Browsing Articles by imec author "2c6d88fd7c11426b72f66db2093132ee43644808"
Now showing items 1-20 of 38
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11-Megapixel CMOS-integrated SiGe micromirror arrays for high-end applications
Witvrouw, Ann; Haspeslagh, Luc; Varela Pedreira, Olalla; De Coster, Jeroen; De Wolf, Ingrid; Tilmans, Harrie; Bearda, Twan; Schlatmann, Bart; van Bommel, Mark; de Nooijer, Christine; Magnee, P.H.C.; Lous, E.J.; Hagting, Marco; Lauria, John; Vanneer, Roel; van Drieenhuizen, Bert (2010) -
A 5 V-Compatible Flash EEPROM Cell with Microsecond Programming Time for Embedded Memory Applications
Van Houdt, Jan; Wellekens, Dirk; Faraone, Lorenzo; Haspeslagh, Luc; Deferm, Ludo; Groeseneken, Guido; Maes, Herman (1994) -
A flash memory technology with quasi-virtual ground array for low-cost embedded applications
Tsouhlarakis, Jorgo; Vanhorebeek, Guido; Verhoeven, Geert; De Blauwe, Jan; Kim, Shi-Ho; Wellekens, Dirk; Hendrickx, Paul; Haspeslagh, Luc; Van Houdt, Jan; Maes, Herman (2001) -
A highly reliable 3-dimensional integrated SBT ferroelectric capacitor enabling FeRAM scaling
Goux, Ludovic; Russo, G.; Menou, N.; Lisoni, Judit; Schwitters, M.; Paraschiv, Vasile; Maes, David; Artoni, C.; Corallo, G.; Haspeslagh, Luc; Wouters, Dirk; Zambrano, R.; Muller, Ch. (2005-04) -
A new scalable self-aligned dual-bit split-gate charge trapping memory device
Breuil, Laurent; Haspeslagh, Luc; Blomme, Pieter; Wellekens, Dirk; De Vos, Joeri; Lorenzini, Martino; Van Houdt, Jan (2005) -
An in-plane SiGe differential capacitive accelerometer for above-IC integration
Wen, Lianggong; Wouters, Kristof; Haspeslagh, Luc; Witvrouw, Ann; Puers, Bob (2011-07) -
Analytical percolation model for predicting anomalous charge loss in flash memories
Degraeve, Robin; Schuler, Franz; Kaczer, Ben; Lorenzini, Martino; Wellekens, Dirk; Hendrickx, Paul; Van Duuren, Michiel; Dormans, G.J.M.; Van Houdt, Jan; Haspeslagh, Luc; Groeseneken, Guido; Tempel, Georg (2004) -
Characterization of moving bits (MBs) and QBD in wet/dry tunnel oxides for floating gate type nonvolatile memory (FG-NVM) applications
Ackaert, Jan; Lowe, Antony; Boonen, Sylvie; Yao, Thierry; Rayhem, Joseph; Desoete, Bart; Prasad, Jagdish; Thomason, Mike; Van Houdt, Jan; Degraeve, Robin; Haspeslagh, Luc; Hendrickx, Paul (2004) -
Characterization of the spatial charge distribution in local charge-trapping memory devices using the charge-pumping technique
Rosmeulen, Maarten; Breuil, Laurent; Lorenzini, Martino; Haspeslagh, Luc; Van Houdt, Jan; De Meyer, Kristin (2004-09) -
Composition control and ferrolectric properties of sidewalls in three-dimensional SrBi2Ta2O9-based ferroelectric capacitors
Goux, Ludovic; Lisoni, Judit; Schwitters, Michael; Paraschiv, Vasile; Maes, David; Haspeslagh, Luc; Wouters, Dirk; Menou, N.; Turquat, Ch.; Madigou, V.; Muller, Ch.; Zambrano, R. (2005-09) -
Cryogenic readout electronics & technology for FIRST's stressed array
Seijnaeve, Joost; Dierickx, Bart; Scheffer, Danny; Hermans, Lou; Haspeslagh, Luc (1996) -
Development of gated pinned avalanche photodiode pixels for high-speed low-light imaging
Resetar, Tomislav; De Munck, Koen; Haspeslagh, Luc; Rosmeulen, Maarten; Suss, Andreas; Puers, Bob; Van Hoof, Chris (2016) -
Digital pattern generator: an electron-optical MEMS for massively parallel reflective electron beam lithography
Grella, Luca; Carroll, Alan; Murray, Kirk; McCord, Mark A.; Tong, William M.; Brodie, Alan D.; Gubiotti, Thomas; Sun, Fuge; Kidwingira, Francoise; Kojima, Shinichi; Petric, Paul; Bevis, Christopher F.; Vereecke, Bart; Haspeslagh, Luc; Mane, Anil U.; Elam, Jeffrey W. (2013) -
Embedded HIMOS® Flash Memory in 0.35 μm and 0.25 μm CMOS Technologies
Wellekens, Dirk; Van Houdt, Jan; Haspeslagh, Luc; Tsouhlarakis, Jorgo; Hendrickx, Paul; Deferm, Ludo; Maes, Herman (2000) -
Enhanced oxidation of TiAIN barriers integrated in three dimensional ferroelectric capacitor structures
Lisoni, Judit; Johnson, Jo; Goux, Ludovic; Paraschiv, Vasile; Maes, David; Vander Meeren, Hans; Willegems, Myriam; Haspeslagh, Luc; Wouters, Dirk; Caputa, C.; Zambrano, R.; Turquat, Ch.; Muller, Ch. (2007-01) -
Highly reliable micro-mirror arrays: succesful demonstrators of a SiGe above-IC MEMS process
Van Bavel, Mieke; Haspeslagh, Luc; Witvrouw, Ann (2009) -
Impact of tunnel-oxide nitridation on endurance and read-disturb characteristics of flash E2PROM devices
De Blauwe, Jan; Wellekens, Dirk; Van Houdt, Jan; Degraeve, Robin; Haspeslagh, Luc; Groeseneken, Guido; Maes, Herman (1997) -
Improvement of PECVD silicon–germanium crystallization for CMOS compatible MEMS applications
Guo, Bin; Severi, Simone; Bryce, George; Claes, Gert; Van Hoof, Rita; Du Bois, Bert; Haspeslagh, Luc; Witvrouw, Ann; Decoutere, Stefaan (2010) -
Influence of dry-etch patterning of top electrode and SrBi2Ta2O9 on the properties of ferroelectric capacitors
Goux, Ludovic; Paraschiv, Vasile; Lisoni, Judit; Schwitters, Michael; Maes, David; Haspeslagh, Luc; Wouters, Dirk; Casella, P.; Zambrano, R. (2005) -
Integration of ferroelectric SrBi2Ta2O9-based capacitors in 0.35 μm CMOS technology
Lisoni, Judit; Johnson, Jo; Goux, Ludovic; Schwitters, Michael; Paraschiv, Vasile; Maes, David; Haspeslagh, Luc; Caputa, Concetta; Casella, P.; Zambrano, R.; Vecchio, G.; Monchoix, H.; Van Autryve, Luc; Wouters, Dirk (2004)