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Browsing by Author "Jiang, Sijia"

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    6.1 family: the next generation of III-V semiconductors for advanced CMOS applications: epitaxial growth and passivation challenges

    Merckling, Clement  
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    Alian, AliReza  
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    Firrincieli, Andrea  
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    Jiang, Sijia
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    Cantoro, Mirco
    Meeting abstract
    2012, AVS 59th Annual International Symposium and Exhibition, 28/10/2012
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    Defect distribution in InP epitaxially grown in nano-trenches on off-axis Si substrates

    Bender, Hugo  
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    Richard, Olivier  
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    Jiang, Sijia
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    Merckling, Clement  
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    Loo, Roger  
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    Caymax, Matty  
    Proceedings paper
    2012, 15th European Microscopy Congress, 16/09/2012
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    Defect formation in III-V fin grown by aspect ratio trapping technique: a first-principles study

    Minari, Hideki
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    Yoshida, Shinichi
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    Sawada, Ken
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    Nakazawa, Masashi
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    Pourtois, Geoffrey  
    Proceedings paper
    2014, IEEE International Reliability Physics Symposium - IRPS, 1/06/2014, p.PI.2
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    Evolution of (001) and (111) facets for selective epitaxial growth inside Submicron trenches

    Jiang, Sijia
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    Merckling, Clement  
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    Guo, Weiming
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    Waldron, Niamh  
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    Caymax, Matty  
    Journal article
    2014, Journal of Applied Physics, (115) 2, p.23517
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    First-principles studies of the defect formation in III-V FETs grown by aspect ratio trapping

    Minari, Hideki
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    Yoshida, Shinichi
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    Sawada, Ken
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    Nakazawa, Masashi
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    Caymax, Matty  
    Meeting abstract
    2014, 226th Meeting of The Electrochemical Society, 5/10/2014, p.1646
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    First-principles studies of the defect formation in III-V FETs grown by aspect ratio trapping

    Minari, Hideki
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    Yoshida, Shinichi
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    Sawada, Ken
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    Nakazawa, Masashi
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    Merckling, Clement  
    Proceedings paper
    2014, High Purity and High Mobility Semiconductors 13, 5/10/2014, p.111-123
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    Growth rate for the SEG of III-V compounds inside submicron STI trenches on Si (001) substrates by MOVPE: modeling and experiments

    Jiang, Sijia
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    Merckling, Clement  
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    Guo, Weiming
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    Waldron, Niamh  
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    Caymax, Matty  
    Journal article
    2014, Journal of Crystal Growth, 391, p.59-63
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    Heteroepitaxy of III-V compound semiconductors on Si for logic applications: Selective area epitaxy in shallow trench isolation structures vs direct epitaxy mediated by strain relaxed buffers

    Cantoro, Mirco
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    Merckling, Clement  
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    Jiang, Sijia
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    Guo, Weiming
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    Waldron, Niamh  
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    Bender, Hugo  
    Meeting abstract
    2012, ECS 222nd Fall Meeting, 7/10/2012, p.3138
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    Heteroepitaxy of III-V compound semiconductors on Si for logic applications: selective area epitaxy in shallow trench isolation structures vs direct epitaxy mediated by strain relaxed buffers

    Cantoro, Mirco
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    Merckling, Clement  
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    Jiang, Sijia
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    Guo, Weiming
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    Waldron, Niamh  
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    Bender, Hugo  
    Proceedings paper
    2012, SiGe, Ge, and Related Compunds 5: Materials, Processing, and Devices, 7/10/2012, p.349-355
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    Heteroepitaxy of InP on Si(001) in sub-50nm width trenches by Selective-Area Metalorganic Vapor-Phase Epitaxy: the role of the nucleation layer and the recess engineering

