Browsing by author "Wostyn, Kurt"

A novel test and analysis scheme to elucidate tail bit characteristics in STT-MRAM arrays

Kim, Woojin; Pica, Valerio; Jossart, Nico; Yasin, Farrukh; Wostyn, Kurt; Couet, Sebastien; Rao, Siddharth (2024)

A record GmSAT/SSSAT and PBTI reliability in Si-passivated Ge nFinFETs by improved gate stack surface preparation

Arimura, Hiroaki; Cott, Daire; Boccardi, Guillaume; Loo, Roger; Wostyn, Kurt; Brus, Stephan; Capogreco, Elena; Opdebeeck, Ann; Witters, Liesbeth; Conard, Thierry; Suhard, Samuel; van Dorp, Dennis; Kenis, Karine; Ragnarsson, Lars-Ake; Mitard, Jerome; Holsteyns, Frank; De Heyn, Vincent; Mocuta, Dan; Collaert, Nadine; Horiguchi, Naoto (2019-06)

Acoustic cleaning in nano-electronics

Mertens, Paul; Janssens, Tom; Holsteyns, Frank; Zijlstra, Aaldert; Halder, Sandip; Wostyn, Kurt; Andreas, Michael; Hoyer, Ronald; Barbagini, Francesca; Wada, Masayuki; Franklin, Cole; Kim, Tae-Gon; Kim, K; Kenis, Karine; Le, Quoc Toan; Claes, Martine; Kesters, Els; Vos, Rita; Vereecke, Guy; Bearda, Twan; Heyns, Marc (2008)

Addressing Key Challenges for SiGe-pFin Technologies: Fin Integrity, Low-D-IT Si-cap-free Gate Stack and Optimizing the Channel Strain

Arimura, Hiroaki; Capogreco, Elena; Wostyn, Kurt; Eneman, Geert; Ragnarsson, Lars-Ake; Brus, Stephan; Baudot, Sylvain; Peter, Antony; Schram, Tom; Favia, Paola; Richard, Olivier; Bender, Hugo; Mitard, Jerome; Horiguchi, Naoto (2020)

ALD-Al2O3 passivation for solar cells : high temperature stability

Rothschild, Aude; Penaud, Julien; Jaffrennou, Périne; Wostyn, Kurt; Vermang, Bart; John, Joachim; Poortmans, Jef (2011)

Analyzing the collapse force determined using lateral force AFM using

Wostyn, Kurt; Kim, Tae-Gon; Park, Jin-Goo; Mertens, Paul (2008)

Analyzing the collapse force determined using lateral force AFM using mechanics theory

Wostyn, Kurt; Kim, Tae-Gon; Park, Jin-Goo; Mertens, Paul (2008)

Analyzing the collapse force of narrow lines measured by lateral force AFM using an analytical mechanical model

Wostyn, Kurt; Kim, Tae-Gon; Mertens, Paul; Park, Jin-Goo (2009)

Catalyst assisted low temperature pre epitaxial cleaning for Si and SiGe surfaces

Dhayalan, Sathish Kumar; Loo, Roger; Hikavyy, Andriy; Rosseel, Erik; Wostyn, Kurt; Kenis, Karine; Shimura, Yosuke; Profijt, Harald; Maes, Jan; Douhard, Bastien; Vandervorst, Wilfried (2015)

Challenges and opportunities for vertical nanowire FETs: device design and fabrication

Veloso, Anabela; Matagne, Philippe; Huynh Bao, Trong; Eneman, Geert; Loo, Roger; Wostyn, Kurt; Brus, Stephan; Boemmels, Juergen; Mocuta, Dan; Ryckaert, Julien (2018)

Characterization of epitaxial Si:C:P and SI:P layers for source/drain formation in advanced bulk FinFETs

Rosseel, Erik; Profijt, Harald; Hikavyy, Andriy; Tolle, John; Kubicek, Stefan; Mannaert, Geert; L'abbe, Caroline; Wostyn, Kurt; Horiguchi, Naoto; Clarysse, Trudo; Parmentier, Brigitte; Dhayalan, Sathish Kumar; Bender, Hugo; Maes, Jan; Mehta, Sandeep; Loo, Roger (2014-10)

Characterization of epitaxial Si:C:P and Si:P layers for source/drain formation in advanced bulk finFETs

Rosseel, Erik; Profijt, Harald; Hikavyy, Andriy; Tolle, John; Kubicek, Stefan; Mannaert, Geert; L'abbe, Caroline; Wostyn, Kurt; Horiguchi, Naoto; Clarysse, Trudo; Parmentier, Brigitte; Dhayalan, Sathish Kumar; Bender, Hugo; Maes, Jan Willem; Loo, Roger (2014-10)