Browsing Articles by imec author "823a379c6cab91e5056929f33191723c3b43ad66"
Now showing items 1-20 of 43
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A Bottom-Up Volume Reconstruction Method for Atom Probe Tomography
Cools, Sigfried; Ling, Yu Ting; Bogdanowicz, Janusz; Fleischmann, Claudia; De Beenhouwer, Jan; Sijbers, Jan; Vandervorst, Wilfried (2022) -
A compact vibration reduced set-up for scanning nm-XRF and STXM
Lubeck, Janin; Seim, Christian; Dehlinger, Aurelie; Haidl, Andreas; Hoenicke, Philipp; Kayser, Yves; Unterumsberger, Rainer; Fleischmann, Claudia; Beckhoff, Burkhard (2018) -
A correlative ToF-SIMS/SPM methodology for probing 3D devices
Spampinato, Valentina; Dialameh, Masoud; Franquet, Alexis; Fleischmann, Claudia; Conard, Thierry; van der Heide, Paul; Vandervorst, Wilfried (2020) -
A scheme to correct for inaccuracies in the compositional analysis of SixGe1-x by Atom Probe Tomography
Dialameh, Masoud; Scheerder, Jeroen; Morris, Richard; Meersschaut, Johan; Richard, Olivier; Vandervorst, Wilfried; van der Heide, Paul; Fleischmann, Claudia (2021) -
Adsorption of O2 on Ge(100): Atomic geometry and site-specific electronic structure
Fleischmann, Claudia; Schouteden, K.; Merckling, Clement; Sioncke, Sonja; Meuris, Marc; Van Haesendonck, C.; Temst, K.; Vantomme, A. (2012) -
Amorphous gadolinium aluminate as a dielectric and sulfur for indium phosphide passivation
van Dorp, Dennis; Nyns, Laura; Cuypers, Daniel; Ivanov, Tsvetan; Brizzi, Simone; Tallarida, Massimo; Fleischmann, Claudia; Hönicke, Philipp; Müller, Matthias; Richard, Olivier; Schmeisser, Dieter; De Gendt, Stefan; Lin, Dennis; Adelmann, Christoph (2019) -
APT tip shape modifications during analysis, its implications, and the potential to measure tip shapes in real time via soft-X-ray ptychography
van der Heide, Paul; Makhotkin, Igor; Vandervorst, Wilfried; Fleischmann, Claudia (2019) -
Atom probe tomography analysis of SiGe fins embedded in SiO2: facts and artefacts
Melkonyan, Davit; Fleischmann, Claudia; Arnoldi, Laurent; Demeulemeester, Jelle; Kumar, Arul; Bogdanowicz, Janusz; Vurpillot, Francois; Vandervorst, Wilfried (2017) -
Atom probe tomography for advanced nanoelectronic devices: current status and perspectives
Barnes, J.P.; Grenier, A.; Mouton, I.; Barraud, S; Audoit, G.; Bogdanowicz, Janusz; Fleischmann, Claudia; Melkonyan, Davit; Vandervorst, Wilfried; Duguay, S.; Roland, N.; Vurpillot, F; Blavette, D (2018) -
Atomic layer deposition of high-k dielectrics on sulphur-passivated germanium
Sioncke, Sonja; Lin, Dennis; Nyns, Laura; Brammertz, Guy; Delabie, Annelies; Conard, Thierry; Franquet, Alexis; Meuris, Marc; Struyf, Herbert; De Gendt, Stefan; Heyns, Marc; Fleischmann, Claudia; Temst, Kristiaan; Vantomme, Andre; Muller, Matthias; Kobe, Michael; Beckhoff, Burkhard; Caymax, Matty (2011) -
Automated calibration of model-driven reconstructions in atom probe tomography
Fletcher, Charles; Moody, Michael P.; Fleischmann, Claudia; Dialameh, Masoud; Porret, Clément; Geiser, Brian; Haley, Daniel (2022) -
Bipolar device fabrication using a scanning tunnelling microscope
Skeren, Tomas; Koester, Sigrun; Douhard, Bastien; Fleischmann, Claudia; Fuhrer, Andreas (2020) -
Characterization of high-k nanolayers by grazing incidence X-ray spectrometry
Müller, Matthias; Hönicke, Philipp; Detlefs, Blanka; Fleischmann, Claudia (2014) -
Characterization of semiconductor samples using synchrotron radiation-based near-field infrared microscopy and nano-FTIR spectroscopy
Hermann, Peter; Hoehl, Arne; Ulrich, Georg; Fleischmann, Claudia; Hermelink, Antje; Kästner, Bernd; Patoka, Piotr; Hornemann, Andrea; Beckhoff, Burkhard; Rühl, Eckart; Ulm, Gerhard (2014) -
Development and synchrotron-based characterization of Al and Cr nanostructures as potential calibration samples for 3D analytical techniques
Dialameh, Masoud; Ferrarese Lupi, Federico; Hönicke, Philipp; Kayser, Yves; Beckhoff, Burkhard; Weimann, Thomas; Fleischmann, Claudia; Vandervorst, Wilfried; Dub "cek, Pavo; Pivac, Branko; Perego, Michele; Seguini, Gabriele; De Leo, Natascia; Boarino, Luca (2018) -
Dopant, composition and carrier profiling for 3D-structures
Vandervorst, Wilfried; Fleischmann, Claudia; Bogdanowicz, Janusz; Celano, Umberto; Paredis, Kristof; Budrevich, A (2017) -
Field dependent study on the impact of co-evaporated multihits and ion pile-up for the apparent stoichiometric quantification of GaN and AlN
Morris, Richard; Cuduvally, Ramya; Lin, Jhao-Rong; Zhao, Ming; Vandervorst, Wilfried; Thuvander, Mattias; Fleischmann, Claudia (2022-11) -
Fundamental aspects of Arn+ SIMS profiling of common organic semiconductors
Fleischmann, Claudia; Conard, Thierry; Havelund, Rasmus; Franquet, Alexis; Poleunis, Claude; Voroshazi, Eszter; Delcorte, Arnaud; Vandervorst, Wilfried (2014) -
G-SIMS analysis of organic solar cell materials
Franquet, Alexis; Fleischmann, Claudia; Conard, Thierry; Voroshazi, Eszter; Poleunis, Claude; Havelund, Rasmus; Delcorte, Arnaud; Vandervorst, Wilfried (2014) -
Grain-boundary segregation of magnesium in doped cuprous oxide and impact on electrical transport properties
Resende, Joao; Van-Son Nguyen; Fleischmann, Claudia; Bottiglieri, Lorenzo; Brochen, Stephane; Vandervorst, Wilfried; Favre, Wilfried; Jimenez, Carmen; Deschanvres, Jean-Luc; Ngoc Duy Nguyen (2021)