Browsing by author "Kobayashi, K."
Now showing items 21-40 of 42
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Radiation damage in flash memory cells
Claeys, Cor; Ohyama, Hidenori; Simoen, Eddy; Nakabayashi, M.; Kobayashi, K. (2002) -
Radiation damage in shallow trench isolation diodes
Hayama, K.; Ohyama, H.; Miura, T.; Poyai, Amporn; Simoen, Eddy; Claeys, Cor; Kobayashi, K. (2001) -
Radiation damage in Si photodiodes by high temperature irradiation
Ohyama, Hidenori; Takakura, K.; Simoen, Eddy; Claeys, Cor; Uemura, J.; Kishikawa, T.; Kobayashi, K. (2002) -
Radiation damage of n-MOSFETs fabricated in a BiCMOS process
Ohyama, Hidenori; Kobayashi, K.; Nakabayashi, M.; Simoen, Eddy; Claeys, Cor; Takami, Y.; Yoneoka, M.; Hayama, Kiyoteru; Takizawa, H.; Kohiki, S. (2000) -
Radiation damage of N-MOSFETS fabricated in a BiCMOS process
Kobayashi, K.; Ohyama, Hidenori; Yoneoka, M.; Hayama, Kiyoteru; Nakabayashi, M.; Simoen, Eddy; Claeys, Cor; Takami., Y.; Takizawa, H.; Kohiki, S. (2001) -
Radiation damage of polycrystalline silicon films
Ohyama, Hidenori; Tanaka, K.; Simoen, Eddy; Claeys, C.; Nakabayashi, M.; Kobayashi, K. (2001) -
Radiation damage of polycrystalline silicon films
Ohyama, Hidenori; Nakabayashi, M.; Simoen, Eddy; Claeys, Cor; Tanaka, K.; Kobayashi, K. (2002) -
Radiation damages of polycrystalline silicon films and NPN Si transistors by high-energy particle irradiation
Ohyama, Hidenori; Nakabayashi, M.; Simoen, Eddy; Claeys, Cor; Tanaka, T.; Hirao, T.; Onada, S.; Kobayashi, K. (2001) -
Radiation damages of polycrystalline silicon films and NPN Si transistors by high-energy particle irradiation
Ohyama, Hidenori; Nakabayashi, M.; Simoen, Eddy; Claeys, C.; Tanaka, T.; Hirao, T.; Onada, S.; Kobayashi, K. (2001) -
Radiation defects in Sti silicon diodes and their effects on device performance
Hayama, Kiyoteru; Ohyama, Hidenori; Simoen, Eddy; Claeys, Cor; Poyai, Amporn; Miura, T.; Kobayashi, K. (2001) -
Radiation effect on metal-contaminated Si diodes
Hakata, T.; Ohyama, Hidenori; Kobayashi, K.; Simoen, Eddy; Claeys, Cor; Takami, Y.; Sunaga, H.; Miyahara, K. (1999) -
Radiation effects on n-MOSFETs fabricated in a BiCMOS process
Ohyama, Hidenori; Hayama, Kiyoteru; Ueda, A.; Simoen, Eddy; Claeys, C.; Nakabayashi, M.; Kobayashi, K. (2001) -
Radiation effects on polycrystalline silicon films
Ohyama, Hidenori; Nakabayashi, M.; Simoen, Eddy; Claeys, Cor; Hayama, Kiyoteru; Tanaka, K.; Kobayashi, K. (2001) -
Radiation effects on the current-voltage and capacitance- voltage characteristics of advanced P-N junction diodes surrounded by shallow trench isolation
Poyai, Amporn; Simoen, Eddy; Claeys, Cor; Hayama, Kiyoteru; Kobayashi, K.; Ohyama, Hidenori (2002) -
Radiation effects on the current-voltage and capacitance-voltage characteristics of advanced p-n junction diodes surrounded by shallow trench isolation
Poyai, Amporn; Simoen, Eddy; Claeys, Cor; Hayama, Kiyoteru; Kobayashi, K.; Ohyama, Hidenori (2001) -
Radiation performance of shallow trench isolation
Claeys, Cor; Simoen, Eddy; Poyai, Amporn; Hayama, Kiyoteru; Kobayashi, K.; Ohyama, Hidenori; Mohammadzadeh, A. (2000) -
Radiation-induced lattice defects in InGaAsP laser diodes and their effects on device performance
Ohyama, Hidenori; Simoen, Eddy; Claeys, C.; Hakata, T.; Kudou, T.; Yoneoka, M.; Kobayashi, K.; Nakabayashi, M.; Takami, Y.; Sunaga, H. (1999) -
Recovery behaviour resulting from thermal annealing in n-MOSFETs irradiated by 20MeV protons
Takakura, K.; Ohyama, H.; Ueda, A.; Nakabayashi, M.; Hayama, K.; Kobayashi, K.; Simoen, Eddy; Mercha, Abdelkarim; Claeys, Cor (2003) -
Reliability of polycrystalline silicon thin film resistors
Nakabayashi, M.; Ohyama, Hidenori; Simoen, Eddy; Ikegami, M.; Claeys, Cor; Kobayashi, K.; Yoneoka, M.; Miyahara, K. (2001) -
Reliability of polycrystalline silicon thin film resistors
Nakabayashi, M.; Ohyama, Hidenori; Simoen, Eddy; Ikegami, M.; Claeys, C.; Kobayashi, K.; Yoneoka, M.; Miyahara, K. (2001)