Browsing by author "Xu, Mingwei"

A simple method for automated extraction of BJT thermal resistance form early voltage measurements

Sadovnikov, A.; Krakowski, T.; Greig, W.; Xu, Mingwei (2003-11)

Active laser characterization by scanning capacitance microscopy

Xu, Mingwei; Duhayon, Natasja; Vandervorst, Wilfried (2002)

Applications of Scanning Spreading Resistance Microscopy on InP-Based Materials and Devices

Xu, Mingwei (2005-04)

Carrier spilling revisited: on-bevel junction behavior of different electrical depth profiling techniques

Clarysse, Trudo; Eyben, Pierre; Duhayon, Natasja; Xu, Mingwei; Vandervorst, Wilfried (2003)

Carrier spilling revisited: the on-bevel junction behavior of different electrical depth profiling techniques

Clarysse, Trudo; Eyben, Pierre; Duhayon, Natasja; Xu, Mingwei; Vandervorst, Wilfried (2001)

Characterization of vertical RESURF diodes using scanning probe microscopy

Duhayon, Natasja; Xu, Mingwei; Vandervorst, Wilfried; Hellemans, L.; Rochefort, Christelle; Van Dalen, Rob (2003)

Characterization of vertical resurf diodes using scanning probe microsopy

Duhayon, Natasja; Xu, Mingwei; Alvarez, David; Eyben, Pierre; Vandervorst, Wilfried; Hellemans, L.; Rochefort, Christelle; Van Dalen, Rob (2002)

Comprehensive study of TSUPREM4 boron diffusion modeling in SiGeC base layers under critical RTA conditions

Sibaja-Hernandez, Arturo; Xu, Mingwei; Decoutere, Stefaan; Maes, Herman (2004-05)

Fabrication of conductive atomic force microscope probes and their evaluation for carrier mapping

Fouchier, Marc; Eyben, Pierre; Alvarez, David; Duhayon, Natasja; Xu, Mingwei; Brongersma, Sywert; Lisoni, Judit; Vandervorst, Wilfried (2003-05)

High resolution dopant/carrier profiling for deep submicron technologies

Vandervorst, Wilfried; Clarysse, Trudo; De Wolf, Peter; Eyben, Pierre; Haegeman, Bart; Xu, Mingwei; Trenkler, Thomas; Hantschel, Thomas; Stephenson, Robert; Conard, Thierry; De Witte, Hilde (1999)

High resolution electrical characterization of laterally overgrown epitaxial InP

Anand, S.; Sun, Y.T.; Lourdudoss, S.; Xu, Mingwei; Vandervorst, Wilfried (2003)

HRXRD analysis of SiGeC layers for BiCMOS applications

Haralson, Erik; Sibaja-Hernandez, Arturo; Xu, Mingwei; Malm, Gunnar; Radamson, Henry; Östling, Mikael (2004)

Lateral and vertical scaling of a QSA HBT for a 0.13μm 200GHz SiGe:C BiCMOS technology

Van Huylenbroeck, Stefaan; Sibaja-Hernandez, Arturo; Piontek, Andreas; Choi, Li Jen; Xu, Mingwei; Ouassif, Nordin; Vleugels, Frank; Van Wichelen, Koen; Witters, Liesbeth; Kunnen, Eddy; Leray, Philippe; Devriendt, Katia; Shi, Xiaoping; Loo, Roger; Decoutere, Stefaan (2004-09)