Browsing Articles by author "Zahid, Mohammed"
Now showing items 1-19 of 19
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A consistent model for oxide trap profiling with the trap spectroscopy by charge injection and sensing (TSCIS) technique
Cho, Moon Ju; Degraeve, Robin; Roussel, Philippe; Govoreanu, Bogdan; Kaczer, Ben; Zahid, Mohammed; Simoen, Eddy; Arreghini, Antonio; Jurczak, Gosia; Van Houdt, Jan; Groeseneken, Guido (2010) -
A novel PEALD tunnel dielectric for three-dimensional non-volatile charge-trapping technology
Cacciato, Antonio; Breuil, Laurent; Dekkers, Harold; Zahid, Mohammed; Kar, Gouri Sankar; Everaert, Jean-Luc; Schoofs, Geert; Shi, Qixian; Van den Bosch, Geert; Jurczak, Gosia; Debusschere, Ingrid; Van Houdt, Jan; Cockburn, Andrew; Date, Lucien; Xa, Li Qun; Le, Maggie; Lee, Won (2011) -
Abrupt breakdown in dielectric/metal gate stacks: a potential reliability limitation?
Kauerauf, Thomas; Degraeve, Robin; Zahid, Mohammed; Cho, Moon Ju; Kaczer, Ben; Roussel, Philippe; Groeseneken, Guido; Maes, Herman; De Gendt, Stefan (2005) -
Applying complementary trap characterization technique to crystalline g-phase-Al2O3 for improved understanding of nonvolatile memory operation and reliability
Zahid, Mohammed; Ruiz Aguado, Daniel; Degraeve, Robin; Wang, W.C; Govoreanu, Bogdan; Toledano Luque, Maria; Afanasiev, V.V.; Van Houdt, Jan (2010) -
Charge pumping spectroscopy: HfSiON defect study after substrate hot electron injection
Toledano-Luque, M.; Pantisano, Luigi; Degraeve, Robin; Zahid, Mohammed; Ferain, Isabelle; San Andres Serrano, Enrique; Groeseneken, Guido; De Gendt, Stefan (2007) -
Detailed analysis of charge pumping and IdVg hysteresis for profiling traps in SiO2/HfSiO(N)
Sahhaf, Sahar; Degraeve, Robin; Cho, Moon Ju; De Brabanter, K.; Roussel, Philippe; Zahid, Mohammed; Groeseneken, Guido (2010-12) -
Effect of high temperature annealing on tunnel oxide properties in TANOS devices
Arreghini, Antonio; Zahid, Mohammed; Van den Bosch, Geert; Suhane, Amit; Breuil, Laurent; Cacciato, Antonio; Van Houdt, Jan (2011) -
Electron trap profiling near Al2O3/ gate interface in TANOS stack using gate-side-trap spectroscopy by charge injection and sensing
Zahid, Mohammed; Arreghini, Antonio; Degraeve, Robin; Govoreanu, Bogdan; Suhane, Amit; Van Houdt, Jan (2010) -
Evaluation and solutions for P/E window instability induced by electron trapping in high-k inter-gate dielectrics of flash memory cells
Tang, Baojun; Zhang, Weidong; Degraeve, Robin; Breuil, Laurent; Blomme, Pieter; Zhang, Jianfu; Ji, Zhigang; Zahid, Mohammed; Toledano Luque, Maria; Van den Bosch, Geert; Van Houdt, Jan (2014) -
Fast VTH transients after the program/erase of flash memory stacks with high-k dielectrics
Toledano Luque, Maria; Degraeve, Robin; Zahid, Mohammed; Kaczer, Ben; Blomme, Pieter; Kittl, Jorge; Jurczak, Gosia; Van Houdt, Jan; Groeseneken, Guido (2011) -
First-principles modeling of intrinsic and extrinsic defects in Gamma-Al2O3
Sankaran, Kiroubanand; Pourtois, Geoffrey; Degraeve, Robin; Zahid, Mohammed; Rignanese, Gian-Marco; Van Houdt, Jan (2010) -
High-k dielectrics for future generation memory devices
Kittl, Jorge; Opsomer, Karl; Popovici, Mihaela Ioana; Menou, Nicolas; Kaczer, Ben; Wang, Xin Peng; Adelmann, Christoph; Pawlak, Malgorzata; Tomida, Kazuyuki; Rothschild, Aude; Govoreanu, Bogdan; Degraeve, Robin; Schaekers, Marc; Zahid, Mohammed; Delabie, Annelies; Meersschaut, Johan; Polspoel, Wouter; Clima, Sergiu; Pourtois, Geoffrey; Knaepen, W.; Detavernier, C.; Afanasiev, Valeri; Blomberg, T.; Pierreux, Dieter; Swerts, Johan; Fischer, Pamela; Maes, Jan; Manger, Dirk; Vandervorst, Wilfried; Conard, Thierry; Franquet, Alexis; Favia, Paola; Bender, Hugo; Brijs, Bert; Van Elshocht, Sven; Jurczak, Gosia; Van Houdt, Jan; Wouters, Dirk (2009) -
Hydrogen induced positive charge in Hf-based dielectrics
Zhao, C.Z.; Zhang, J.F.; Zahid, Mohammed; Efthymiou, E.; Lu, Y.; Hall, S.; Peaker, A.R.; Groeseneken, Guido; Pantisano, Luigi; Degraeve, Robin; De Gendt, Stefan; Heyns, Marc (2007) -
Impact of different defects on the kinetics of Negative Bias Temperature Instability of Hafnium stacks
Zhang, J.F.; Zhao, C.Z.; Chang, M.H.; Zahid, Mohammed; Peaker, A.R.; Hall, S; Groeseneken, Guido; Pantisano, Luigi; De Gendt, Stefan; Heyns, Marc (2008) -
Impact of process conditions on interface and high-k trap density studied by variable Tcharge-Tdischarge charge pumping (VT2CP)
Zahid, Mohammed; Degraeve, Robin; Zhang, John; Groeseneken, Guido (2007-09) -
New developments in charge pumping measurements on thin stacked dielectrics
Toledano-Luque, Maria; De Gendt, Stefan; Groeseneken, Guido; Zahid, Mohammed; Pantisano, Luigi; Degraeve, Robin; San Andres, Enrique (2008) -
Properties and dynamic behavior of electron traps in HfO2/SiO2 stacks
Zhao, C.Z.; Zahid, Mohammed; Zhang, John; Groeseneken, Guido; Degraeve, Robin; De Gendt, Stefan (2005-06) -
Understanding the potential and limitations of the HfAlO as interpoly dielectric in floating gate flash memory
Govoreanu, Bogdan; Degraeve, Robin; Zahid, Mohammed; Nyns, Laura; Cho, Moon Ju; Kaczer, Ben; Jurczak, Gosia; Kittl, Jorge; Groeseneken, Guido (2009) -
Validation of retention modeling as a trap-profiling technique for SiN-based charge-trapping memories
Suhane, Amit; Arreghini, Antonio; Degraeve, Robin; Van den Bosch, Geert; Breuil, Laurent; Zahid, Mohammed; Jurczak, Gosia; De Meyer, Kristin; Van Houdt, Jan (2010)