Browsing by author "Kukner, Halil"
Now showing items 1-20 of 21
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Bias temperature instability analysis in SRAM decoder
Khan, Seyab; Hamdioui, Said; Kukner, Halil; Raghavan, Praveen; Catthoor, Francky (2013) -
Bias temperature instability analysis of FinFET based SRAM cells
Khan, Seyab; Agbo, Innocent; Hamdioui, Said; Kukner, Halil; Kaczer, Ben; Raghavan, Praveen; Catthoor, Francky (2014) -
Bias Temperature Instability in CMOS Digital Circuits from Planar to FinFET Nodes
Kukner, Halil (2015-04) -
BTI impact on logical gates in nano-scale CMOS technology
Kukner, Halil; Khan, Seyab; Hamdioui, Said; Raghavan, Praveen; Catthoor, Francky (2012) -
BTI reliability from planar to FinFET nodes: Will the next node be more or less reliable?
Kukner, Halil; Weckx, Pieter; Raghavan, Praveen; Kaczer, Ben; Jang, Doyoung; Catthoor, Francky; Van der Perre, Liesbet; Lauwereins, Rudy; Groeseneken, Guido (2014) -
Comparison of reaction-diffusion and atomistic trap-based BTI models for logic gates
Kukner, Halil; Khan, Seyab; Weckx, Pieter; Raghavan, Praveen; Hamdioui, Said; Kaczer, Ben; Catthoor, Francky; Van der Perre, Liesbet; Lauwereins, Rudy; Groeseneken, Guido (2014) -
Defect-based methodology for workload-dependent circuit lifetime projections – application to SRAM
Weckx, Pieter; Kaczer, Ben; Toledano Luque, Maria; Grasser, Tibor; Roussel, Philippe; Kukner, Halil; Raghavan, Praveen; Catthoor, Francky; Groeseneken, Guido (2013) -
Degradation analysis of datapath logic subblocks under NBTI aging in FinFET technology
Kukner, Halil; Khatib, Moustafa; Morrison, Sebastien; Weckx, Pieter; Raghavan, Praveen; Kaczer, Ben; Catthoor, Francky; Van der Perre, Liesbet; Lauwereins, Rudy; Groeseneken, Guido (2014) -
Estimation of sense amplifier offset voltage degradation due to zero- and run-time variability
Agbo, Innocent; Taouil, Motta; Kraak, Daniel; Hamdioui, Said; Kukner, Halil; Weckx, Pieter; Raghavan, Praveen; Catthoor, Francky (2017) -
Impact of duty factor, stress stimuli, and gate drive strength on gate delay degradation with an atomistic trap-based BTI model
Kukner, Halil; Weckx, Pieter; Raghavan, Praveen; Kaczer, Ben; Catthoor, Francky; Van der Perre, Liesbet; Lauwereins, Rudy; Groeseneken, Guido (2012) -
Impact of duty factor, stress stimuli, gate and drive strength on gate delay degradation with an atomistic trap-based BTI model
Kukner, Halil; Weckx, Pieter; Raghavan, Praveen; Kaczer, Ben; Catthoor, Francky; Van der Perre, Liesbet; Lauwereins, Rudy; Groeseneken, Guido (2013) -
Impact of partial resistive defects and bias temperature instability on SRAM decoder reliability
Khan, Seyab; Taouil, Mottaqiallah; Hamdioui, Said; Kukner, Halil; Raghavan, Praveen; Catthoor, Francky (2013) -
Incorporating parameter variations in BTI impact on nano-scale logical gate analysis
Khan, Seyab; Hamdioui, Said; Kukner, Halil; Raghavan, Praveen; Catthoor, Francky (2012) -
Integral Impact of BTI, PVT-variation and Workload on SRAM Sense Amplifier
Agbo, Innocent; Taouil, Motta; Kraak, Daniel; Hamdioui, Said; Kukner, Halil; Weckx, Pieter; Raghavan, Praveen; Catthoor, Francky (2017) -
Modelling and mitigation of time-zero variability in sub-16nm FinFET-based STT-MRAM memories
Hartmann, Matthias; Kukner, Halil; Agrawal, Prashant; Raghavan, Praveen; Van der Perre, Liesbet; Dehaene, Wim (2014) -
NBTI aging on 32-bit adders in the downscaling planar FET technology nodes
Kukner, Halil; Weckx, Pieter; Morrison, Sebastien; Raghavan, Praveen; Kaczer, Ben; Catthoor, Francky; Van der Perre, Liesbet; Lauwereins, Rudy; Groeseneken, Guido (2014) -
Non-Monte-Carlo methodology for high-sigma simulations of circuits under workload-dependent BTI degradation – application to 6T SRAM
Weckx, Pieter; Kaczer, Ben; Kukner, Halil; Roussel, Philippe; Raghavan, Praveen; Catthoor, Francky; Groeseneken, Guido (2014) -
Scaling of BTI reliability in presence of Time-zero Variability – Pathfinding from planar FET to advanced 3-D FinFET nodes
Kukner, Halil; Weckx, Pieter; Franco, Jacopo; Toledano Luque, Maria; Cho, Moon Ju; Kaczer, Ben; Raghavan, Praveen; Jang, Doyoung; Miyaguchi, Kenichi; Garcia Bardon, Marie; Catthoor, Francky; Van der Perre, Liesbet; Lauwereins, Rudy; Groeseneken, Guido (2014) -
The defect-centric perspective of device and circuit reliability – from individual defects to circuits
Kaczer, Ben; Franco, Jacopo; Weckx, Pieter; Roussel, Philippe; Bury, Erik; Cho, Moon Ju; Degraeve, Robin; Linten, Dimitri; Groeseneken, Guido; Kukner, Halil; Raghavan, Praveen; Catthoor, Francky; Rzepa, Gerhard; Goes, Wolfgang; Grasser, Tibor (2015) -
The impact of process variation and stochastic aging in nanoscale VLSI
Kiamehr, Saman; Weckx, Pieter; Tahoori, Mehdi; Kaczer, Ben; Kukner, Halil; Raghavan, Praveen; Groeseneken, Guido; Catthoor, Francky (2016)