Recently added

A distributed metadata platform for hybrid radio services

Friedrich, Markus; Ebert, Andre; Hahn, Carsten; Schneider, Georg; Obermeier, Liza; Erk, Alexander; Jennes, Iris (2019-06)

A holistic approach of SIMS analysis for advanced semiconductor structures

Franquet, Alexis; Spampinato, Valentina; Pirkl, Alexander; Kayser, Sven; Moellers, Rudolf; Conard, Thierry; Vandervorst, Wilfried; van der Heide, Paul (2019)

Advanced semiconducting structure analysis with Self-Focusing SIMS and improved mass resolution in a Hybrid SIMS instrument

Franquet, Alexis; Spampinato, Valentina; Kayser, Sven; Vandervorst, Wilfried; van der Heide, Paul (2019)

Hybrid SIMS: How the orbitrap mass analyzer can improve the self-focusing SIMS concept for advanced semiconductor structures

Franquet, Alexis; Spampinato, Valentina; Kayser, Sven; Havelund, Rasmus; Gilmore, Ian; Vandervorst, Wilfried; van der Heide, Paul (2019)

Improving exposure latitude and aligning best focus through pitch by curing M3D effects with controlled aberrations

Franke, Joern-Holger; Bekaert, Joost; Blanco, Victor; Van Look, Lieve; Wahlisch, Felix; Lyakhova, Kateryna; Van Adrichem, Paul; Maslow, Mark John; Schiffelers, Guido; Hendrickx, Eric (2019)

Low thermal budget dual-dipole gate stacks engineered for sufficient BTI reliability in novel integration schemes

Franco, Jacopo; Wu, Zhicheng; Rzepa, Gerhard; Vandooren, Anne; Arimura, Hiroaki; Claes, Dieter; Horiguchi, Naoto; Collaert, Nadine; Linten, Dimitri; Grasser, Tibor; Kaczer, Ben (2019-12)

On the impact of reduced thermal budget on HfO2 electron trap and SiO2 hole trap defect bands in RMG gate stacks for sequential 3D CMOS integration

Franco, Jacopo; Wu, Zhicheng; Claes, Dieter; Vandooren, Anne; Horiguchi, Naoto; Linten, Dimitri; Grasser, Tibor; Kaczer, Ben (2019)

Evaluating CoAP end to end security for constrained wireless sensor networks

Fournaris, A.P.; Giannoulis, Spilios; Koulamas, C. (2019)

Molybdenum as an Alternative Metal: Thin Film Properties

Founta, Valeria; Witters, Thomas; Mertens, Sofie; Vanstreels, Kris; Meersschaut, Johan; Van Marcke, Patricia; Korytov, Maxim; Franquet, Alexis; Wilson, Chris; Tokei, Zsolt; Van Elshocht, Sven; Adelmann, Christoph (2019)

Imec's defect reduction strategies for EUV single exposed 32nm pitch line and space patterns

Foubert, Philippe; De Bisschop, Peter; Bekaert, Joost; Beral, Christophe; Rincon Delgadillo, Paulina (2019)

Log-based intrusion detection for Cloud Web applications using machine learning

Fontaine, Jaron; Kappler, C.; Shahid, Adnan; De Poorter, Eli (2019)

Characterization of absorption losses in rear side N-type polycrystalline silicon passivating contacts

Firat, Meric; Recaman Payo, Maria; Duerinckx, Filip; Luchies, Jan-Marc; Lenes, Martijn; Poortmans, Jef (2019)

Two-stage voltage amplifier design based on experimental Line-Tunnel FET data

Filho, Walter Goncalez; Martino, J.A.; Rangel, Roberto; Simoen, Eddy; Agopian, P.G.D.; Rooyackers, Rita; Claeys, Cor; Collaert, Nadine (2019)

Device-aware test: A new test approach towards DPPB

Fieback, Moritz; Wu, Lizhou; Cardoso Medeiros, Guilherme; Aziza, Hassen; Rao, Siddharth; Marinissen, Erik Jan; Taouil, Mottaqiallah; Hamdioui, Said (2019-11)

