Recently added

Composition measurements of thin films beyond the spatial resolution of SIMS

Franquet, Alexis; Douhard, Bastien; Delmotte, Joris; Merckling, Clement; Conard, Thierry; Vandervorst, Wilfried (2013)

Reduction of the BTI time-dependent variability in nanoscaled MOSFETs by body bias

Franco, Jacopo; Kaczer, Ben; Toledano Luque, Maria; Roussel, Philippe; Groeseneken, Guido; Schwarz, Benedikt; Bina, Markus; Waltl, Michael; Wagner, Paul-Juergen; Grasser, Tibor (2013)

Superior reliability of high mobility (Si)Ge channel pMOSFETs

Franco, Jacopo; Kaczer, Ben; Toledano Luque, Maria; Roussel, Philippe; Cho, Moon Ju; Kauerauf, Thomas; Mitard, Jerome; Eneman, Geert; Witters, Liesbeth; Grasser, Tibor; Groeseneken, Guido (2013)

Relevance of non-exponential single-defect-induced threshold voltage shifts for NBTI Variability

Franco, Jacopo; Kaczer, Ben; Roussel, Philippe; Toledano Luque, Maria; Weckx, Pieter; Grasser, Tibor (2013)

Understanding the suppressed charge trapping in relaxed- and strained-Ge/SiO2/HfO2 pMOSFETs and implications for the screening of alternative high-mobility substrate/dielectric CMOS gate stacks

Franco, Jacopo; Kaczer, Ben; Roussel, Philippe; Mitard, Jerome; Sioncke, Sonja; Witters, Liesbeth; Mertens, Hans; Grasser, Tibor; Groeseneken, Guido (2013)

Track processing optimizations for different EUV resist platforms: preparing for a 3300 baseline process

Foubert, Philippe; Matsunaga, Koichi; Shite, Hideo; Shimoaoki, Takeshi; Nafus, Kathleen; Goethals, Mieke; Van Den Heuvel, Dieter; Hermans, Jan; Hendrickx, Eric; Kosugi, Hitoshi (2013)

Simulation of the phosphorus profiles in a c-Si solar cell fabricated using POCl3 diffusion or ion implantation and annealing

Florakis, Antonios; Janssens, Tom; Posthuma, Niels; Delmotte, Joris; Douhard, Bastien; Poortmans, Jef; Vandervorst, Wilfried (2013)

HAXPES study of full high-k/metal gate stacks deposited on Ge substrates

Fleischmann, Claudia; Kalpyris, Ioannis; Conard, Thierry; Adelmann, Christoph; Sioncke, Sonja; Rueff, J.P.; Ablett, J.M.; Vandervorst, Wilfried (2013)

Fundamental aspects of Arn+ SIMS profiling of common organic semiconductors

Fleischmann, Claudia; Conard, Thierry; Havelund, R.; Franquet, Alexis; Poleunis, C.; Voroshazi, Eszter; Delcorte, A.; Vandervorst, Wilfried (2013)

Au-free low temperature ohmic contacts for AlGaN/GaN power devices on 200 mm substrates

Firrincieli, Andrea; De Jaeger, Brice; You, Shuzhen; Wellekens, Dirk; Van Hove, Marleen; Decoutere, Stefaan (2013-09)

Exploration of energy efficient memory organisations for dynamic multimedia applications using system scenarios

Filippopoulos, Iason; Kjeldsberg, Per-Gunnar; Hammari, Elena; Catthoor, Francky; Huisken, Jos (2013)

Process tolerant design of a BAW resonator via acoustic metamaterial engineering

Figeys, Bruno; Nauwelaers, Bart; Tilmans, Harrie; Rottenberg, Xavier (2013)

Shear interface acoustic wave in solids enabled by acoustic metamaterials

Figeys, Bruno; Nauwelaers, Bart; Tilmans, Harrie; Rottenberg, Xavier (2013)

