Browsing by author "Nakabayashi, M."
Now showing items 21-38 of 38
-
Radiation damage in flash memory cells
Claeys, Cor; Ohyama, Hidenori; Simoen, Eddy; Nakabayashi, M.; Kobayashi, K. (2002) -
Radiation damage in npn Si transistors due to high-temperature gamma-ray and 1-MeV electron irradiation
Ohyama, Hidenori; Hirao, T.; Simoen, Eddy; Claeys, Cor; Nakabayashi, M.; Onoda, S. (2002) -
Radiation damage of n-MOSFETs fabricated in a BiCMOS process
Ohyama, Hidenori; Kobayashi, K.; Nakabayashi, M.; Simoen, Eddy; Claeys, Cor; Takami, Y.; Yoneoka, M.; Hayama, Kiyoteru; Takizawa, H.; Kohiki, S. (2000) -
Radiation damage of N-MOSFETS fabricated in a BiCMOS process
Kobayashi, K.; Ohyama, Hidenori; Yoneoka, M.; Hayama, Kiyoteru; Nakabayashi, M.; Simoen, Eddy; Claeys, Cor; Takami., Y.; Takizawa, H.; Kohiki, S. (2001) -
Radiation damage of polycrystalline silicon films
Ohyama, Hidenori; Tanaka, K.; Simoen, Eddy; Claeys, C.; Nakabayashi, M.; Kobayashi, K. (2001) -
Radiation damage of polycrystalline silicon films
Ohyama, Hidenori; Nakabayashi, M.; Simoen, Eddy; Claeys, Cor; Tanaka, K.; Kobayashi, K. (2002) -
Radiation damages of polycrystalline silicon films and NPN Si transistors by high-energy particle irradiation
Ohyama, Hidenori; Nakabayashi, M.; Simoen, Eddy; Claeys, Cor; Tanaka, T.; Hirao, T.; Onada, S.; Kobayashi, K. (2001) -
Radiation damages of polycrystalline silicon films and NPN Si transistors by high-energy particle irradiation
Ohyama, Hidenori; Nakabayashi, M.; Simoen, Eddy; Claeys, C.; Tanaka, T.; Hirao, T.; Onada, S.; Kobayashi, K. (2001) -
Radiation damages of SiC Schottky diodes by electron irradiation
Ohyama, H.; Takakura, K.; Watanabe, T.; Nakabayashi, M.; Simoen, Eddy; Claeys, Cor (2004) -
Radiation effects on n-MOSFETs fabricated in a BiCMOS process
Ohyama, Hidenori; Hayama, Kiyoteru; Ueda, A.; Simoen, Eddy; Claeys, C.; Nakabayashi, M.; Kobayashi, K. (2001) -
Radiation effects on polycrystalline silicon films
Ohyama, Hidenori; Nakabayashi, M.; Simoen, Eddy; Claeys, Cor; Hayama, Kiyoteru; Tanaka, K.; Kobayashi, K. (2001) -
Radiation-induced lattice defects in InGaAsP laser diodes and their effects on device performance
Ohyama, Hidenori; Simoen, Eddy; Claeys, C.; Hakata, T.; Kudou, T.; Yoneoka, M.; Kobayashi, K.; Nakabayashi, M.; Takami, Y.; Sunaga, H. (1999) -
Radiaton damage of SiC Schotttky diodes by electron irradiation
Ohyama, H.; Takakura, K.; Watanabe, T.; Nishiyama, K.; Shigaki, K.; Kudou, T.; Nakabayashi, M.; Kuboyama, S.; Matsuda, S.; Kamezawa, C.; Simoen, Eddy; Claeys, Cor (2005) -
Recovery behaviour resulting from thermal annealing in n-MOSFETs irradiated by 20MeV protons
Takakura, K.; Ohyama, H.; Ueda, A.; Nakabayashi, M.; Hayama, K.; Kobayashi, K.; Simoen, Eddy; Mercha, Abdelkarim; Claeys, Cor (2003) -
Reliability of polycrystalline silicon thin film resistors
Nakabayashi, M.; Ohyama, Hidenori; Simoen, Eddy; Ikegami, M.; Claeys, Cor; Kobayashi, K.; Yoneoka, M.; Miyahara, K. (2001) -
Reliability of polycrystalline silicon thin film resistors
Nakabayashi, M.; Ohyama, Hidenori; Simoen, Eddy; Ikegami, M.; Claeys, C.; Kobayashi, K.; Yoneoka, M.; Miyahara, K. (2001) -
Study of electron-irradiated IGBTs by the DCIV method and lifetime
Nakabayashi, M.; Ohyama, H.; Nanao, N.; Hirao, T.; Simoen, Eddy; Claeys, Cor (2004) -
The degradation of the electrical properties of IGBTS by 2-MeV electron irradiation and high-temperature
Nakabayashi, M.; Ohyama, H.; Hanano, N.; Hirao, T.; Simoen, Eddy; Claeys, Cor (2004)