Browsing by author "Czarnecki, Piotr"
Now showing items 1-20 of 33
-
Air gap-based MEMS switch technology using nickel surface micromachining
Ekkels, Phillip; Rottenberg, Xavier; Czarnecki, Piotr; Philipsen, Harold; Mertens, Robert; Puers, Bob; Tilmans, Harrie (2011) -
An electrostatic fringing-field actuator (EFFA): application towards a low-complexity thin-film RF-MEMS technology
Rottenberg, Xavier; Brebels, Steven; Ekkels, Phillip; Czarnecki, Piotr; Nolmans, Philip; Mertens, Robert; Nauwelaers, Bart; Puers, Bob; De Wolf, Ingrid; De Raedt, Walter; Tilmans, Harrie (2007-07) -
Assessment of dielectric charging in capacitive MEMS switches fabricated on Si substrate with thin oxide film
Birmpiliotis, Dimitrios; Czarnecki, Piotr; Koutsoureli, Matroni; Papaioannou, George; De Wolf, Ingrid (2016) -
Behavior of RF MEMS switches under ESD stress
Sangameswaran, Sandeep; De Coster, Jeroen; Cherman, Vladimir; Czarnecki, Piotr; Linten, Dimitri; Scholz, Mirko; Thijs, Steven; Groeseneken, Guido; De Wolf, Ingrid (2010) -
Consistent analytical model for single and dual thickness capacitive micromachined ultrasound transducers (cMUT)
Rottenberg, Xavier; Erismis, Mehmet Akif; Czarnecki, Piotr; Helin, Philippe; Verbist, Agnes; Tilmans, Harrie (2012) -
Effect of substrate charging on the reliability of capacitive RF MEMS switches
Czarnecki, Piotr; Rottenberg, Xavier; Soussan, Philippe; Ekkels, Phillip; Muller, Philippe; Nolmans, Philip; De Raedt, Walter; Tilmans, Harrie; Puers, Bob; Marchand, Laurent; De Wolf, Ingrid (2009) -
Electromigration-driven void nucleation and growth in 30nm wide Cu line: Metal cap impact on interfacial Cu diffusion
Kirimura, Tomoyuki; Croes, Kristof; Siew, Yong Kong; Vanstreels, Kris; Czarnecki, Piotr; El-Mekki, Zaid; van der Veen, Marleen; Dictus, Dries; Yoon, A.; Kolics, A.; Boemmels, Juergen; Tokei, Zsolt (2013) -
Electrostatic fringing-field actuator (EFFA): application towards a low-complexity RF-MEMS technology
Rottenberg, Xavier; Nolmans, Philip; Ekkels, Phillip; Czarnecki, Piotr; Mertens, Robert; Nauwelaers, Bart; De Wolf, Ingrid; De Raedt, Walter; Tilmans, Harrie (2007-01) -
ENDORFINS: Enabling deployment of RF MEMS technology in space telecommunication
Czarnecki, Piotr; Soussan, Philippe; Rottenberg, Xavier; Muller, Philippe; Nolmans, Philip; Ekkels, Phillip; De Raedt, Walter; Tilmans, Harrie; Puers, Bob; Vendier, Olivier; Marchand, Laurent; De Wolf, Ingrid (2007) -
Evidences of oxygen-mediated resistive-switching mechanism in TiN\HfO2\Pt cells
Goux, Ludovic; Czarnecki, Piotr; Chen, Yangyin; Pantisano, Luigi; Wang, XinPeng; Degraeve, Robin; Govoreanu, Bogdan; Jurczak, Gosia; Wouters, Dirk; Altimime, Laith (2010) -
Experimental evidence of non-uniform dielectric charging in capacitive RF-MEMS switches
Czarnecki, Piotr; Rottenberg, Xavier; Soussan, Philippe; Nolmans, Philip; Ekkels, Phillip; Muller, Philippe; Tilmans, Harrie; De Raedt, Walter; Puers, Bob; Marchand, Laurent; De Wolf, Ingrid (2007-09) -
Failure mechanisms and reliability issues of RF-MEMS switches
De Wolf, Ingrid; Czarnecki, Piotr; Jourdain, Anne; Kalicinski, Stanislaw; Modlinski, Robert; Muller, Philippe; Rottenberg, Xavier; Soussan, Philippe; Tilmans, Harrie (2005) -
Generic RF-MEMS technology platform for mobile and satellite communications
Tilmans, Harrie; Rottenberg, Xavier; Soussan, Philippe; Nolmans, Philip; Ekkels, Phillip; Czarnecki, Piotr; Modlinski, Robert; Stoukatch, Serguei; Jourdain, Anne; Nauwelaers, Bart; Vaesen, Kristof; Carchon, Geert; De Wolf, Ingrid; De Raedt, Walter (2005) -
Impact of biasing scheme and environment conditions on the lifetime of RF-MEMS capacitive switches
Czarnecki, Piotr; Rottenberg, Xavier; Puers, Bob; De Wolf, Ingrid (2005) -
In-situ SEM observation of electromigration-induced void growth in 30nm ½ pitch Cu interconnect structures
Vanstreels, Kris; Czarnecki, Piotr; Kirimura, Tomoyuki; Siew, Yong Kong; De Wolf, Ingrid; Boemmels, Juergen; Tokei, Zsolt; Croes, Kristof (2014) -
In-situ SEM observation of electromigration-induced void growth in 30nm ½ pitch Cu interconnect structures
Vanstreels, Kris; Czarnecki, Piotr; Kirimura, Tomoyuki; Siew, Yong Kong; Tokei, Zsolt; Boemmels, Juergen; Croes, Kristof (2013) -
Influence of the substrate on the lifetime of capacitive RF MEMS switches
Czarnecki, Piotr; Rottenberg, Xavier; Soussan, Philippe; Ekkels, Phillip; Muller, Philippe; Nolmans, Philip; De Raedt, Walter; Tilmans, Harrie; Puers, Bob; Marchand, Laurent; De Wolf, Ingrid (2008-01) -
Metal-bonded, hermetic 0-level package for MEMS
Pham, Nga; Limaye, Paresh; Czarnecki, Piotr; Varela Pedreira, Olalla; Cherman, Vladimir; Sabuncuoglu Tezcan, Deniz; Tilmans, Harrie (2010) -
Modal analysis based equivalent circuit model and its verification for a single cMUT cell
Mao, Shengping; Rottenberg, Xavier; Rochus, Veronique; Czarnecki, Piotr; Helin, Philippe; Severi, Simone; Nauwelaers, Bart; Tilmans, Harrie (2017) -
Modeling of ferroelectric micro-cantilever actuator
Nguyen, Binh; Czarnecki, Piotr; Zunic, Maja; Brondani Torri, Guilherme; Rochus, Veronique (2023)