Process tolerant design of BAW resonators via hole engineering

Figeys, Bruno; Jansen, Roelof; Nauwelaers, Bart; Tilmans, Harrie; Rottenberg, Xavier (2013)

Electronic-photonic integration in the Helios project

Fedeli, Jean-Marc; Schrank, Franz; Bogaerts, Wim; Masood, Adil; Zimmermann, Lars; Augendre, E.; Bernabe, S.; Kraft, J.; Grosse, P.; Enot, T. (2013)

Composition variation of In1-xGaxAs epitaxially grown in narrow trenches on Si

Favia, Paola; Richard, Olivier; Geypen, Jef; Waldron, Niamh; Merckling, Clement; Guo, Weiming; Caymax, Matty; Bender, Hugo (2013)

Novel Teeter-Totter 2-Axes MEMS magnetometer with equal sensitivities

Farghaly, Mahmoud; Rochus, Veronique; Rottenberg, Xavier; Mohammed, U.S.; Tilmans, Harrie (2013)

Intrinsic switching variability in HfO2 RRAM: A theoretical and experimental study

Fantini, Andrea; Goux, Ludovic; Degraeve, Robin; Wouters, Dirk; Raghavan, Praveen; Kar, Gouri Sankar; Belmonte, Attilio; Chen, Yangyin; Govoreanu, Bogdan; Jurczak, Gosia (2013)

Correlation between current-voltage measurements and the barrier height determined by XPS in Ge p-MOS capacitors

Fadida, Sivan; Palumbo, F; Nyns, Laura; Lin, Dennis; Van Elshocht, Sven; Caymax, Matty; Eizenberg, Moshe (2013)

Tungsten planarization by gas cluster ion beam with CHF3

Everaert, Jean-Luc; Fernandez, Luis; Vos, Ingrid; Van Ammel, Annemie; Vrancken, Christa; Dekoster, Johan; Burke, Edd; Vancoille, Eric (2013)

Conference contributions: Recent submissions

Composition measurements of thin films beyond the spatial resolution of SIMS ﻿

Reduction of the BTI time-dependent variability in nanoscaled MOSFETs by body bias ﻿

Superior reliability of high mobility (Si)Ge channel pMOSFETs ﻿

Relevance of non-exponential single-defect-induced threshold voltage shifts for NBTI Variability ﻿

Understanding the suppressed charge trapping in relaxed- and strained-Ge/SiO2/HfO2 pMOSFETs and implications for the screening of alternative high-mobility substrate/dielectric CMOS gate stacks ﻿

Track processing optimizations for different EUV resist platforms: preparing for a 3300 baseline process ﻿

Simulation of the phosphorus profiles in a c-Si solar cell fabricated using POCl3 diffusion or ion implantation and annealing ﻿

HAXPES study of full high-k/metal gate stacks deposited on Ge substrates ﻿

Fundamental aspects of Arn+ SIMS profiling of common organic semiconductors ﻿

Au-free low temperature ohmic contacts for AlGaN/GaN power devices on 200 mm substrates ﻿

Exploration of energy efficient memory organisations for dynamic multimedia applications using system scenarios ﻿

Process tolerant design of a BAW resonator via acoustic metamaterial engineering ﻿

Shear interface acoustic wave in solids enabled by acoustic metamaterials ﻿

Process tolerant design of BAW resonators via hole engineering ﻿

Electronic-photonic integration in the Helios project ﻿

Composition variation of In1-xGaxAs epitaxially grown in narrow trenches on Si ﻿

Novel Teeter-Totter 2-Axes MEMS magnetometer with equal sensitivities ﻿

Intrinsic switching variability in HfO2 RRAM: A theoretical and experimental study ﻿

Correlation between current-voltage measurements and the barrier height determined by XPS in Ge p-MOS capacitors ﻿

Tungsten planarization by gas cluster ion beam with CHF3 ﻿