Browsing by author "Zhang, J. F."
Now showing items 1-18 of 18
-
A discharge-based multi-pulse technique (DMP) for probing electron trap energy distribution in high-k materials for Flash memory applications
Zheng, X. F.; Zhang, W. .D; Govoreanu, Bogdan; Zhang, J. F.; Van Houdt, Jan (2009) -
A single device based Voltage Step Stress (VSS) technique for fast reliability screening
Ji, Z.; Zhang, J. F.; Zhang, W. D.; Zhang, X.; Kaczer, Ben; De Gendt, Stefan; Groeseneken, Guido; Ren, P.; Wang, R.; Huang, R. (2014) -
Defect loss: a new concept for reliability of MOSFETs
Duan, M.; Zhang, J. F.; Ji, Z.; Zhang, W.; Kaczer, Ben; De Gendt, Stefan; Groeseneken, Guido (2012) -
Development of a technique for characterizing bias temperature unstability-induced device-to-device variation at SRAM-relevant conditions
Duan, M.; Zhang, J. F.; Ji, Z.; Zhang, W. D.; Kaczer, Ben; Schram, Tom; Ritzenthaler, Romain; Groeseneken, Guido; Asenov, A. (2014) -
Energy distribution of positive charges in Al2O3/GeO2/Ge pMOSFETs
Ma, J; Zhang, J. F.; Ji, Zhigang; Benbakhti, Brahim; Zhang, Wei; Mitard, Jerome; Kaczer, Ben; Groeseneken, Guido; Hall, S.; Robertson, J.; Chalker, P. (2014) -
Energy distribution of positive charges in gate dielectric: probing technique and impacts of different defects
Hatta, S. W. M.; Ji, J.; Zhang, J. F.; Duan, M.; Zhang, W. D.; Soin, N.; Kaczer, Ben; De Gendt, Stefan; Groeseneken, Guido (2013) -
Energy distribution of positive charges in high-k dielectric
Hatta, S. W. M.; Ji, Z.; Zhang, J. F.; Zhang, W.D.; Soin, N.; Kaczer, Ben; De Gendt, Stefan; Groeseneken, Guido (2014) -
Hot carrier aging and its variation under use-bias: kinetics, prediction, impact on Vdd and SRAM
Duan, M.; Zhang, J. F.; Manut, A.; Ji, Z.; Zhang, W.; Asenov, A.; Gerrer, L.; Reid, D.; Razaidi, H.; Vigar, D.; Chandra, V.; Aitken, R.; Kaczer, Ben; Groeseneken, Guido (2015) -
Interaction between hot carrier aging and PBTI degradation in nMOSFETs: characterization, modelling and lifetime prediction
Meng, D.; Zhang, J. F.; Zhang, J. C.; Zhang, W.; Ji, Z.; Benbakhti, B.; Zheng, X. F.; Hao, Y.; Vigar, D.; Adamu-Lema, F.; Chandra, V.; Aitken, R.; Kaczer, Ben; Groeseneken, Guido; Asenov, A. (2017) -
Interface states beyond band gap and their impact on charge carrier mobility in MOSFETs
Ji, Z.; Zhang, J. F.; Zhang, W. D.; Kaczer, Ben; De Gendt, Stefan; Groeseneken, Guido (2012) -
Investigation of preexisting and generated defects in nonfilamentary a-Si/TiO2 RRAM and their impacts on RTN amplitude distribution
Ma, Jigang; Chai, Zheng; Zhang, Wei Dong; Zhang, J. F.; Ji, Z.; Benbakhti, Brahim; Govoreanu, Bogdan; Simoen, Eddy; Goux, Ludovic; Belmonte, Attilio; Degraeve, Robin; Kar, Gouri Sankar; Jurczak, Gosia (2018) -
Key issues and techniques for characterizing time-dependent device-to-device variation of SRAM
Duan, M.; Zhang, J. F.; Ji, Z.; Ma, J. G.; Zhang, W.; Kaczer, Ben; Schram, Tom; Ritzenthaler, Romain; Groeseneken, Guido; Asenov, A. (2013) -
Negative bias temperature instability lifetime prediction: problems and solutions
Ji, Z.; Hatta, S. F. W. M.; Zhang, J. F.; Ma, G. M.; Zhang, W.; Soin, N.; Kaczer, Ben; De Gendt, Stefan; Groeseneken, Guido (2013) -
New insights into defect loss, slowdown, and device lifetime enhancement
Duan, M.; Zhang, J. F.; Ji, Z.; Zhang, W. D.; Kaczer, Ben; De Gendt, Stefan; Groeseneken, Guido (2013) -
New insights into defect loss, slowdown, and device lifetime enhancement
Duan, M.; Zhang, J. F.; Ji, Z.; Zhang, W. D.; Kaczer, Ben; De Gendt, Stefan; Groeseneken, Guido (2013) -
Real Vth instability of pMOSFETs under practical operation conditions
Zhang, J. F.; Ji, Z.; Chang, M. H.; Kaczer, Ben; Groeseneken, Guido (2007-12) -
Time-dependent variation: A new defect-based prediction methodology
Duan, M.; Zhang, J. F.; Ji, Z.; Zhang, W.; Kaczer, Ben; Schram, Tom; Ritzenthaler, Romain; Thean, Aaron; Groeseneken, Guido; Asenov, A. (2014) -
Understanding charge traps for optimizing Si-passivated Ge nMOSFETs
Ren, Pengpeng; Gao, R.; Ji, Zhigang; Arimura, Hiroaki; Zhang, J. F.; Wang, R.; Duan, M.; Zhang, W.; Franco, Jacopo; Sioncke, Sonja; Cott, Daire; Mitard, Jerome; Witters, Liesbeth; Mertens, Hans; Kaczer, Ben; Mocuta, Anda; Collaert, Nadine; Linten, Dimitri; Huang, R.; Thean, Aaron; Groeseneken, Guido (2016)