Recently added

Self-aligned double patterning process for subtractive Ge Fin fabrication at 45-nm pitch

Milenin, Alexey; Witters, Liesbeth; Barla, Kathy; Thean, Aaron (2016)

III-V fin patterning in SADP scheme

Milenin, Alexey; Camerotto, Elisabeth; Sun, Noel; Boccardi, Guillaume; Vertommen, Johan; Piumi, Daniele (2016)

In vitro emergence of high persistence upon periodic aminoglycoside challenge in the ESKAPE pathogens

Michiels, Joran; Van den Bergh, Bram; Verstraeten, Natalie; Fauvart, Maarten; Michiels, Jan (2016)

Draft genome sequence of Enterococcus faecium strain LMG 8148

Michiels, Joran; Van den Bergh, Bram; Fauvart, Maarten; Michiels, Jan (2016)

Draft genome sequence of Acinetobacter baumannii strain NCTC 13423, a multidrug-resistant clinical isolate

Michiels, Joran; Van den Bergh, Bram; Fauvart, Maarten; Michiels, Jan (2016)

Specification of trace metal contamination for image sensors

Mertens, Paul; Lavizzari, Simone; Guerrieri, Stefano (2016)

Vertically stacked gate-all-around Si nanowire CMOS transistors with dual work function metal gates

Mertens, Hans; Ritzenthaler, Romain; Vaisman Chasin, Adrian; Schram, Tom; Kunnen, Eddy; Hikavyy, Andriy; Ragnarsson, Lars-Ake; Dekkers, Harold; Hopf, Toby; Wostyn, Kurt; Devriendt, Katia; Chew, Soon Aik; Kim, Min-Soo; Kikuchi, Yoshiaki; Rosseel, Erik; Mannaert, Geert; Kubicek, Stefan; Demuynck, Steven; Dangol, Anish; Bosman, Niels; Geypen, Jef; Carolan, Patrick; Bender, Hugo; Barla, Kathy; Horiguchi, Naoto; Mocuta, Dan (2016-12)

Gate-all-around MOSFETs based on vertically stacked horizontal Si nanowires in a replacement metal gate process on bulk Si substrates

Mertens, Hans; Ritzenthaler, Romain; Hikavyy, Andriy; Kim, Min-Soo; Tao, Zheng; Wostyn, Kurt; Chew, Soon Aik; De Keersgieter, An; Mannaert, Geert; Rosseel, Erik; Schram, Tom; Devriendt, Katia; Tsvetanova, Diana; Dekkers, Harold; Demuynck, Steven; Vaisman Chasin, Adrian; Van Besien, Els; Dangol, Anish; Godny, Stephane; Douhard, Bastien; Bosman, Niels; Richard, Olivier; Geypen, Jef; Bender, Hugo; Barla, Kathy; Mocuta, Dan; Horiguchi, Naoto; Thean, Aaron (2016)

Biomedical wireless raadar sensor network for indoor emergency situations detection and vital signs monitoring

Mercuri, Marco; Karsmakers, Peter; Vanrumste, Bart; Leroux, Paul; Schreurs, Dominique (2016)

Gate stability of GaN-based HEMTs with p-type gate

Meneghini, Matteo; Rossetto, Isabella; Rizzato, Vanessa; Stoffels, Steve; Van Hove, Marleen; Posthuma, Niels; Wu, Tian-Li; Marcon, Denis; Decoutere, Stefaan; Meneghesso, Gaudenzio; Zanoni, Enrico (2016)

Negative bias-induced threshold voltage instability (NBTI) in GaN-on-Si power HEMTs

Meneghini, Matteo; Rossetto, Isabella; Bisi, Davide; Ruzzarin, Maria; Van Hove, Marleen; Stoffels, Steve; Wu, Tian-Li; Marcon, Denis; Decoutere, Stefaan; Meneghesso, Gaudio; Zanoni, Enrico (2016)

Normally-off HEMTs with p-GaN gate: stability and lifetime extrapolation

Meneghesso, Gaudenzio; Meneghini, Matteo; Rossetto, Isabella; Rizzato, Vanessa; Stoffels, Steve; Van Hove, Marleen; Wu, Tian-Li; You, Shuzhen; Posthuma, Niels; Decoutere, Stefaan; Zanoni, Enrico (2016)

Reliability and parasitic issues in GaN-based power HEMTs

Meneghesso, Gaudenzio; Meneghini, Matteo; Rossetto, Isabella; Bisi, Davide; Stoffels, Steve; Van Hove, Marleen; Decoutere, Stefaan; Zanoni, Enrico (2016)

Trapping and reliability issues in GaN-based MIS HEMTs with partially recessed gate

Meneghesso, Gaudenzio; Meneghini, Matteo; Bisi, Davide; Rossetto, Isabella; Wu, Tian-Li; Van Hove, Marleen; Marcon, Denis; Stoffels, Steve; Decoutere, Stefaan; Zanoni, Enrico (2016)

Influence of the Ge amount at the source on transistor efficiency of vertical gate all around TFETs for different conduction regimes

Mendes Bordallo, Ciao Cesar; Sivieri, Victor B.; Martino, Joao Antonio; Agopian, Paula G. D.; Rooyackers, Rita; Vandooren, Anne; Simoen, Eddy; Thean, Aaron; Claeys, Cor (2016)

imec Publications: Recent submissions

Self-aligned double patterning process for subtractive Ge Fin fabrication at 45-nm pitch

