Browsing Conference contributions by imec author "07761243442a75daaa75613333bbbe534d580f8f"
Now showing items 21-40 of 180
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Aqueous chemical solution deposition of ultrathin high-k dielectric metal oxide films
Hardy, An; Van Elshocht, Sven; Van Bael, Marlies; D'Haen, Jan; Douheret, O.; De Gendt, Stefan; Adelmann, Christoph; Caymax, Matty; Conard, Thierry; Witters, Thomas; D'Olieslaeger, Marc; Heyns, Marc; Mullens, J. (2007) -
Atomic layer deposited Gd-doped HfO2 thin films: from high-k dielectrics to ferroelectrics
Adelmann, Christoph; Ragnarsson, Lars-Ake; Moussa, Alain; Woicik, Joseph; Mueller, Stefan; Schoeder, Uwe; Afanasiev, Valeri; Van Elshocht, Sven (2012) -
Atomic layer deposition of GdAlOx and GdHfOx using Gd(iPr-Cp)3
Adelmann, Christoph; Pierreux, Dieter; Swerts, Johan; Kesters, Jurgen; Richard, Olivier; Conard, Thierry; Franquet, Alexis; Tielens, Hilde; Afanasiev, Valeri; Schaekers, Marc; Van Elshocht, Sven (2009) -
Atomic layer deposition of GdHfOx thin films
Adelmann, Christoph; Pierreux, Dieter; Swerts, Johan; Rosseel, Erik; Shi, Xiaoping; Tielens, Hilde; Kesters, Jurgen; Van Elshocht, Sven; Kittl, Jorge (2009) -
Atomic layer deposition of high-k dielectric layers on single-walled carbon nanotubes
Cott, Daire; Liyanage, Luckshitha; Delabie, Annelies; Adelmann, Christoph; Van Elshocht, Sven; Wong, Hon- Sum Philip (2012) -
Atomic layer deposition of ruthenium for advanced interconnect applications
Adelmann, Christoph; Popovici, Mihaela Ioana; Groven, Benjamin; Wen, Liang Gong; Dutta, Shibesh; Boemmels, Juergen; Tokei, Zsolt; Van Elshocht, Sven (2016) -
Atomic-layer deposition of lutetium aluminate thin films for non-volatile memory applications
Adelmann, Christoph; Swerts, Johan; Conard, Thierry; Brijs, Bert; Franquet, Alexis; Hardy, An; Tielens, Hilde; Opsomer, Karl; Moussa, Alain; Van Bael, Marlies; Jurczak, Gosia; Kittl, Jorge; Van Elshocht, Sven (2011) -
AVD and MOCVD TaCN-based films for gate metal applications on high-k gate dielectrics
Karim, Zia; Barbar, Ghassan; Boissiere, Olivier; Lehnen, Peer; Lohe, Christoph; Seidel, Tom; Adelmann, Christoph; Conard, Thierry; O'Sullivan, Barry; Ragnarsson, Lars-Ake; Schram, Tom; Van Elshocht, Sven; De Gendt, Stefan (2007-10) -
Backside power delivery with a direct 14:1/19:1 high-ratio point-of-load power converter for servers and datacenters
Lin, Hesheng; Hiblot, Gaspard; Sun, Xiao; Talmelli, Giacomo; Velenis, Dimitrios; Bex, Pieter; Adelmann, Christoph; Lauwereins, Rudy; Catthoor, Francky; Van der Plas, Geert; Beyne, Eric (2021) -
Backward volume vs Damon-Eschbach: A travelling Spin wave spectroscopy comparison
Bhaskar, Umesh; Talmelli, Giacomo; Ciubotaru, Florin; Adelmann, Christoph; Devolder, Thibaut (2019) -
BPZT HBARs as large-amplitude stress transducers at GHz frequencies
Bhaskar, U.K.; Tierno, Davide; Talmelli, Giacomo; Ciubotaru, Florin; Adelmann, Christoph; Matzen, S.; Devolder, T. (2019) -
Capacitance-voltage (CV) characterization of GaAs-oxide interfaces
Brammertz, Guy; Martens, Koen; Lin, Dennis; Merckling, Clement; Penaud, Julien; Adelmann, Christoph; Sioncke, Sonja; Wang, Wei-E; Caymax, Matty; Meuris, Marc; Heyns, Marc (2008) -
Capacitance-voltage (CV)characterization of GaAs-oxide interfaces
Brammertz, Guy; Lin, H.C.; Martens, Koen; Mercier, David; Merckling, Clement; Penaud, Julien; Adelmann, Christoph; Sioncke, Sonja; Wang, Wei-E; Caymax, Matty; Meuris, Marc; Heyns, Marc (2008) -
Capping-metal gate integration technology for multiple-VT CMOS in MuGFETs
Veloso, Anabela; Witters, Liesbeth; Demand, Marc; Ferain, Isabelle; Son, Nak Jin; Kaczer, Ben; Roussel, Philippe; Adelmann, Christoph; Brus, Stephan; Richard, Olivier; Bender, Hugo; Conard, Thierry; Vos, Rita; Rooyackers, Rita; Van Elshocht, Sven; Collaert, Nadine; De Meyer, Kristin; Biesemans, Serge; Jurczak, Malgorzata (2008) -
Caustic-beam-based two-dimensional microscale magnonic devices
Serga, Aleksander; Heussner, Frank; Talmelli, Giacomo; Geilen, Moritz; Heinz, Bjorn; Yamamoto, K.; Brächer, Thomas; Adelmann, Christoph; Ciubotaru, Florin; Hillebrands, Burkard; Pirro, Philipp (2019) -
Chemical profiling with photoemission: a comparison between angle-resolved XPS and high-energy photoemission on full gate stacks
Conard, Thierry; Schram, Tom; Adelmann, Christoph; Woicik, J. (2011) -
CNT EUV pellicle:moving towards a full-size solution
Timmermans, Marina; Pollentier, Ivan; Lee, Jae Uk; Meersschaut, Johan; Richard, Olivier; Adelmann, Christoph; Huyghebaert, Cedric; Gallagher, Emily (2017) -
CNTs in the context of EUV pellicle history
Gallagher, Emily; Timmermans, Marina; Pollentier, Ivan; Lee, Jae Uk; Mariano Juste, Marina; Adelmann, Christoph; Huyghebaert, Cedric; Scholze, Frank; Laubis, Christian (2018) -
Co and Ru dual damascene compatible metallization studies
van der Veen, Marleen; Heylen, Nancy; Lariviere, Stephane; Vega Gonzalez, Victor; Kesters, Els; Le, Quoc Toan; Teugels, Lieve; Chew, Soon Aik; Philipsen, Harold; Hung, Joey; Adelmann, Christoph; Vanstreels, Kris; Jourdan, Nicolas; Holsteyns, Frank; Struyf, Herbert; Wilson, Chris; Tokei, Zsolt (2019) -
Computing with spin waves: from magnetoelectric transducers to majority gates
Ciubotaru, Florin; Tierno, Davide; Talmelli, Giacomo; Ahmad, Hasnain; Costa, Diogo; Radu, Iuliana; Devolder, Thibaut; Adelmann, Christoph (2018)