    Merckling, Clement  
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    Waldron, Niamh  
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    Jiang, Sijia
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    Guo, Weiming
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    Collaert, Nadine  
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    Caymax, Matty  
    Journal article
    2014-01, Journal of Applied Physics, (115) 2, p.23710
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    Influence of chemical treatments on selective epitaxial growth of InP in STI nano-trenches on Si (001) substrates

    Jiang, Sijia
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    Merckling, Clement  
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    Waldron, Niamh  
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    Vandervorst, Wilfried  
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    Caymax, Matty  
    Meeting abstract
    2012, E-MRS Spring Meeting Symposium M: More than Moore, 14/05/2012
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    Influence of trench width on III-V nucleation during InP selective area growth on pattern Si(001) substrate

    Jiang, Sijia
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    Merckling, Clement  
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    Guo, Weiming
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    Waldron, Niamh  
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    Moussa, Alain  
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    Caymax, Matty  
    Meeting abstract
    2014, ECS and SMEQ Joint International Meeting, 5/10/2014
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    Influence of trench width on III-V nucleation during InP selective area growth on patterned Si(001) substrates

    Jiang, Sijia
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    Merckling, Clement  
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    Moussa, Alain  
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    Guo, Weiming
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    Waldron, Niamh  
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    Collaert, Nadine  
    Proceedings paper
    2014, SiGe, Ge, and Related Compounds 6: Materials, Processing, and Devices, 5/10/2014, p.501-511
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    Monolithic integration of Ge and III-V compound semiconductors on 300mm Si for CMOS

    Caymax, Matty  
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    Loo, Roger  
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    Merckling, Clement  
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    Guo, Weiming
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    Jiang, Sijia
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    Heyns, Marc  
    Meeting abstract
    2014, E-MRS Spring Meeting Symposium: Materials Research for Group IV Semiconductors, 26/05/2014
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    Monolithic integration of III-V semiconductors by selective area growth on Si(001) substrate: epitaxy challenges & applications

    Merckling, Clement  
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    Jiang, Sijia
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    Liu, Ziyang
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    Waldron, Niamh  
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    Boccardi, Guillaume  
    Proceedings paper
    2015, Silicon Compatible Materials, Processes, and Technologies for Advanced Integrated Circuits and Emerging Applications 5, 24/05/2015, p.107-116
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    N-type and p-type ultra shallow junctions by atomic layer epitaxy and laser anneal

    Nguyen, N.D.
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    Souriau, Laurent  
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    Shimizu, Y.
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    Jiang, Sijia
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    Rosseel, Erik  
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    Everaert, Jean-Luc
    Oral presentation
    2011, 7th International Conference on Silicium Epitaxy and Heterostructures - ICSI-7
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    Nucleation behavior of III/V crystal selectively grown inside nano-trenches: the influence of trench width

    Jiang, Sijia
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    Merckling, Clement  
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    Moussa, Alain  
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    Waldron, Niamh  
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    Caymax, Matty  
    Journal article
    2015, ECS Journal of Solid State Science and Technology, (4) 7, p.N83-N87
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    Selective area growth of III/V compounds on Si substrates using metal-organic vapor phase epitaxy

    Jiang, Sijia
    PHD thesis
    2015-11
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    Selective area growth of InP in shallow trench isolation (STI) on large scale Si(001) wafer using defect confinement technique

    Merckling, Clement  
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    Waldron, Niamh  
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    Jiang, Sijia
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    Guo, Weiming
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    Richard, Olivier  
    Journal article
    2013, Journal of Applied Physics, (114) 3, p.33708
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    Selective-area metal organic vapor-phase epitaxy of InGaAs/InP heterostructures on Si for advanced CMOS devices

    Merckling, Clement  
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    Waldron, Niamh  
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    Jiang, Sijia
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    Guo, Weiming
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    Ryan, Paul
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    Collaert, Nadine  
    Proceedings paper
    2014, Dielectrics for Nanosystems 6: Materials Science, Processing, Reliability and Manufacturing, 11/05/2014, p.107-112
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