III-V fin patterning in SADP scheme

In vitro emergence of high persistence upon periodic aminoglycoside challenge in the ESKAPE pathogens

Draft genome sequence of Enterococcus faecium strain LMG 8148

Draft genome sequence of Acinetobacter baumannii strain NCTC 13423, a multidrug-resistant clinical isolate

Specification of trace metal contamination for image sensors

Vertically stacked gate-all-around Si nanowire CMOS transistors with dual work function metal gates

Gate-all-around MOSFETs based on vertically stacked horizontal Si nanowires in a replacement metal gate process on bulk Si substrates

Biomedical wireless raadar sensor network for indoor emergency situations detection and vital signs monitoring

Gate stability of GaN-based HEMTs with p-type gate

Negative bias-induced threshold voltage instability (NBTI) in GaN-on-Si power HEMTs

Normally-off HEMTs with p-GaN gate: stability and lifetime extrapolation

Reliability and parasitic issues in GaN-based power HEMTs

Trapping and reliability issues in GaN-based MIS HEMTs with partially recessed gate

Influence of the Ge amount at the source on transistor efficiency of vertical gate all around TFETs for different conduction regimes

Impact of the NW-TFET diameter on the efficiency and the intrinsic voltage gain from a conduction regime perspective

Analog parameters of solid source Zn diffusion InXGa1-XAs nTFETs down to 10K

Impact of InxGa1-x composition and source Zn diffusion temperature on intrinsic voltage gain in InGaAs TFETs

Fixed-point refinement, a guaranteed approach towards energy efficient computing

Nanoparticle scattering for multijunction solar cells: the tradeoff between absorption enhancement and transmission loss

imec Publications: Recent submissions

Self-aligned double patterning process for subtractive Ge Fin fabrication at 45-nm pitch ﻿

III-V fin patterning in SADP scheme ﻿

In vitro emergence of high persistence upon periodic aminoglycoside challenge in the ESKAPE pathogens ﻿

Draft genome sequence of Enterococcus faecium strain LMG 8148 ﻿

Draft genome sequence of Acinetobacter baumannii strain NCTC 13423, a multidrug-resistant clinical isolate ﻿

Specification of trace metal contamination for image sensors ﻿

Vertically stacked gate-all-around Si nanowire CMOS transistors with dual work function metal gates ﻿

Gate-all-around MOSFETs based on vertically stacked horizontal Si nanowires in a replacement metal gate process on bulk Si substrates ﻿

Biomedical wireless raadar sensor network for indoor emergency situations detection and vital signs monitoring ﻿

Gate stability of GaN-based HEMTs with p-type gate ﻿

Negative bias-induced threshold voltage instability (NBTI) in GaN-on-Si power HEMTs ﻿

Normally-off HEMTs with p-GaN gate: stability and lifetime extrapolation ﻿

Reliability and parasitic issues in GaN-based power HEMTs ﻿

Trapping and reliability issues in GaN-based MIS HEMTs with partially recessed gate ﻿

Influence of the Ge amount at the source on transistor efficiency of vertical gate all around TFETs for different conduction regimes ﻿

Impact of the NW-TFET diameter on the efficiency and the intrinsic voltage gain from a conduction regime perspective ﻿

Analog parameters of solid source Zn diffusion InXGa1-XAs nTFETs down to 10K ﻿

Impact of InxGa1-x composition and source Zn diffusion temperature on intrinsic voltage gain in InGaAs TFETs ﻿

Fixed-point refinement, a guaranteed approach towards energy efficient computing ﻿

Nanoparticle scattering for multijunction solar cells: the tradeoff between absorption enhancement and transmission loss ﻿

Self-aligned double patterning process for subtractive Ge Fin fabrication at 45-nm pitch

III-V fin patterning in SADP scheme

In vitro emergence of high persistence upon periodic aminoglycoside challenge in the ESKAPE pathogens

Draft genome sequence of Enterococcus faecium strain LMG 8148

Draft genome sequence of Acinetobacter baumannii strain NCTC 13423, a multidrug-resistant clinical isolate

Specification of trace metal contamination for image sensors

Vertically stacked gate-all-around Si nanowire CMOS transistors with dual work function metal gates

Gate-all-around MOSFETs based on vertically stacked horizontal Si nanowires in a replacement metal gate process on bulk Si substrates

Biomedical wireless raadar sensor network for indoor emergency situations detection and vital signs monitoring

Gate stability of GaN-based HEMTs with p-type gate

Negative bias-induced threshold voltage instability (NBTI) in GaN-on-Si power HEMTs

Normally-off HEMTs with p-GaN gate: stability and lifetime extrapolation

Reliability and parasitic issues in GaN-based power HEMTs

Trapping and reliability issues in GaN-based MIS HEMTs with partially recessed gate

Influence of the Ge amount at the source on transistor efficiency of vertical gate all around TFETs for different conduction regimes

Impact of the NW-TFET diameter on the efficiency and the intrinsic voltage gain from a conduction regime perspective

Analog parameters of solid source Zn diffusion InXGa1-XAs nTFETs down to 10K

Impact of InxGa1-x composition and source Zn diffusion temperature on intrinsic voltage gain in InGaAs TFETs

Fixed-point refinement, a guaranteed approach towards energy efficient computing

Nanoparticle scattering for multijunction solar cells: the tradeoff between absorption enhancement and transmission loss