zn diffusion In0.53Ga0.47As nTFETs at different temperatures
Bordallo, Caio; Martino, J.A.; Agopian, P.G.D.; Alian, AliReza; Mols, Yves; Rooyackers, Rita; Vandooren, Anne; Verhulst, Anne; Simoen, Eddy; Claeys, Cor; Collaert, Nadine (2017) -
Analysis of then substrate current in Ge pMOSFETs
Todi, V.; Simoen, Eddy; Eneman, Geert; Claeys, Cor; Sundaram, K.B. (2009) -
Analysis of uniaxial and biaxial strain impact on the linearity of fully depleted SOI nMOSFETs
Pavanello, Marcelo Antonio; Martino, Joao Antonio; Simoen, Eddy; Claeys, Cor (2007) -
Analysis of UTBOX-1T DRAM memory cell at high temperatures
Almeida, L.M.; Sasaki, K.R.A.; Aoulaiche, Marc; Simoen, Eddy; Claeys, Cor (2011) -
Analytical model for the 1/f noise in the tunneling current through metal-oxide-semiconductor structures
Crupi, F.; Giusi, G.; Iannacone, G.; Magnone, P.; Pace, C.; Simoen, Eddy; Claeys, Cor (2009) -
Angular and strain dependence of heavy-ions induced degration in SOI FinFETs
Griffoni, Alessio; Gerardin, Simone; Meneghesso, Gaudenzio; Paccagnella, Alessandro; Simoen, Eddy; Claeys, Cor (2010) -
Anomalous threshold voltage change by 2 MeV electron irradiation at 100°C in deep submicron metal-oxide-semiconductor field-effect transistors
Hayama, K.; Ohyama, H.; Simoen, Eddy; Rafi, Joan Marc; Mercha, Abdelkarim; Claeys, Cor (2004-04) -
Application of porous low-k dielectrics and copper in microelectronics
Le, Quoc Toan; Baklanov, Mikhaïl; Claeys, Cor; Snow, Jim; Vanhaelemeersch, Serge (2005) -
Approach for a standardized methodology for multisite processing of 300-mm wafers at R&D sites
Oechsner, Richard; Pfeffer, M.; Frickinger, J.; Schellenberger, M.; Roeder, G.; Pfitzner, L.; Ryssel, H.; Fritzsche, M.; Kaushik, V.; Renaud, D.; Danel, A.; Claeys, Cor; Bearda, Twan; Lering, M.; Graef, M.; Murphy, B.; Walther, H.; Hury, S. (2007) -
Are extended defects a show stopper for future III-V CMOS technologies?
Claeys, Cor; Hsu, Brent; He, Liang; Mols, Yves; Kunert, Bernardette; Langer, Robert; Waldron, Niamh; Eneman, Geert; Collaert, Nadine; Heyns, Marc; Simoen, Eddy (2018-06) -
Assessment of temperature dependence of the low frequency noise in unstrained and strained FinFETs
Talmat, R.; Achour, H.; Cretu, B.; Routoure, J.-M.; Benfdila, A.; Carin, R.; Collaert, Nadine; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor (2011) -
Assessment of the impact of inelastic tunneling on the frequency-depth conversion from low-frequency noise spectra
Simoen, Eddy; Lee, Jae Woo; Claeys, Cor (2014)