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Browsing by Author "Sinapi, Fabrice"

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    A high-reliable Cu/ULK integration scheme using Metal Hard Mask and Low-k capping film

    Travaly, Youssef
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    Tsutsue, M.
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    Ikeda, Atsushi
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    Verdonck, Patrick  
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    Tokei, Zsolt  
    Oral presentation
    2007, Advanced Metallization Conference: 17th Asian Session
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    CMP of a RU based layer in an advanced Cu low-k stack

    Vaes, Jan
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    Sinapi, Fabrice
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    Hernandez, Jose Luis  
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    Santoro, Gaetano  
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    Nguyen, Olivier
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    Wang, James
    Proceedings paper
    2007-10, International Conference on Planarization CMP Technology - ICPT, 25/10/2007, p.43-48
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    Highly reliable Cu/ULK integratrion scheme using MHM and low-k capping film

    Tsutsue, Makoto
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    Travaly, Youssef
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    Ikeda, Atsushi
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    Tokei, Zsolt  
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    Willegems, Myriam  
    Oral presentation
    2007, Advanced Metallization Conference - AMC
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    Impact of ceria properties and CMP parameters on STI CMP performance

    De Messemaeker, Jo
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    Sinapi, Fabrice
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    Ong, Patrick  
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    Put, Stijn
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    Nelis, Daniel
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    Van den bosch, Jeroen  
    Proceedings paper
    2007, Lake Placid CMP Meeting, 13/08/2007
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    Impact of ceria properties and CMP parameters on STI CMP performance

    De Messemaeker, Jo
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    Put, Stijn
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    Nelis, Daniel
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    Van den bosch, Jeroen  
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    Strauven, Yvan
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    Lippens, Paul
    Proceedings paper
    2007, International Conference on Planarization/CMP Technology - ICPT, 25/10/2007, p.303-308
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    Impact of direct CMP on surface and bulk properties of high porosity low-k materials

    Heylen, Nancy  
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    Sinapi, Fabrice
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    Travaly, Youssef
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    Vereecke, Guy  
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    Baklanov, Mikhaïl
    Proceedings paper
    2007, Advanced Metallization Conference 2006, 17/10/2006, p.549-563
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    Influence of pH on the channel cracking rate of organosilicate films in wet ambients

    Iacopi, Francesca
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    Elia, Carmine
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    Fournier, Teddy
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    Sinapi, Fabrice
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    Heylen, Nancy  
    Oral presentation
    2007, European Congress and Exhibition on Advanced Materials and Processes - Euromat
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    Influence of ultra low-k material properties on post direct CMP damage

    Sinapi, Fabrice
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    Travaly, Youssef
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    Heylen, Nancy  
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    Vereecke, Guy  
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    Baklanov, Mikhaïl
    Meeting abstract
    2007, Advanced Metallization Conference - AMC, 9/10/2007
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    Materials characterization of WNxCy, WNx and WCx films for advanced barriers

    Volders, Henny  
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    Tokei, Zsolt  
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    Bender, Hugo  
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    Brijs, Bert
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    Caluwaerts, Rudy  
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    Carbonell, Laure
    Journal article
    2007, Microelectronic Engineering, (84) 11, p.2441-2465
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    Stress-corrosion of organosilicate glass films in aqueous environments: role of pH

    Iacopi, Francesca
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    Elia, Carmine
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    Fournier, Teddy
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    Sinapi, Fabrice
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    Travaly, Youssef
    Journal article
    2008, Journal of Materials Research, (23) 3
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    Surface properties restoration and passivation of high porosity ultra low-k dielectric (k~2.3) after direct-CMP

    Sinapi, Fabrice
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    Heylen, Nancy  
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    Travaly, Youssef
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    Vereecke, Guy  
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    Baklanov, Mikhaïl
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    Kesters, Els  
    Journal article
    2007, Microelectronic Engineering, (84) 11, p.2620-2623
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    The critical role of the metal / porous low-k interface in post direct CMP defectivity generation and resulting ULK surface and bulk hydrophilisation

    Travaly, Youssef
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    Sinapi, Fabrice
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    Heylen, Nancy  
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    Humbert, Aurelie  
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    Delande, Tinne  
    Proceedings paper
    2007, IEEE International Interconnect Technology Conference - IITC, 4/06/2007, p.164-166
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    Thin film characterization of PEALD Ru layers on an ALD WNC substrate

    Volders, Henny  
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    Tokei, Zsolt  
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    Sinapi, Fabrice
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    Bender, Hugo  
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    Benedetti, Alessandro
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    Brijs, Bert
    Proceedings paper
    2007, Advanced Metallization Conference 2006 - AMC 2006, 17/10/2006, p.227-232

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