Hybrid PZT/Si TM/TE electro-optic phase modulators

Feutmba, Gilles F.; George, John P.; Alexander, Koen; Van Thourhout, Dries; Beeckman, Jeroen (2019)

Preliminary Study on Hybrid Manufacturing of the Electrical-Mechanical Integrated Systems (EMIS) Assisted by the LCD Stereolithography Technology

Fei, Guanghai; Wei, Tiwei; Qimin, Shi; Guo, Yongjian; Oprins, Herman; Yang, Shoufeng (2019)

TEM investigation of gate-all-around nanowire devices

Favia, Paola; Arimura, Hiroaki; Capogreco, Elena; Eneman, Geert; Mertens, Hans; Hikavyy, Andriy; Richard, Olivier; Witters, Liesbeth; Kundu, Paromita; Loo, Roger; Vancoille, Eric; Bender, Hugo (2019)

Atom column detection from STEM images using the maximum a posteriori probability rule

Fatermans, J.; den Dekker, A.J.; O'Leary, C.M.; Nellist, P.D.; Van Aert, S. (2019)

The hidden energy tail of low energy electrons in EUV lithography

Fallica, Roberto; Rezvani, Seyed Javid; Nannarone, Stefano; Borisov, Sergei; De Simone, Danilo; Babin, Sergey; Lorusso, Gian; Vandenberghe, Geert (2019)

Epitaxial growth by MOCVD on 200 mm engineered substrates for power devices & ICs beyond 650 V

Fahle, Dirk; Zhao, Ming; Geens, Karen; Li, Xiangdong; Wellekens, Dirk; Magnani, Alessandro; Amirifar, Nooshin; Bakeroot, Benoit; You, Shuzhen; Odnoblyudov, Vladimir; Aktas, Ozgur; Basceri, Cem; Marcon, Denis; Groeseneken, Guido; Decoutere, Stefaan; Hahn, Herwig; Heuken, Michael (2019)

Conference contributions: Recent submissions

A distributed metadata platform for hybrid radio services ﻿

A holistic approach of SIMS analysis for advanced semiconductor structures ﻿

Advanced semiconducting structure analysis with Self-Focusing SIMS and improved mass resolution in a Hybrid SIMS instrument ﻿

Hybrid SIMS: How the orbitrap mass analyzer can improve the self-focusing SIMS concept for advanced semiconductor structures ﻿

Improving exposure latitude and aligning best focus through pitch by curing M3D effects with controlled aberrations ﻿

Low thermal budget dual-dipole gate stacks engineered for sufficient BTI reliability in novel integration schemes ﻿

On the impact of reduced thermal budget on HfO2 electron trap and SiO2 hole trap defect bands in RMG gate stacks for sequential 3D CMOS integration ﻿

Evaluating CoAP end to end security for constrained wireless sensor networks ﻿

Molybdenum as an Alternative Metal: Thin Film Properties ﻿

Imec's defect reduction strategies for EUV single exposed 32nm pitch line and space patterns ﻿

Log-based intrusion detection for Cloud Web applications using machine learning ﻿

Characterization of absorption losses in rear side N-type polycrystalline silicon passivating contacts ﻿

Two-stage voltage amplifier design based on experimental Line-Tunnel FET data ﻿

Device-aware test: A new test approach towards DPPB ﻿

Hybrid PZT/Si TM/TE electro-optic phase modulators ﻿

Preliminary Study on Hybrid Manufacturing of the Electrical-Mechanical Integrated Systems (EMIS) Assisted by the LCD Stereolithography Technology ﻿

TEM investigation of gate-all-around nanowire devices ﻿

Atom column detection from STEM images using the maximum a posteriori probability rule ﻿

The hidden energy tail of low energy electrons in EUV lithography ﻿

Epitaxial growth by MOCVD on 200 mm engineered substrates for power devices & ICs beyond 650 V ﻿