Recently added

Low optical loss-n-type ohmic contacts for InP-based membrane devices

Shen, L.; van Veldhoven, P.J.; Jiao, Y.; Dolores Calzadilla, V.M.; van der Tol, J.; Roelkens, Gunther; Smit, M.K. (2016)

67 GHz uni-traveling carrier photodetector on an InP-membrane-on-silicon platform

Shen, L.; Jiao, W.; Cao, Z.; van der Tol, J.; Roelkens, Gunther; Smit, M.K. (2016)

A drift-diffusion-based analytic description of the energy distribution function for hot-carrier degradation in decananometer NMOSFETs

Sharma, P.; Tyaginov, S.; Rauch, S.E.; Franco, Jacopo; Kaczer, Ben; Makarov, A.; Vexler, M.I.; Grasser, T. (2016)

Smart liquid crystal beam deflector with laser ablated polymer micro grating structure

Shang, Xiaobing; Desmet, Andres; Joshi, Pankaj; De Smet, Jelle; Cuypers, Dieter; De Smet, Herbert (2016)

Wet selective SiGe etch to enable Ge nanowire formation.

Sebaai, Farid; Witters, Liesbeth; Holsteyns, Frank; Wostyn, Kurt; Rip, Jens; Yukifumi, Yoshida; Lieten, Ruben; Bilodeau, Steven; Cooper, Emanuel (2016)

Seeing the invisible: metrology for extended crystalline defects in beyond silicon semiconductors

Schulze, Andreas; Prokhodtseva, Anna; Vystavel, Tomas; Gachet, David; Berney, Jean; Loo, Roger; Vandervorst, Wilfried; Caymax, Matty (2016)

Characterization of optical material properties for alternative EUV mask absorber materials

Scholze, Frank; Laubis, Christian; Philipsen, Vicky; Luong, Vu; Edrisi, Arash; Van de Kruijs, Robbert (2016)

Impact of wafer thinning on ESD protection devices in 3D integrated systems

Scholz, Mirko; Vaisman Chasin, Adrian; Linten, Dimitri; Van der Plas, Geert; Beyne, Eric (2016-05)

ESD protection design in a-IGZO TFT technologies

Scholz, Mirko; Steudel, Soeren; Myny, Kris; Chen, Shih-Hung; Boschke, Roman; Hellings, Geert; Linten, Dimitri (2016-09)

HMM single site testing: Can we reproduce component failure level with the HMM document?

Scholz, Mirko; Ashton, Robert; Smedes, Theo; Derikx, Richard; Dekker, Marcel; Barth, Jon (2016-09)

EUV extendibility via dry development rinse process

Sayan, Safak; Tao, Zheng; De Simone, Danilo; Vandenberghe, Geert (2016)

Toward sub-20nm pitch Fin patterning and integration with DSA

Sayan, Safak; Marzook, Taisir; Chan, BT; Vandenbroeck, Nadia; Singh, Arjun; Laidler, David; Altamirano Sanchez, Efrain; Leray, Philippe; Rincon Delgadillo, Paulina; Gronheid, Roel; Vandenberghe, Geert; Clark, William; Juncker, Aurelie (2016)

Imaging of photonic crystal cavity mode via refractive index sensing

Saurav, Kumar; Thomas, N. Le (2016)

Mapping nano-object induced pertubations of photonic crystal cavity modes

Saurav, Kumar; Le Thomas, Nicolas (2016)

Fabrication of substrate-less planar silicon photonic crystal cavities

Saurav, Kumar; Le Thomas, Nicolas (2016)

DIBL in enhanced dynamic threshold operation of UTBB SOI with different drain engineering at high temperatures

Sasaki, Katia R.A.; Simoen, Eddy; Claeys, Cor; Martino, Joao A. (2016)

A first principles study of the oscillatory behavior of tunnel magnetoresitance: On the impact of magnetic and tunneling barrier layers and of the capping metals

Sankaran, Kiroubanand; Swerts, Johan; Couet, Sebastien; Furnemont, Arnaud; Stokbro, Kurt; Pourtois, Geoffrey (2016)

CTE measurements for 3D package substrates using digital image correlation

Salahouelhadj, Abdellah; Gonzalez, Mario (2016)

Chemical mechanical polishing of manganese (Mn)-based barrier films in the BEOL interconnects for advanced metallization nodes

Sagi, Kaushik; Babu, S.V.; van der Veen, Marleen; Struyf, Herbert; Teugels, Lieve (2016)

Complete extraction of defect bands responsible for instabilities in n and pFinFETs

Rzepa, Gerhard; Waltl, Michael; Goes, Wolfgang; Kaczer, Ben; Franco, Jacopo; Chiarella, Thomas; Horiguchi, Naoto; Grasser, Tibor (2016)

Conference contributions: Recent submissions

Low optical loss-n-type ohmic contacts for InP-based membrane devices ﻿

67 GHz uni-traveling carrier photodetector on an InP-membrane-on-silicon platform ﻿

A drift-diffusion-based analytic description of the energy distribution function for hot-carrier degradation in decananometer NMOSFETs ﻿

Smart liquid crystal beam deflector with laser ablated polymer micro grating structure ﻿

Wet selective SiGe etch to enable Ge nanowire formation. ﻿

Seeing the invisible: metrology for extended crystalline defects in beyond silicon semiconductors ﻿

Characterization of optical material properties for alternative EUV mask absorber materials ﻿

Impact of wafer thinning on ESD protection devices in 3D integrated systems ﻿

ESD protection design in a-IGZO TFT technologies ﻿

HMM single site testing: Can we reproduce component failure level with the HMM document? ﻿

EUV extendibility via dry development rinse process ﻿

Toward sub-20nm pitch Fin patterning and integration with DSA ﻿

Imaging of photonic crystal cavity mode via refractive index sensing ﻿

Mapping nano-object induced pertubations of photonic crystal cavity modes ﻿

Fabrication of substrate-less planar silicon photonic crystal cavities ﻿

DIBL in enhanced dynamic threshold operation of UTBB SOI with different drain engineering at high temperatures ﻿

A first principles study of the oscillatory behavior of tunnel magnetoresitance: On the impact of magnetic and tunneling barrier layers and of the capping metals ﻿

CTE measurements for 3D package substrates using digital image correlation ﻿

Chemical mechanical polishing of manganese (Mn)-based barrier films in the BEOL interconnects for advanced metallization nodes ﻿

Complete extraction of defect bands responsible for instabilities in n and pFinFETs ﻿